Mixing and Demixing of Cu-Mo

1998 ◽  
Vol 540 ◽  
Author(s):  
L. C. Wei ◽  
R. S. Averback
Keyword(s):  
Phase Separation ◽  
Liquid Nitrogen ◽  
Ion Beam ◽  
Liquid Nitrogen Temperature ◽  
X Ray Diffraction ◽  
Maximum Solubility ◽  
Ion Beam Mixing ◽  
Rich Phase ◽  
X Ray ◽  
Higher Temperature

AbstractIon beam mixing of Cu/Mo multilayer samples and demixing of Cu-Mo alloy samples were examined as functions of temperature and ion mass. Even at liquid nitrogen temperature, the mixing of one component in other was very small under 1.0 MeV Kr irradiation. The maximum solubility was about 10%. Irradiation of homogeneous Cu-Mo alloys under the same conditions, moreover, led to phase separation. These conclusions were deduced from bulk X-ray diffraction measurements and corroborated by EXAFS examination. The maximum solubility obtained by irradiating multilayer samples occurred at about 600 K. At lower or higher temperature, the solubility of Cu in Mo-rich phase was lower. A model based on the ballistic difflusion explains these results.

Smooth Silicide Formation by Ion Beam Mixing of Ti/Si-Layers

1986 ◽  
Vol 74 ◽  
Author(s):  
K. Kohlhof ◽  
S. Mantl ◽  
B. Stritzker
Keyword(s):  
Ion Beam ◽  
Liquid Nitrogen Temperature ◽  
Silicide Formation ◽  
Furnace Annealing ◽  
Ion Beam Mixing ◽  
X Ray ◽  
Surfaces And Interfaces ◽  
Conventional Furnace ◽  
Conventional Furnace Annealing ◽  
Substrate Temperatures

AbstractIon beam mixing experiments of Ti-Si layers have been performed with Kr ions of 250 keV energy and doses ranging from 7 1015 to 7 1016 cm-2 at temperatures between liquid nitrogen temperature and 450°C. At substrate temperatures below 120°C no silicide formation could be detected. Only weak mixing at the Ti-Si interface is observed. At temperatures above 120°C the formation of TiSi2 could be verified by Rutherford backscattering and X-ray diffractometry. Layers of TiSi2 produced by ion beam mixing show smooth surfaces in contrast to those prepared by conventional furnace annealing. Those display rough surfaces and interfaces.

Ion Beam Mixing in Epitaxial Ag/Fe/Ag-(001)-Layers Investigated with Ferromagnetic Resonance and X-Ray-Diffraction

1997 ◽  
Vol 248-249 ◽  
pp. 177-180 ◽  
Author(s):  
D. Kurowski ◽  
J. Pelzl ◽  
K. Brand ◽  
P. Sonntag ◽  
P. Grünberg
Keyword(s):  
Ferromagnetic Resonance ◽  
Ion Beam ◽  
X Ray Diffraction ◽  
Ion Beam Mixing ◽  
X Ray

BISMUTH PARTIAL SUBSTITUTION EFFECT ON PROPERTIES OF THE Bi2Sr2Ca2Cu3OZ SYSTEM

2002 ◽  
Vol 16 (20) ◽  
pp. 769-774
Author(s):  
S. SIMON ◽  
R. V. F. TURCU ◽  
M. POP ◽  
Gh. BORODI
Keyword(s):  
Heat Treatment ◽  
Diffraction Analysis ◽  
Liquid Nitrogen ◽  
Substitution Effect ◽  
Liquid Nitrogen Temperature ◽  
Partial Substitution ◽  
Superconducting Properties ◽  
X Ray Diffraction ◽  
Static Susceptibility ◽  
X Ray

The effect of bismuth partial substitution by lead, cadmium or tin on the properties of the polycrystalline systems Bi 2-x M x Sr 2 Ca 2 Cu 3 O z (M = Pb, Cd or Sn) was investigated. The samples were obtained from amorphous precursors by heat treatment applied in several stages. X-ray diffraction analysis and static susceptibility measurements were carried out in order to characterize the structure and to check the superconducting properties of the investigated samples. Superconducting behavior above liquid nitrogen temperature was evidenced only for the partial substitution of Bi with x = 0.2 Pb and x = 0.1 Sn.

