Characterizations of Mg Implanted GaN

1997 ◽  
Vol 482 ◽  
Author(s):  
Gou-Chung Chi ◽  
B. J. Pong ◽  
C. J. Pan ◽  
Y. C. Teng ◽  
C. H. Lee
Keyword(s):  
Small Angle ◽  
Lattice Strain ◽  
Structural Characteristics ◽  
Diffraction Method ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Green Band ◽  
Structure Defects ◽  
X Ray ◽  
Shoulder Peak

AbstractWith 150KeV Mg+ ion implantation, the optical and structural characteristics of GaN films were studied. Post-implant annealing up to 1000°C was performed in N2 ambient with a rapid thermal annealing (RTA) system, without an encapsulation layer. We observed a green band photoluminescence from Mg-implanted GaN. This green band photoluminescence should be associated with Mg induced defect-clustering in GaN. We also use the x-ray diffraction method to study the correlation between structure defects and implantation. We observed an extra shoulder peak at the small angle side of the GaN[0004] diffraction peak. The origin of this shoulder may be attributed to implanted magnesium induced GaN lattice strain.

Crystallite size and lattice strain of lithiated spinel material for rechargeable battery by X-ray diffraction peak-broadening analysis

2019 ◽  
Vol 43 (5) ◽  
pp. 1903-1911 ◽  
Author(s):  
Ahmed A. Al-Tabbakh ◽  
Nilgun Karatepe ◽  
Aseel B. Al-Zubaidi ◽  
Aida Benchaabane ◽  
Natheer B. Mahmood
Keyword(s):  
Crystallite Size ◽  
Lattice Strain ◽  
Diffraction Peak ◽  
Rechargeable Battery ◽  
X Ray Diffraction ◽  
X Ray ◽  
Peak Broadening

Lattice Strain of HAp in Bone Tissue using X-ray Diffraction Method

2002 ◽  
Vol 2002.6 (0) ◽  
pp. 39-40
Author(s):  
Kazuhiro FUJISAKI ◽  
Shigeru TADANO ◽  
Junichi SHIBANO
Keyword(s):  
Bone Tissue ◽  
Lattice Strain ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals Microwave Assisted Phytosynthesis and Characterization of Magnetic Iron Oxide Quantum Dots using Moringa oleifera

2018 ◽  
Vol 15 (2) ◽  
pp. 145-150 ◽  
Author(s):  
G. Deepthi Reddy ◽  
M. Noorjahan ◽  
K.Girija Mangatayaru ◽  
M. Krishnakanth
Keyword(s):  
Quantum Dots ◽  
Iron Oxide ◽  
Moringa Oleifera ◽  
Structural Characteristics ◽  
Aqueous Media ◽  
Diffraction Method ◽  
Visible Spectrum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Magnetic Iron Oxide

Magnetic Iron Oxide Quantum Dots (MIOQDs) were synthesized using Moringa oleifera leaves through green technique i.e., Microwave treatment. The synthetic method is highly rapid, simple and economical. MIOQDs were formed by reduction of ferric chloride (FeCl3) solution with Moringa oleifera leaf extract without any influence of alkaline conditions which opens a new arena for the phytosynthesis of nanoparticles. MIOQDs structural characteristics were scrutinized by Powder X-ray diffraction method, FESEM, TEM, UV –Visible Spectroscopy, Photoluminescence Emission Spectroscopy. The ultraviolet-visible spectrum recorded for the aqueous media iron nanoparticles showed an absorption peak at around 330 nm. Powder X-ray diffraction showed that the particles are crystalline in nature, with both hematite and maghemite structure.

The Application of X-Ray Diffraction Method to the Measurement of Crystal Deformation and Crystal Modulus of High Polymers

1991 ◽  
Vol 35 (A) ◽  
pp. 545-552 ◽  
Author(s):  
Katsuhiko Nakamae ◽  
Takashi Nishino
Keyword(s):  
Elastic Modulus ◽  
Molecular Conformation ◽  
Diffraction Method ◽  
Peak Shift ◽  
Diffraction Peak ◽  
X Ray Diffraction ◽  
Direction Parallel ◽  
X Ray ◽  
Chain Axis ◽  
High Polymers

AbstractElastic modulus EI of crystalline regions of various high polymers in the direction parallel to the chain axis were measured using an X-ray diffraction method. The crystal deformation can be detected directly by the diffraction peak shift as a function of applied constant stress. The stress in the crystalline regions is assumed to be equal to that applied to the specimen. The validity of this assumption has been proven experimentally for polyethylene, poly(p-phenylene terephthalamide) and so on. The EI values were discussed in relation to molecular conformation and deformation mechanism of the chains.

