Photoluminescence Mechanism of Silicon Quantum Dots and Wells

1996 ◽  
Vol 452 ◽  
Author(s):  
Y. Kanemitsu ◽  
S. Okamoto

AbstractWe discuss the mechanism of efficient photoluminescence (PL) from Si quantum dots and wells. Luminescence properties of SiO2-capped Si nanocrystals are different from those of H-terminated Si nanocrystals, but are very similar to those of Si quantum wells sandwiched by SiO2 layers. The size-dependence of PL properties and resonantly excited PL spectra of SiCb-capped Si dots and wells indicate that excitons are localized near the interface between the crystalline Si core and surface oxide layer, and the strong coupling of electronic and vibrational excitations causes the broad PL spectrum. The exciton localization plays an essential role in the efficient luminescence process in nanoscale Si/SiO2 systems.

2004 ◽  
Vol 85 (9) ◽  
pp. 1586-1588 ◽  
Author(s):  
D. T. Tambe ◽  
V. B. Shenoy
Keyword(s):  

1997 ◽  
Vol 55 (8) ◽  
pp. 5253-5258 ◽  
Author(s):  
R. Grousson ◽  
V. Voliotis ◽  
N. Grandjean ◽  
J. Massies ◽  
M. Leroux ◽  
...  

1990 ◽  
Vol 216 ◽  
Author(s):  
Kamakhya P. Ghatak ◽  
S. N. Biswas

ABSTRACTIn this paper we studied the thermoelectric power under classically large magnetic field (TPM) in quantum wells (QWs), quantum well wires (QWWS) and quantum dots (QDs) of Bi by formulating the respective electron dispersion laws. The TPM increases with increasing film thickness in an oscillatory manner in all the cases. The TPM in QD is greatest and the least for quantum wells respectively. The theoretical results are in agreement with the experimental observations as reported elsewhere.


1991 ◽  
Vol 43 (2) ◽  
pp. 1546-1550 ◽  
Author(s):  
M. Gal ◽  
Z. Y. Xu ◽  
F. Green ◽  
B. F. Usher

2010 ◽  
Vol 256 (16) ◽  
pp. 5116-5119 ◽  
Author(s):  
Yong-bin Chen ◽  
Yong Ren ◽  
Rong-ling Xiong ◽  
You-yuan Zhao ◽  
Ming Lu

2003 ◽  
Vol 798 ◽  
Author(s):  
Z. Y. Xu ◽  
X. D. Luo ◽  
X. D. Yang ◽  
P. H. Tan ◽  
C. L. Yang ◽  
...  

ABSTRACTTaking advantages of short pulse excitation and time-resolved photoluminescence (PL), we have studied the exciton localization effect in a number of GaAsN alloys and GaAsN/GaAs quantum wells (QWs). In the PL spectra, an extra transition located at the higher energy side of the commonly reported N-related emissions is observed. By measuring PL dependence on temperature and excitation power along with PL dynamics study, the new PL peak has been identified as a transition of the band edge-related recombination in dilute GaAsN alloy and delocalized transition in QWs. Using selective excitation PL we further attribute the localized emission in QWs to the excitons localized at the GaAsN/GaAs interfaces. This interface-related exciton localization could be greatly reduced by a rapid thermal annealing.


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