Polarization Dynamics in La5/3Sr1/3NiO4
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AbstractDynamic susceptibility measurements at microwave frequencies (2 – 10GHz) are a sensitive probe of charge dynamcis in La5/3Sr1/3NiO4. Below the charge ordering temperature of 240K, a dielectric loss peak due to a relaxation mode with a large dielectric susceptibility is observed, and is associated with charge stripe formation. The dielectric response for Hω∥b (Eω ⊥ b) is well represented by ε(T) = εo/(1 – iωτ(T)), with εo, ∼ 50, and τ(T) = 2 × 10−9(sec) exp(−T/37K). Parallel conductivity σ(T) contributions dominate at higher temperatures and for Hω∥c (Eω ⊥ c). The dielectric loss peak observed indicates that the charge relaxation rates lie in the GHz frequency ranges.
Keyword(s):
Relaxation of Dielectric Loss Peak over Intermediate Temperature Range in Bi 5 TiNbWO 15 Intergrowth
2009 ◽
Vol 26
(4)
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pp. 047701
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2002 ◽
Vol 17
(12)
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pp. 3182-3189
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1977 ◽
Vol 32
(6)
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pp. 604-606
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