Thermally Driven Shape Instability of Multilayer Structures

1999 ◽  
Vol 581 ◽  
Author(s):  
P. Troche ◽  
J. Hoffmann ◽  
C. Herweg ◽  
CH. Lang ◽  
H.C. Freyhardt ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Single Layer ◽  
Local Variation ◽  
Interfacial Stress ◽  
Multilayer Systems ◽  
Thermally Induced ◽  
Transmission Electron ◽  
Thermally Driven ◽  
Interface Curvature ◽  
Means Of Transmission

ABSTRACTThe thermally induced shape instability of Fe/Au, Fe/Ag, and Nb/Cu multilayer systems during heat treatments was investigated. The disintegration temperature of these systems decreases with decreasing single-layer thickness. Up to a critical thickness, the disintegration temperature is proportional to the reciprocal layer thickness. The driving force of this process is related to the interfacial stress and the local variation of the interface curvature. After heat treatment, spherically shaped Fe and Nb nanoparticles, located in chains perpendicular to the substrate, were observed and depicted by means of transmission electron microscopy (TEM) and X-ray microscopy (XRM).

Nanostructuring of Multilayers by a Thermally Driven Self Assembling Process

2001 ◽  
Vol 704 ◽  
Author(s):  
C. Herweg ◽  
S. Dreyer ◽  
P. Troche ◽  
J. Hoffmann ◽  
S. Sievers ◽  
...  
Keyword(s):  
Interface Energy ◽  
Annealing Process ◽  
Interfacial Stress ◽  
Spherical Particles ◽  
Disintegration Process ◽  
Surrounding Matrix ◽  
Self Assembling ◽  
Complementary Component ◽  
Thermally Driven ◽  
Interface Curvature

AbstractMultilayers consisting of two immiscible components (e.g. Fe/Ag Fe/Au or Ni/NiO) could by transformed by an annealing process into a nanostructured system of non statistically distributed nearly spherical particles in a surrounding matrix of the complementary component. The non statistical arrangement of the particles and the dynamics of the disintegration process strongly depend on the initial interface energy, i.e. the local interface curvature and the local interfacial stress. Detailed microstructure investigations of the different systems are used to interpret the measured transport properties.

scholarly journals On the Microstructure and Mechanical Properties of CrNx/Ag Multilayer Films Prepared by Magnetron Sputtering

Materials ◽  
2020 ◽  
Vol 13 (6) ◽  
pp. 1316
Author(s):  
Chunfu Hong ◽  
Ping He ◽  
Jun Tian ◽  
Fa Chang ◽  
Jianbo Wu ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Layer Thickness ◽  
Film Surface ◽  
Single Layer ◽  
Friction Reduction ◽  
Multilayer Coatings ◽  
X Ray Diffraction ◽  
Wear Performance ◽  
Transmission Electron ◽  
Nano Grains

CrNx/Ag multilayer coatings and a comparative CrNx single layer were deposited via reactive magnetron sputtering. In multilayer coatings, the thickness of each CrNx layer was constant at 60 nm, while that of the Ag layer was adjusted from 3 to 10 nm. Microstructure of the films was characterized by X-ray diffraction and transmission electron spectroscopy. The results suggest that the film containing 3 nm of Ag layer presents a nanocomposite structure comprising fine nano-grains and quasi-amorphous clusters. With Ag layer thickness reaching 4.5 nm and above, Ag grains coalesce to produce continuous an Ag layer and exhibit (111) preferential crystallization. Hardness of the films was detected by nanoindentation and it reveals that with increasing the Ag layer thickness, the hardness continuously decreases from 30.2 to 11.6 GPa. Wear performance of the films was examined by the ball-on-disk test at 500 °C. The result suggests that the out-diffusion of Ag towards film surface contributes to the friction reduction, while the wear performance of films depends on the thickness of the Ag layer.

Nanostructuring of Multilayers by a Thermally Driven Self Assembling Process

2001 ◽  
Vol 707 ◽  
Author(s):  
C. Herweg ◽  
S. Dreyer ◽  
P. Troche ◽  
J. Hoffmann ◽  
S. Sievers ◽  
...  
Keyword(s):  
Interface Energy ◽  
Annealing Process ◽  
Interfacial Stress ◽  
Spherical Particles ◽  
Disintegration Process ◽  
Surrounding Matrix ◽  
Self Assembling ◽  
Complementary Component ◽  
Thermally Driven ◽  
Interface Curvature

ABSTRACTMultilayers consisting of two immiscible components (e.g. Fe/Ag Fe/Au or Ni/NiO) could by transformed by an annealing process into a nanostructured system of non statistically distributed nearly spherical particles in a surrounding matrix of the complementary component. The non statistical arrangement of the particles and the dynamics of the disintegration process strongly depend on the initial interface energy, i.e. the local interface curvature and the local interfacial stress. Detailed microstructure investigations of the different systems are used to interpret the measured transport properties.

