Influence of the substrate temperature on the structure of SrBi2Ta2O9 thin films obtained by laser ablation

1998 ◽  
Vol 541 ◽  
Author(s):  
J. A. Díaz ◽  
M. P. Cruz ◽  
O. E. Contreras ◽  
J. M. Siqueiros ◽  
J. Portelles

AbstractA systematic study is presented of the resulting SBT films deposited by PLD at substrate temperatures from 300 to 600°C. The characteristics of the film as-deposited are determined. Special attention is focused on the compositional and structural properties. XRD, SEM, and TEM analyses are reported.

2011 ◽  
Vol 1328 ◽  
Author(s):  
KyoungMoo Lee ◽  
Yoshio Abe ◽  
Midori Kawamura ◽  
Hidenobu Itoh

ABSTRACTCobalt hydroxide thin films with a thickness of 100 nm were deposited onto glass, Si and indium tin oxide (ITO)-coated glass substrates by reactively sputtering a Co target in H2O gas. The substrate temperature was varied from -20 to +200°C. The EC performance of the films was investigated in 0.1 M KOH aqueous solution. X-ray diffraction (XRD) and Fourier transform infrared (FTIR) spectroscopy of the samples indicated that Co3O4 films were formed at substrate temperatures above 100°C, and amorphous CoOOH films were deposited in the range from 10 to -20°C. A large change in transmittance of approximately 26% and high EC coloration efficiency of 47 cm2/C were obtained at a wavelength of 600 nm for the CoOOH thin film deposited at -20°C. The good EC performance of the CoOOH films is attributed to the low film density and amorphous structure.


Vacuum ◽  
2012 ◽  
Vol 86 (12) ◽  
pp. 1920-1923 ◽  
Author(s):  
Murad Ali Khaskheli ◽  
Ping Wu ◽  
Xianfei Li ◽  
Hui Wang ◽  
Shiping Zhang ◽  
...  

2008 ◽  
Vol 55-57 ◽  
pp. 881-884 ◽  
Author(s):  
Thitinai Gaewdang ◽  
N. Wongcharoen ◽  
P. Siribuddhaiwon ◽  
N. Promros

CdTe thin films with different substrate temperatures have been deposited by thermal evaporation method on glass substrate in vacuum chamber having low pressure about 3.0x10-5 mbar. According to XRD analysis, CdTe thin films are polycrystalline belonging to cubic structure with preferential orientation of (111) plane. The strongest peak intensity of XRD is observed in the film prepared with substrate temperature of 150°C. Band gap and band tail values of the as-deposited films were evaluated from the optical transmission spectra. The lowest dark sheet resistance value was obtained from the film prepared with substrate temperature of 150°C as well. Regarding to our experimental results, it may be indicated that the 150°C substrate temperature is the most suitable condition in preparing CdTe thin films for solar cell applications.


2015 ◽  
Vol 118 (12) ◽  
pp. 125304 ◽  
Author(s):  
J. G. Quiñones-Galván ◽  
Enrique Camps ◽  
E. Campos-González ◽  
A. Hernández-Hernández ◽  
M. A. Santana-Aranda ◽  
...  

2016 ◽  
Vol 675-676 ◽  
pp. 261-264
Author(s):  
Kasidid Chansaengsri ◽  
Korakot Onlaor ◽  
Thutiyaporn Thiwawong ◽  
Benchapol Tunhoo

In this work, cobalt oxide thin films were prepared by electrostatic spray deposition (ESD) technique. The influence of the substrate temperatures on properties of film was investigated. Phase transformation of cobalt oxide thin films due to the effect of different substrate temperature was also observed. Cyclic voltammetry was used to measure the performance of cobalt oxide supercapacitor. At higher substrate temperature, the cobalt oxide thin films exhibit the high specific capacitance due to the effect of phase transformation in cobalt oxide films.


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