Electron Field Emission Characterization of Nanocrystalline Diamond Thin Film Cold Cathode Devices

1999 ◽  
Vol 593 ◽  
Author(s):  
B. L. Weiss ◽  
A. Badzian ◽  
L. Pilione ◽  
T. Badzian ◽  
W. Drawl ◽  
...  

ABSTRACTElectron field emission measurements have been performed on thin film cold cathode materials grown, on molybdenum, by a modified MPACVD diamond process. Specifically the modification is due to the addition of nitrogen and oxygen, in varying ratios, during the diamond growth phase. Characterization using Raman spectroscopy shows features at 1190, 1330 and 1550 cm−1. A simple triode device was fabricated for electron emission characterization. KAPTON® film is used as the insulating layer and a Mo mesh is used as the extraction gate electrode. The collector is an indium tin oxide (ITO) coated glass plate which is positively biased with respect to the gate electrode. Field emission characteristics have shown current measurements of greater than I microamp for fields of 40 V/micron. Gate currents are typically 1000 times greater than the emitted current. Issues currently being addressed include improvement in the total emitted current, current stability and device failure. We also present field emission measurements on diamond films grown by HFCVD.

2010 ◽  
Vol 168-170 ◽  
pp. 1082-1085
Author(s):  
Feng Ge Wang ◽  
Yu Kui Li

With photolithography process and screen printing technique, the compound cold cathode electrode was developed on the cathode glass plate for improving the field emission ability and emission uniformity of CNT cathode. The compound cold cathode electrode mainly consisted of the indium tin oxide (ITO) blocks which was the divided ITO thin film, the bar silver stripes fabricated by the solidified silver slurry and the cathode insulation layer with good insulation performance. Carbon nanotubes were prepared to form the field emitters, and the diode type field emission display (FED) was fabricated. The manufacture process was also presented in detail. The vacuum sealed FED exhibited better field emission characteristic, low operating voltage and high display brightness.


2004 ◽  
Author(s):  
Jon Van Noord ◽  
Brian Gilchrist ◽  
Roy Clarke ◽  
Pedro A. Encarnacion ◽  
Hannah Goldberg

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