Ultrastructural Analysis of the Salivary Glands of Gromphadorhina Portentosa (Schaum)

1977 ◽  
Vol 35 ◽  
pp. 638-639
Author(s):  
P.J. Dailey
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Salivary Glands ◽  
Secretory Vesicles ◽  
The Past ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
Gromphadorhina Portentosa ◽  
Scanning Electron ◽  
Topographical Relief

The structure of insect salivary glands has been extensively investigated during the past decade; however, none have attempted scanning electron microscopy (SEM) in ultrastructural examinations of these secretory organs. This study correlates fine structure by means of SEM cryofractography with that of thin-sectioned epoxy embedded material observed by means of transmission electron microscopy (TEM).Salivary glands of Gromphadorhina portentosa were excised and immediately submerged in cold (4°C) paraformaldehyde-glutaraldehyde fixative1 for 2 hr, washed and post-fixed in 1 per cent 0s04 in phosphosphate buffer (4°C for 2 hr). After ethanolic dehydration half of the samples were embedded in Epon 812 for TEM and half cryofractured and subsequently critical point dried for SEM. Dried specimens were mounted on aluminum stubs and coated with approximately 150 Å of gold in a cold sputtering apparatus.Figure 1 shows a cryofractured plane through a salivary acinus revealing topographical relief of secretory vesicles.

Ultrastructural investigation of an adenoma of the pituitary post mortem

1987 ◽  
Vol 45 ◽  
pp. 622-623
Author(s):  
Shirley Siew ◽  
W. C. deMendonca
Keyword(s):  
Deleterious Effect ◽  
Anterior Lobe ◽  
Definitive Diagnosis ◽  
Pars Intermedia ◽  
Post Mortem ◽  
Close Apposition ◽  
Autopsy Material ◽  
Progressive Loss ◽  
Transmission Electron ◽  
Means Of Transmission

The deleterious effect of post mortem degeneration results in a progressive loss of ultrastructural detail. This had led to reluctance (if not refusal) to examine autopsy material by means of transmission electron microscopy. Nevertheless, Johannesen has drawn attention to the fact that a sufficient amount of significant features may be preserved in order to enable the establishment of a definitive diagnosis, even on “graveyard” tissue.Routine histopathology of the autopsy organs of a woman of 78 showed the presence of a well circumscribed adenoma in the anterior lobe of the pituitary. The lesion came into close apposition to the pars intermedia. Its architecture was more compact and less vascular than that of the anterior lobe. However, there was some grouping of the cells in relation to blood vessels. The cells tended to be smaller, with a higher nucleocytoplasmic ratio. The cytoplasm showed a paucity of granules. In some of the cells, it was eosinophilic.

Electron Microscopy Studies of The Chemistry And Microstructure of BaF2 / YBa2Cu3O7-x Thin Films

1994 ◽  
Vol 52 ◽  
pp. 796-797
Author(s):  
J. L. Lee ◽  
C. A. Weiss ◽  
R. A. Buhrman ◽  
J. Silcox
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Transmission Electron Microscope ◽  
Atomic Scale ◽  
Island Growth ◽  
Multilayer Systems ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Mgo Substrate

BaF2 thin films are being investigated as candidates for use in YBa2Cu3O7-x (YBCO) / BaF2 thin film multilayer systems, given the favorable dielectric properties of BaF2. In this study, the microstructural and chemical compatibility of BaF2 thin films with YBCO thin films is examined using transmission electron microscopy and microanalysis. The specimen was prepared by using laser ablation to first deposit an approximately 2500 Å thick (0 0 1) YBCO thin film onto a (0 0 1) MgO substrate. An approximately 7500 Å thick (0 0 1) BaF2 thin film was subsequendy thermally evaporated onto the YBCO film.Images from a VG HB501A UHV scanning transmission electron microscope (STEM) operating at 100 kV show that the thickness of the BaF2 film is rather uniform, with the BaF2/YBCO interface being quite flat. Relatively few intrinsic defects, such as hillocks and depressions, were evident in the BaF2 film. Moreover, the hillocks and depressions appear to be faceted along {111} planes, suggesting that the surface is smooth and well-ordered on an atomic scale and that an island growth mechanism is involved in the evolution of the BaF2 film.

