Point Defect Characterization of Zn- and Cd-Based Semiconductors Using Positron Annihilation Techniques
Keyword(s):
AbstractA study of point defects in II-VI compound semiconductors was undertaken and has revealed that open volume defects are present in a wide variety of these samples. Zn-based binary compounds contain primarily neutral divacancy defects in concentrations in the mid 1016 cm−3. CdTe samples contain neutral monovacancy sized defect complexes in the high 1016 cm−3 range. When a small fraction of Zn or Se is alloyed into CdTe the defect profile changes dramatically to one dominated by divacancy sized defects at roughly half the original concentration.
1999 ◽
Vol 66
(1-3)
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pp. 30-32
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1999 ◽
Vol 197
(3)
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pp. 581-585
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Keyword(s):
2002 ◽
Vol 12
(5)
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pp. 359-362
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