A Combined Tem/Rheed, Sem/Cl Study Of Epitaxial Gan

1997 ◽  
Vol 482 ◽  
Author(s):  
P. D. Brown ◽  
D. M. Tricker ◽  
Y. Xin ◽  
T. S. Chengt ◽  
C. T. Foxont ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
High Energy ◽  
High Energy Electron ◽  
Conventional Transmission Electron Microscopy ◽  
Transmission Electron ◽  
Spectral Distributions ◽  
Scanning Electron

AbstractEpitaxial GaN grown by MBE has been characterised using the combined techniques of scanning electron microscopy / cathodoluminescence, reflection high energy electron diffraction (RHEED), and conventional transmission electron microscopy. Variations in spatial and spectral distributions of luminescence can arise due to embedded cubic inclusions within the hexagonal GaN matrix. The strong effect of doping on the crystallinity of the GaN deposit is illustrated, as determined by RHEED in a TEM.

Characterization Techniques For Laser-Annealed Polysilicon on Insulating Layers

1980 ◽  
Vol 1 ◽  
Author(s):  
J. T. Schott ◽  
J. J. Comer
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Energy ◽  
High Energy Electron ◽  
X Ray Diffraction ◽  
X Ray ◽  
Characterization Techniques ◽  
Cw Laser ◽  
Transmission Electron ◽  
Scanning Electron

ABSTRACTVarious characterization techniques are applied to pulsed and cw laser-annealed polysilicon layers deposited on oxide layers. The results are used to compare these techniques as to the type and completeness of information provided, as well as sample preparation requirements and general ease or difficulty of measurement. The techniques employed include scanning electron microscopy (SEM), electron channeling micrographs and selected area channeling patterns (SACP), reflection (high energy) electron diffraction (RHEED), transmission electron microscopy (TEM) and selected area diffraction (SAD), x-ray diffraction, optical techniques and etching techniques.

Two- or three-way observations of the identical cell elements within the same sections by LM, TEM and/or SEM

1978 ◽  
Vol 36 (2) ◽  
pp. 82-83 ◽  
Author(s):  
Nakazo Watari ◽  
Yasuaki Hotta ◽  
Yoshio Mabuchi
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Fine Structure ◽  
Light Microscopy ◽  
Thin Sections ◽  
Transmission Electron ◽  
Identical Cell ◽  
Electron Microscopes ◽  
Scanning Electron

It is very useful if we can observe the identical cell elements within the same sections by light microscopy (LM), transmission electron microscopy (TEM) and/or scanning electron microscopy (SEM) sequentially, because, the cell fine structure can not be indicated by LM, while the color is; on the other hand, the cell fine structure can be very easily observed by EM, although its color properties may not. However, there is one problem in that LM requires thick sections of over 1 μm, while EM needs very thin sections of under 100 nm. Recently, we have developed a new method to observe the same cell elements within the same plastic sections using both light and transmission (conventional or high-voltage) electron microscopes.In this paper, we have developed two new observation methods for the identical cell elements within the same sections, both plastic-embedded and paraffin-embedded, using light microscopy, transmission electron microscopy and/or scanning electron microscopy (Fig. 1).

Comparative Study of the Fine Morphology of Sensory Receptors in Aspidogaster conchicola and Cotylaspis insignis

1972 ◽  
Vol 30 ◽  
pp. 150-151
Author(s):  
Venita F. Allison ◽  
J. E. Ubelaker ◽  
J. H. Martin
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Nervous System ◽  
Osmic Acid ◽  
Sensory Receptors ◽  
Transmission Electron ◽  
Sensory Structures ◽  
Fine Morphology ◽  
Scanning Electron

It has been suggested that parasitism results in a reduction of sensory structures which concomitantly reflects a reduction in the complexity of the nervous system. The present study tests this hypothesis by examining the fine morphology and the distribution of sensory receptors for two species of aspidogastrid trematodes by transmission and scanning electron microscopy. The species chosen are an ectoparasite, Cotylaspis insignis and an endoparasite, Aspidogaster conchicola.Aspidogaster conchicola and Cotylaspis insignis were obtained from natural infections of clams, Anodonta corpulenta and Proptera purpurata. The specimens were fixed for transmission electron microscopy in phosphate buffered paraformaldehyde followed by osmic acid in the same buffer, dehydrated in an ascending series of ethanol solutions and embedded in Epon 812.

Anisotropic Membranes as Substrates for Sem

1976 ◽  
Vol 34 ◽  
pp. 444-445
Author(s):  
Thomas P. Turnbull ◽  
W. F. Bowers
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
High Flow ◽  
Polymer Chemistry ◽  
Surface Porosity ◽  
Transmission Electron ◽  
Pore Texture ◽  
Spongy Layer ◽  
Scanning Electron

Until recently the prime purposes of filters have been to produce clear filtrates or to collect particles from solution and then remove the filter medium and examine the particles by transmission electron microscopy. These filters have not had the best characteristics for scanning electron microscopy due to the size of the pores or the surface topography. Advances in polymer chemistry and membrane technology resulted in membranes whose characteristics make them versatile substrates for many scanning electron microscope applications. These polysulphone type membranes are anisotropic, consisting of a very thin (0.1 to 1.5 μm) dense skin of extremely fine, controlled pore texture upon a much thicker (50 to 250μm), spongy layer of the same polymer. Apparent pore diameters can be controlled in the range of 10 to 40 A. The high flow ultrafilters which we are describing have a surface porosity in the range of 15 to 25 angstrom units (0.0015-0.0025μm).

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