Controlling the Diamond Film Morphology by Low-Energy Electron Bombardment

1999 ◽  
Vol 585 ◽  
Author(s):  
J. A. González ◽  
O. L. Figuero ◽  
B. R. Weiner ◽  
G. Morell

AbstractWe studied the effects of low-energy electron bombardment during diamond growth over the film crystalline quality and morphology. The film growth was monitored via the effective extinction coefficient (k) at 1.96 eV with in situ ellipsometry, in order to determine the developmental stage of the film in real time. Taking advantage of this in situ monitoring, we triggered the electron bombardment over the growing surface at different growth stages and studied the corresponding induced changes in film morphology and crystalline quality. Ex situ Raman spectroscopy and scanning electron microscopy (SEM) were also employed to evaluate the crystalline quality and the morphology of the grown films, respectively. We found that electron bombardment can be used to control the surface morphology of the films (triangular, pyramidal, square, amorphous). The results also indicate that applying the electron bombardment over the diamond film during the whole time of growth is detrimental to its crystalline quality and favors the formation of non-sp3 carbon. However, when the electron bombardment is triggered just after high quality scattered diamond crystallites have formed, the resulting film is of similar quality as those grown without bombardment. Therefore, properly chosen and triggered electron bombardment during diamond growth by chemical vapor deposition (CVD) can be used to control the film morphology while maintaining the film crystalline quality.

2001 ◽  
Vol 16 (1) ◽  
pp. 293-295 ◽  
Author(s):  
J. A. Gonzaález ◽  
O. L. Figueroa ◽  
B. R. Weiner ◽  
G. Morell

The effects of low-energy electron bombardment during the chemical vapor deposition of diamond were studied. The film growth was monitored in real time with in situ phase-modulated ellipsometry, in order to trigger the electron bombardment at different growth stages. Ex situ Raman spectroscopy and scanning electron microscopy were employed to evaluate the crystalline quality and the morphology of the grown films, respectively. The results indicated that triggering the electron bombardment after high-quality scattered diamond crystallites had formed results in finely grained smoother films of similar diamond yield and crystalline quality as those grown without bombardment. However, the electron bombardment deteriorates the film crystalline quality and the diamond yield when it was triggered from the start of deposition.


1997 ◽  
Vol 3 (S2) ◽  
pp. 611-612
Author(s):  
E. Bauer ◽  
A. Pavlovska ◽  
I.S.T. Tsong

Nitride films play an increasing role in modern electronics, for example silicon nitride as insulating layer in Si-based devices or GaN in blue light emitting diodes and lasers. For this reason they have been the subject of many ex situ electron microscopic studies. A much deeper understanding of the growth of these important materials can be obtained by in situ studies. Although these could be done by SEM, LEEM combined with LEED is much better suited because of its excellent surface sensitivity and diffraction contrast. We have in the past studied the high temperture nitridation of Si(l11) by ammonia (NH3)and the growth of GaN and A1N films on Si(l11) and 6H-SiC(0001) by depositing Ga and Al in the presence of NH3 and will report some of the results of this work for comparison with more recent work using atomic nitrogen instead of NH3.


1985 ◽  
Vol 52 (6) ◽  
pp. 1051-1069 ◽  
Author(s):  
P. Collot ◽  
G. Gautherin ◽  
B. Agius ◽  
S. Rigo ◽  
F. Rochet

1995 ◽  
Vol 51 (22) ◽  
pp. 16403-16406 ◽  
Author(s):  
N. Seifert ◽  
S. Vijayalakshmi ◽  
Q. Yan ◽  
J. L. Allen ◽  
A. V. Barnes ◽  
...  

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