Scanning Probe Microscope Study of Mixed Chain-Length Phase-Segregated Langmuir-Blodgett Monolayers

1996 ◽  
Vol 464 ◽  
Author(s):  
D.D. Koleske ◽  
W.R. Barger ◽  
G.U. Lee ◽  
R.J. Colton
Keyword(s):  
Chain Length ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Force Curve ◽  
Height Difference ◽  
Short Chain Length ◽  
Langmuir Blodgett ◽  
Probe Microscope ◽  
Compressional Modulus ◽  
Long Chain

ABSTRACTUsing a scanning probe microscope, the influence of adhesion on measured film height of mixed-chain-length fatty acid Langmuir-Blodgett monolayers was investigated. A 1:1 mixture of CH3[CH2]22COOH and CH3[CH2]14COOH, was deposited in which the long chain-length acid, C24, was segregated from the short chain-length acid, C16. Two experiments were performed, contact scanning and force curve mapping. From both experiments, the film height difference measured between the C16 and C24 regions was larger than expected. Adhesion of the tip was 20% larger over the C16 acid regions. Using a compressional modulus derived from film pressure vs. area isotherms of the pure components, the adhesion difference and apparent filmheight difference over the two regions can be understood.

Scanning-probe microscope analysis of optical thin films: A new analytical tool in a manufacturing environment

1994 ◽  
Vol 52 ◽  
pp. 1068-1069
Author(s):  
S. P. Sapers ◽  
R. Clark ◽  
P. Somerville
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Thermal Control ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
List Type ◽  
Manufacturing Environment ◽  
Physical Measurements ◽  
Probe Microscope

OCLI is a leading manufacturer of thin films for optical and thermal control applications. The determination of thin film and substrate topography can be a powerful way to obtain information for deposition process design and control, and about the final thin film device properties. At OCLI we use a scanning probe microscope (SPM) in the analytical lab to obtain qualitative and quantitative data about thin film and substrate surfaces for applications in production and research and development. This manufacturing environment requires a rapid response, and a large degree of flexibility, which poses special challenges for this emerging technology. The types of information the SPM provides can be broken into three categories:(1)Imaging of surface topography for visualization purposes, especially for samples that are not SEM compatible due to size or material constraints;(2)Examination of sample surface features to make physical measurements such as surface roughness, lateral feature spacing, grain size, and surface area;(3)Determination of physical properties such as surface compliance, i.e. “hardness”, surface frictional forces, surface electrical properties.

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