Structure and Chemistry of Ti Overlayers on α-Αl2O3(0001)
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ABSTRACTTi thin films were grown by molecular-beam epitaxy (MBE) on α-Al2O3(0001) substrates. During room temperature deposition, in the very initial growth stage, AES investigations revealed a chemical reaction between the Ti and the α-Al2O3 substrate. An analysis of the AES data based on simple assumptions showed that ∼ 2 monolayers of Ti are oxidized. However, HRTEM analysis indicated an atomically smooth, incoherent interface, without a reaction layer. Reflection high-energy electron diffraction (RHEED) analysis revealed an epitaxial orientation relationship (0001)<2110> Ti ∥ (0001)<1010>Al2O3 between Ti and α-Al2O3(0001).
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1994 ◽
Vol 137
(1-2)
◽
pp. 187-194
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1992 ◽
Vol 10
(4)
◽
pp. 1784
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