Correlation Between Defects and Electrical Conduction in Surface Conductive Layer of CVD-diamond Films
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Correlation between defects and electrical conduction in surface conductive layers of CVD diamond films has been studied using electron spin resonance ( ESR ) and two points probe technique methods. The ESR analysis revealed the presence of Pac-center with spin density of 1020 spins/cm3. The Pac-center is composed from two ESR signals: ESR signal from carbon dangling bond with carbon atom neighbors and ESR signal from carbon dangling bond associated with nearest neighbor hole ( hole associated Pac-center ). The hole associated Pac-center is an electrically active defect.
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2003 ◽
Vol 12
(3-7)
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pp. 511-515
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1991 ◽
Vol 47
(1-3)
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pp. 538-544
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1978 ◽
pp. 804
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1974 ◽
Vol 52
(21)
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pp. 3645-3650
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1973 ◽
Vol 95
(10)
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pp. 3220-3228
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