Education program for controversial defect of recent X-ray instrument termed as a simultaneous small angle X-ray scattering and wide angle X-ray diffraction measuring instrument

2018 ◽  
Vol 90 (6) ◽  
pp. 969-987
Author(s):  
Masaru Matsuo ◽  
Yuezhen Bin
Keyword(s):  
Small Angle ◽  
Diffraction Peak ◽  
Bragg Angle ◽  
Imaging Plate ◽  
Wide Angle ◽  
Measuring Instrument ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Ray Scattering

Abstract Simultaneous rotations of sample and X-ray detected counter are needed to evaluate orientation distribution of crystallites and amorphous chains oriented predominantly parallel to the film surface in addition to exact diffraction peak profiles obtained without the complicated intensity corrections. The rotation mode is known as “θ–2θ scanning” system (θ: film, 2θ: counter). The system has been mainly used in research and development institutes. However, such instruments are not produced at present. Recently, small angle X-ray scattering (SAXS) and wide angle X-ray diffraction (WAXD) intensities have been measured by using X-ray beam generated along one direction. The brand name of the instrument is “a simultaneous SAXS and WAXD measuring instrument”. The X-ray beam generated by the instrument has surely high luminance providing high degree resolution of peak profiles by diffraction and/or scattering. The sample stage and detector, however, are fixed, since the intensities for SAXS and WAXD are obtained by the digital display of the number of X-ray photons detected on the imaging plate. Such optical system contains controversial defect on evaluating orientation of crystal planes parallel to the surface of films prepared by T-die and inflation methods as well as the exact profile. The imaging plate cannot detect the diffraction intensity from the crystal planes existing in the angle range between incident beam and Bragg angle associated with the diffraction peak position of the individual crystal planes.

scholarly journals X-RAY DIFFRACTION METHOD FOR DETERMINATION OF SIZES AND STRUCTURAL CHARACTERISTICS OF NANOGRAPHITES IN ACTIVATED CARBON MATERIALS

2018 ◽  
Vol 59 (9) ◽  
pp. 62
Author(s):  
Nikita S. Saenko ◽  
Albert M. Ziatdinov
Keyword(s):  
Activated Carbon ◽  
Carbon Fibers ◽  
Structural Characteristics ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Scattering ◽  
Nanocrystalline Graphite ◽  
Ray Scattering

The method for determination of sizes and structural characteristics of nanographites in activated carbon fibers (ACFs) by analyzing their experimental X-ray diffraction profiles has been developed in the paper. It uses the curves of X‑ray scattering calculated for the set of nanographites consisting of benzene- and phenalene-bazed nanographenes of various sizes, which interatomic and interlayer distances depend on the number of atoms in layer. The developed method can be also applied to analysis of the X-ray diffraction profiles of other nanocrystalline graphite structures. The data acquired by the method agree with results of Raman spectroscopy and small-angle X-ray scattering on ACFs structure motives.

Structural Properties of 300 Å of Iron Films Grown on Polycrystalline Substrate

2019 ◽  
Vol 397 ◽  
pp. 69-75
Author(s):  
Radhia Boukhalfa ◽  
Hichem Farh
Keyword(s):  
Structural Properties ◽  
Room Temperature ◽  
Molecular Beam ◽  
Structural Characteristics ◽  
Diffraction Method ◽  
The Other ◽  
X Ray Diffraction ◽  
Iron Films ◽  
X Ray ◽  
Polycrystalline Substrate

In this manuscript, the structural properties such as the distance inter-reticular of samples is studied, In the fact, four samples were used symbolized as follows: E tAg(Å), the only difference is the thickness of the Silver buffer layer (tAg= 0, 50, 100 and 150 Å) to find out how the thickness of this layer depends on the structural characteristics of the Iron thin layer, all samples are deposited using molecular beam epitaxy (MBE) at room temperature onto Si (100) substrate. The structural properties of all samples examined using X-ray diffraction method at small and high angles. The small angles X-Ray diffraction curves confirmed to us that there is a clear difference between the surface structure of the samples by varying the number of Kiessig Fringes, Also high angles X-Ray diffraction curves assured us this difference through the clear variation in the angular positions of the peaks of Bragg and the distances inter-reticular values from a sample to the other.

Exact determination of superlattice structures by small‐angle x‐ray diffraction method

1988 ◽  
Vol 52 (9) ◽  
pp. 742-744 ◽  
Author(s):  
M. Sugawara ◽  
M. Kondo ◽  
S. Yamazaki ◽  
K. Nakajima
Keyword(s):  
Small Angle ◽  
Diffraction Method ◽  
X Ray Diffraction ◽  
X Ray ◽  
Exact Determination ◽  
Superlattice Structures
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