Making Graphene-type Material via Polymerization of Porphyrin

2020 ◽  
Author(s):  
SANJIB KAR ◽  
Sruti Mondal ◽  
Kasturi Sahu ◽  
Dilruba Hasina ◽  
Tapobrata Som ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Polymeric Material ◽  
Single Layer ◽  
Type Material ◽  
Synthetic Pathway ◽  
Simple Chemical ◽  
Doped Graphene ◽  
Ring Nitrogen ◽  
2D Structure ◽  
Porphyrin Macrocycles

<p>The synthesis of new graphene-type materials (<i>via</i> polymerization of porphyrin macrocycles) through a simple chemical synthetic pathway (at RT) has been demonstrated. This newly synthesized material can be dispersed in water with an average sheet size of few microns and with single layer thickness. As the porphyrin contains four inner ring nitrogen atoms thus the presented polymeric material will be close analogous of N-doped graphene. Porphyrin as the key component to synthesize layered graphene type continuous 2D structure has never been attempted before. </p> <p> </p>

scholarly journals High-density Néel-type magnetic skyrmion phase stabilized at high temperature

2020 ◽  
Vol 12 (1) ◽  
Author(s):  
Hee Young Kwon ◽  
Kyung Mee Song ◽  
Juyoung Jeong ◽  
Ah-Yeon Lee ◽  
Seung-Young Park ◽  
...  
Keyword(s):  
High Temperature ◽  
High Density ◽  
Low Density ◽  
Memory Devices ◽  
Magnetic Multilayer ◽  
Multilayer Systems ◽  
Micromagnetic Simulations ◽  
Transmission Electron ◽  
Ultrahigh Density ◽  
Lorentz Transmission Electron Microscopy

AbstractThe discovery of a thermally stable, high-density magnetic skyrmion phase is a key prerequisite for realizing practical skyrmionic memory devices. In contrast to the typical low-density Néel-type skyrmions observed in technologically viable multilayer systems, with Lorentz transmission electron microscopy, we report the discovery of a high-density homochiral Néel-type skyrmion phase in magnetic multilayer structures that is stable at high temperatures up to 733 K (≈460 °C). Micromagnetic simulations reveal that a high-density skyrmion phase can be stabilized at high temperature by deliberately tuning the magnetic anisotropy, magnetic field, and temperature. The existence of the high-density skyrmion phase in a magnetic multilayer system raises the possibility of incorporating chiral Néel-type skyrmions in ultrahigh-density spin memory devices. Moreover, the existence of this phase at high temperature shows its thermal stability, demonstrating the potential for skyrmion devices operating in thermally challenging modern electronic chips.

Towards 3D image-based nanocrystallography by means of transmission electron goniometry

2004 ◽  
Vol 839 ◽  
Author(s):  
Peter Moeck ◽  
Wentao Qin ◽  
Philip B. Fraundorf
Keyword(s):  
Lattice Structure ◽  
Three Dimensions ◽  
Structural Defects ◽  
Transmission Electron ◽  
Means Of Transmission ◽  
Z Contrast ◽  
Individual Nanoparticles ◽  
Nanocrystal Model ◽  
The Ideal

ABSTRACTIt is well known that the crystallographic phase and morphology of many materials changes with the crystal size in the tens of nanometer range and that many nanocrystals possess structural defects in excess of their equilibrium levels. A need to determine the ideal and real structure of individual nanoparticles, therefore, arises. High-resolution phase-contrast transmission electron microscopy (TEM) and atomic resolution Z-contrast scanning TEM (STEM) when combined with transmission electron goniometry offer the opportunity of develop dedicated methods for the crystallographic characterization of nanoparticles in three dimensions. This paper describes tilt strategies for taking data from individual nanocrystals “as found”, so as to provide information on their lattice structure and orientation, as well as on the structure and orientation of their surfaces and structural defects. Internet based java applets that facilitate the application of this technique for cubic crystals with calibrated tilt-rotation and double-tilt holders are mentioned briefly. The enhanced viability of image-based nanocrystallography in future aberration-corrected TEMs and STEMs is illustrated on a nanocrystal model system.

Formation process of interface states at grain boundaries in sputtered polycrystalline Si films

1999 ◽  
Vol 14 (2) ◽  
pp. 371-376 ◽  
Author(s):  
Yoshitaka Nakano ◽  
Jiro Sakata ◽  
Yasunori Taga
Keyword(s):  
Energy Levels ◽  
Columnar Structure ◽  
Systematic Investigation ◽  
Defect States ◽  
Electron Microscopic ◽  
Thermally Induced ◽  
Transmission Electron ◽  
Transmission Electron Microscopic ◽  
Si Films ◽  
Induced Changes

A systematic investigation has been made on surface defect states of crystallites in the crystallization process of sputtered amorphous silicon films by isothermal annealing. Transmission electron microscopic observations indicate a pronounced vertical columnar structure in the upper part of the films, where the crystallization is delayed. Admittance spectroscopy reveals that two newly generated energy levels with the crystallization are attributed to the crystallites in the lower and upper parts of the films in view of the anisotropic crystallization. These thermally induced changes can be well explained by Si–Si shearing modes at the interfaces of crystallites through the process of crystallization.

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