scholarly journals Scanning force microscopy for the study of domain structure in ferroelectric thin films

1996 ◽  
Vol 14 (2) ◽  
pp. 602 ◽  
Author(s):  
A. Gruverman
Keyword(s):  
Thin Films ◽  
Domain Structure ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Force Microscopy ◽  
Scanning Force

Nonlinear local piezoelectric deformation in ferroelectric thin films studied by scanning force microscopy

2005 ◽  
Vol 97 (10) ◽  
pp. 104105 ◽  
Author(s):  
V. V. Shvartsman ◽  
N. A. Pertsev ◽  
J. M. Herrero ◽  
C. Zaldo ◽  
A. L. Kholkin
Keyword(s):  
Thin Films ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Force Microscopy ◽  
Scanning Force

scholarly journals Nanoscale Investigation of Polarization Retention Loss in Ferroelectric Thin Films VIA Scanning Force Microscopy

1997 ◽  
Vol 493 ◽  
Author(s):  
A. Gruverman ◽  
S. A. Prakash ◽  
S. Aggarwal ◽  
R. Ramesh ◽  
O. Auciello ◽  
...  
Keyword(s):  
Thin Films ◽  
Domain Switching ◽  
Scanning Force Microscopy ◽  
Ferroelectric Thin Films ◽  
Time Intervals ◽  
Force Microscopy ◽  
Retention Loss ◽  
Scanning Force ◽  
Local Polarization ◽  
Polarization Retention

ABSTRACTScanning force microscopy (SFM) was applied to direct nanoscale investigation of the mechanism of retention loss in ferroelectric thin films. Experiments were conducted by performing local polarization reversal within an individual grain with subsequent imaging of a resulting domain structure at various time intervals. A conductive SFM tip was used for domain switching and imaging in the SFM piezoresponse mode.

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