Optical and Electrical Characteristics of Single-Quantum-Well InGaN Light-Emitting Diodes

1996 ◽  
Vol 449 ◽  
Author(s):  
Piotr Perlin ◽  
Marek Osiński ◽  
Petr G Eliseev

ABSTRACTWe have studied the electroluminescence and photoluminescence of Nichia single-quantum-well Al0.2Ga0.8N/In0.45Ga0.55N/GaN green light-emitting diodes over a broad range of temperatures (15-300 K) and currents (0.2 μA - 2 A). The most striking behavior is an anomalous temperature shift of both photo- and electroluminescence, with the emission peak moving towards higher energies with increasing temperature. This blue shift is opposite to that of the energy gap of the active layer, which practically excludes interband transitions as responsible for the observed optical transitions. We suggest that population effects within the band tails can account for the observed anomaly. We also determined that the current flowing through the p-n junction is dominated by carrier tunneling, the omnipresent effect in the GaN-based optoelectronic devices.

2001 ◽  
Vol 79 (8) ◽  
pp. 1100-1102 ◽  
Author(s):  
Takashi Azuhata ◽  
Takefumi Homma ◽  
Yoshikazu Ishikawa ◽  
Shigefusa F. Chichibu ◽  
Takayuki Sota ◽  
...  

1996 ◽  
Vol 449 ◽  
Author(s):  
Marek Osiński ◽  
Piotr Perlin ◽  
Ptr G Eliseev ◽  
Gungtan Liu ◽  
Daniel L Barton

ABSTRACTWe performed a degradation study of high-brightness Nichia single-quantum well AlGaN/InGaN/GaN green light-emitting diodes (LEDs). The devices were subjected to high current electrical stress with current pulse amplitudes between 1 A and 7 A and voltages between 10 V and 70 V with a pulse length of 100 ns and a repetition rate of 1 kHz. The study showed that when the current amplitude was increased to the 6 A - 7.5 A range, a fast (about 1 s) degradation occurred, with a visible discharge between the p and n-type electrodes. Subsequent failure analysis revealed severe damage to metal contacts which lead to the formation of shorts in the surface plane of diode. For currents smaller than 6 A, a slow degradation was observed as a decrease in optical power and an increase in the reverse current leakage. After between 24 and 100 hours however, a rapid degradation occurred which was similar to the rapid degradation observed at higher currents. Failure analysis results suggest that carbonization of the plastic encapsulation material on the diode surface leads to the discharge which destroys the diode.


2010 ◽  
Vol 3 (12) ◽  
pp. 122102 ◽  
Author(s):  
Shuichiro Yamamoto ◽  
Yuji Zhao ◽  
Chih-Chien Pan ◽  
Roy B. Chung ◽  
Kenji Fujito ◽  
...  

2013 ◽  
Vol 6 (5) ◽  
pp. 052103 ◽  
Author(s):  
Yoshinobu Kawaguchi ◽  
Shih-Chieh Huang ◽  
Robert M. Farrell ◽  
Yuji Zhao ◽  
James S. Speck ◽  
...  

2002 ◽  
Vol 81 (16) ◽  
pp. 2938-2940 ◽  
Author(s):  
A. Chitnis ◽  
R. Pachipulusu ◽  
V. Mandavilli ◽  
M. Shatalov ◽  
E. Kuokstis ◽  
...  

2012 ◽  
Vol 5 (6) ◽  
pp. 062103 ◽  
Author(s):  
Chih-Chien Pan ◽  
Shinichi Tanaka ◽  
Feng Wu ◽  
Yuji Zhao ◽  
James S. Speck ◽  
...  

2010 ◽  
Vol 530 (1) ◽  
pp. 131/[287]-136/[292]
Author(s):  
Jung Soo Park ◽  
Tae Jin Park ◽  
Woo Sik Jeon ◽  
Gyeong Heon Kim ◽  
Jae Hyung Yu ◽  
...  

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