Thermodynamic Constraints on Ion Beam Mixing of Metals on Insulators

1985 ◽  
Vol 45 ◽  
Author(s):  
G. C. Farlow ◽  
B. R. Appleton ◽  
L. A. Boatner ◽  
C. J. Mchargue ◽  
C. W. White ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Ion Beam ◽  
Metal Films ◽  
Rutherford Backscattering ◽  
Rutherford Backscattering Spectroscopy ◽  
Reaction Enthalpy ◽  
Ion Beam Mixing ◽  
Interfacial Mixing ◽  
Scanning Electron

ABSTRACTSeveral different insulating substrates were coated with various metal films and ion beam irradiated using either Xe or Kr ions. These were then examined by Rutherford backscattering spectroscopy and scanning electron microscopy to determine if interfacial mixing had taken place. These results were compared with the sign of the reaction enthalpy of the metal and substrate to test the proposition that metals mix on insulators if the reaction enthalpy is negative and do not mix if it is positive. The enthalpy rule is in general valid. Two exceptions were found: Cr on Si02 and Zr on Al203; however, these exceptions contain ambiguous features.Irradiation with a light, reactive ion was found to produce no mixing.

Thermal Conductivity of Boron Carbides

1987 ◽  
Vol 97 ◽  
Author(s):  
Marvin Moss
Keyword(s):  
Electron Microscopy ◽  
Thermal Conductivity ◽  
Scanning Electron Microscopy ◽  
Raman Spectroscopy ◽  
Temperature Dependence ◽  
Rutherford Backscattering ◽  
Rutherford Backscattering Spectroscopy ◽  
Theoretical Density ◽  
Increasing Temperature ◽  
Scanning Electron

ABSTRACTThe thermal conductivity, k, of boron carbides of various B/C ratios, two modes of preparation – hot pressed and carbothermic, and two isotopic variants of boron – 11B and normal boron 10.81B, was measured from 300 to 1023 K. The density and composition of the samples were reflected in the magnitude and temperature dependence of k, and were investigated further with scanning electron microscopy, Rutherford backscattering spectroscopy, and Raman spectroscopy. While lower than theoretical density in B4C reduces k, the characteristic monotonic decline of k with increasing temperature is retained. This k-vs.-T behavior distinguishes B4C from material with larger B/C ratios for which the temperature dependence is essentially nil.

Ultrastructural Features of Normal and Diseased Hair Revealed by Ion Beam Etching and Freeze Fracture

1975 ◽  
Vol 33 ◽  
pp. 358-359
Author(s):  
M. Spector ◽  
A. C. Brown
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Ectodermal Dysplasia ◽  
Ion Beam ◽  
Freeze Fracture ◽  
Ion Current ◽  
Ion Beam Etching ◽  
Pili Torti ◽  
Argon Ion ◽  
Scanning Electron

Ion beam etching and freeze fracture techniques were utilized in conjunction with scanning electron microscopy to study the ultrastructure of normal and diseased human hair. Topographical differences in the cuticular scale of normal and diseased hair were demonstrated in previous scanning electron microscope studies. In the present study, ion beam etching and freeze fracture techniques were utilized to reveal subsurface ultrastructural features of the cuticle and cortex.Samples of normal and diseased hair including monilethrix, pili torti, pili annulati, and hidrotic ectodermal dysplasia were cut from areas near the base of the hair. In preparation for ion beam etching, untreated hairs were mounted on conducting tape on a conducting silicon substrate. The hairs were ion beam etched by an 18 ky argon ion beam (5μA ion current) from an ETEC ion beam etching device. The ion beam was oriented perpendicular to the substrate. The specimen remained stationary in the beam for exposures of 6 to 8 minutes.

scholarly journals Microscopy Methods for Biofilm Imaging: Focus on SEM and VP-SEM Pros and Cons

Biology ◽  
2021 ◽  
Vol 10 (1) ◽  
pp. 51
Author(s):  
Michela Relucenti ◽  
Giuseppe Familiari ◽  
Orlando Donfrancesco ◽  
Maurizio Taurino ◽  
Xiaobo Li ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Ion Beam ◽  
Ruthenium Red ◽  
Variable Pressure ◽  
Sem Images ◽  
Advantages And Disadvantages ◽  
Pros And Cons ◽  
Microscopy Techniques ◽  
Scanning Electron

Several imaging methodologies have been used in biofilm studies, contributing to deepening the knowledge on their structure. This review illustrates the most widely used microscopy techniques in biofilm investigations, focusing on traditional and innovative scanning electron microscopy techniques such as scanning electron microscopy (SEM), variable pressure SEM (VP-SEM), environmental SEM (ESEM), and the more recent ambiental SEM (ASEM), ending with the cutting edge Cryo-SEM and focused ion beam SEM (FIB SEM), highlighting the pros and cons of several methods with particular emphasis on conventional SEM and VP-SEM. As each technique has its own advantages and disadvantages, the choice of the most appropriate method must be done carefully, based on the specific aim of the study. The evaluation of the drug effects on biofilm requires imaging methods that show the most detailed ultrastructural features of the biofilm. In this kind of research, the use of scanning electron microscopy with customized protocols such as osmium tetroxide (OsO4), ruthenium red (RR), tannic acid (TA) staining, and ionic liquid (IL) treatment is unrivalled for its image quality, magnification, resolution, minimal sample loss, and actual sample structure preservation. The combined use of innovative SEM protocols and 3-D image analysis software will allow for quantitative data from SEM images to be extracted; in this way, data from images of samples that have undergone different antibiofilm treatments can be compared.

Degradation of a Metal–Polymer Interface Observed by Element-Specific Focused Ion Beam-Scanning Electron Microscopy

Langmuir ◽  
2020 ◽  
Vol 36 (11) ◽  
pp. 2816-2822 ◽  
Author(s):  
Takashi Kakubo ◽  
Katsunori Shimizu ◽  
Akemi Kumagai ◽  
Hiroaki Matsumoto ◽  
Miki Tsuchiya ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Polymer Interface ◽  
Metal Polymer ◽  
Scanning Electron

Focused ion beam scanning electron microscopy in biology

2014 ◽  
Vol 254 (3) ◽  
pp. 109-114 ◽  
Author(s):  
C. KIZILYAPRAK ◽  
J. DARASPE ◽  
B.M. HUMBEL
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Beam Scanning ◽  
Scanning Electron

scholarly journals Serial Thick Section Gas Cluster Ion Beam Scanning Electron Microscopy

2018 ◽  
Vol 24 (S1) ◽  
pp. 1444-1445 ◽  
Author(s):  
Kenneth J. Hayworth ◽  
David Peale ◽  
Zhiyuan Lu ◽  
C. Shan Xu ◽  
Harald F. Hess
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Ion Beam ◽  
Thick Section ◽  
Beam Scanning ◽  
Cluster Ion ◽  
Gas Cluster Ion Beam ◽  
Scanning Electron
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