Study of SHI-induced ion beam mixing in Y3+: YIG employing X-ray diffraction and Mössbauer spectroscopy

ICAME 2007 ◽  
2008 ◽  
pp. 1203-1210
Author(s):  
P. U. Sharma ◽  
M. K. Roy ◽  
Ravi Kumar ◽  
H. C. Verma ◽  
H. H. Joshi ◽  
...  
Keyword(s):  
Mössbauer Spectroscopy ◽  
Mossbauer Spectroscopy ◽  
Ion Beam ◽  
X Ray Diffraction ◽  
Ion Beam Mixing ◽  
X Ray ◽  
Mößbauer Spectroscopy

Ion Beam Mixing Effects in Au-Fe and Pt-Fe Thin Bilayers

1983 ◽  
Vol 27 ◽  
Author(s):  
G. Battaglin ◽  
A. Carnera ◽  
G. Celotti ◽  
G. Della Mea ◽  
V.N. Kulkarni ◽  
...  
Keyword(s):  
Solid Solution ◽  
Diffraction Analysis ◽  
Linear Dependence ◽  
Ion Beam ◽  
Bilayer Structure ◽  
Square Root ◽  
X Ray Diffraction ◽  
Ion Beam Mixing ◽  
X Ray ◽  
Mixing Effects

ABSTRACTMixing effects induced by Kr++ bombardment in the Au-Fe and Pt-Fe metallic systems have been studied by Rutherford backscattering and X-ray diffraction techniques. The mixed amount of Fe atoms shows a linear dependence on the square root of the Kr do se for both systems. The induced mixing appears more efficient for the Pt-Fe with respect to the Au-Fe system. In the case of Pt-Fe mixing is much more efficient when the initial bilayer structure has Pt on the top. The X-ray diffraction analysis reveals the formation of an extended solid solution of Fe in Pt, having the Fe40 Pt60 composition.

Study of SHI-induced ion beam mixing in Y3+: YIG employing X-ray diffraction and Mössbauer spectroscopy

2008 ◽  
Vol 187 (1-3) ◽  
pp. 117-124 ◽  
Author(s):  
P. U. Sharma ◽  
M. K. Roy ◽  
Ravi Kumar ◽  
H. C. Verma ◽  
H. H. Joshi ◽  
...  
Keyword(s):  
Mössbauer Spectroscopy ◽  
Mossbauer Spectroscopy ◽  
Ion Beam ◽  
X Ray Diffraction ◽  
Ion Beam Mixing ◽  
X Ray ◽  
Mößbauer Spectroscopy

TRANSFORMATIONS OF ICE VI AND ICE VII AT ATMOSPHERIC PRESSURE

1964 ◽  
Vol 42 (6) ◽  
pp. 1373-1378 ◽  
Author(s):  
J. E. Bertie ◽  
L. D. Calvert ◽  
E. Whalley
Keyword(s):  
Thermal Analysis ◽  
Liquid Nitrogen ◽  
Atmospheric Pressure ◽  
Liquid Nitrogen Temperature ◽  
X Ray Diffraction ◽  
X Ray ◽  
Hexagonal Ice

The irreversible transformations that occur when ices VI and VII are heated at atmospheric pressure from liquid-nitrogen temperature have been examined by simple thermal analysis and by X-ray diffraction. They transform first to cubic ice I (ice Ic) which subsequently transforms to hexagonal ice I (ice Ih). The rates of transformation depend on the temperature. The heat evolved is 16 ± ~2 cal/g for ice VI and 31 ± ~4 cal/g for ice VII.

Ion‐beam mixing in an Al‐Fe‐Mn system: A conversion‐electron Mössbauer and x‐ray diffraction study

1990 ◽  
Vol 67 (2) ◽  
pp. 710-714 ◽  
Author(s):  
S. N. Yedave ◽  
S. M. Chaudhari ◽  
S. M. Kanetkar ◽  
S. B. Ogale ◽  
S. V. Ghaisas
Keyword(s):  
Diffraction Study ◽  
Conversion Electron ◽  
Ion Beam ◽  
X Ray Diffraction ◽  
Ion Beam Mixing ◽  
X Ray ◽  
System A
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