Atomic Force Microscopy Calibration Methods for Lateral Force, Elasticity, and Viscosity

1998 ◽  
Vol 522 ◽  
Author(s):  
C. K. Buenviaje ◽  
S.-R. Ge ◽  
M. H. Rafailovich ◽  
R. M. Overney
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Calibration Methods

scholarly journals Determining amplitude and tilt of a lateral force microscopy sensor

2021 ◽  
Vol 12 ◽  
pp. 517-524
Author(s):  
Oliver Gretz ◽  
Alfred J Weymouth ◽  
Thomas Holzmann ◽  
Korbinian Pürckhauer ◽  
Franz J Giessibl
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Scanning Tunneling ◽  
Two Dimensional ◽  
Local Surface ◽  
Lateral Force Microscopy ◽  
Tunneling Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Calibration Methods

In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on the acquired data. To determine the amplitude and tilt we make use of the scanning tunneling microscopy (STM) channel and acquire data without and with oscillation of the tip above a local surface feature. We use a full two-dimensional current map of the STM data without oscillation to simulate data for a given amplitude and tilt. Finally, the amplitude and tilt are determined by fitting the simulation output to the data with oscillation.

Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy

2020 ◽  
Vol 68 (4) ◽  
Author(s):  
Arnab Bhattacharjee ◽  
Nikolay T. Garabedian ◽  
Christopher L. Evans ◽  
David L. Burris
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Microscopy ◽  
Atomic Force ◽  
Force Calibration

Atomic Force Microscopy Cantilevers for Sensitive Lateral Force Detection

1999 ◽  
Vol 38 (Part 1, No. 6B) ◽  
pp. 3958-3961 ◽  
Author(s):  
Masami Kageshima ◽  
Hisato Ogiso ◽  
Shizuka Nakano ◽  
Mark A. Lantz ◽  
Hiroshi Tokumoto
Keyword(s):  
Atomic Force Microscopy ◽  
Lateral Force ◽  
Force Detection ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Finite element analysis of V-shaped cantilevers for atomic force microscopy under normal and lateral force loads

2006 ◽  
Vol 38 (6) ◽  
pp. 1090-1095 ◽  
Author(s):  
Matthias Müller ◽  
Thomas Schimmel ◽  
Pascal Häußler ◽  
Heiko Fettig ◽  
Ottmar Müller ◽  
...  
Keyword(s):  
Finite Element Analysis ◽  
Atomic Force Microscopy ◽  
Finite Element ◽  
Lateral Force ◽  
Element Analysis ◽  
Force Microscopy ◽  
Atomic Force

MANIPULATION OF CARBON NANOTUBE BUNDLES WITH CONTACT MODE ATOMIC FORCE MICROSCOPY

2002 ◽  
Vol 01 (05n06) ◽  
pp. 575-579 ◽  
Author(s):  
ZIYONG SHEN ◽  
SAIJIN LIU ◽  
SHIMIN HOU ◽  
ZENGQUAN XUE ◽  
ZHENNAN GU
Keyword(s):  
Atomic Force Microscopy ◽  
Carbon Nanotube ◽  
Lateral Force ◽  
Force Load ◽  
Adhesive Interaction ◽  
Contact Mode ◽  
Force Microscopy ◽  
Nanotube Bundles ◽  
Atomic Force ◽  
Optimal Force

The cutting and splitting of carbon nanotube bundles were realized with an atomic force microscopy (AFM) in contact mode. The results of manipulating were found depending on the tip–bundle interaction and bundle–substrate interaction. With an optimal force load of AFM tip, the lateral force applied on the nanotube bundle could overcome the adhesive interaction between nanotubes within the bundle, consequently separating individual nanotubes from the bundle. The threshold of the tip force load was found to be ~45 nN in our experiments. This technique provides new possibilities for the controllable manipulation of carbon nanotubes.

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