scholarly journals Growth and Mechanical and Tribological Characterization of Multi-Layer Hard Carbon Films

1996 ◽  
Vol 438 ◽  
Author(s):  
J. Ager ◽  
I. Brown ◽  
O. Monteiro ◽  
J. A. Knapp ◽  
D. M. Follstaedt ◽  
...  
Keyword(s):  
Layer Thickness ◽  
Carbon Films ◽  
Vacuum Arc ◽  
Individual Layer ◽  
Implantation Damage ◽  
Film Hardness ◽  
Sublayer Thickness ◽  
Pin On Disk ◽  
Tribological Characterization ◽  
20 Nm

AbstractVacuum-arc deposition is used to deposit multilayer carbon films by modulating the sample bias during deposition. The effect of varying the sublayer thickness in multilayer films consisting of alternating layers of “hard” (68.4 GPa, -100 V bias) and “soft” (27.5 GPa, -2000 V bias) was investigated. Films consisting of equal thickness layers of hard and soft material and an individual layer thickness varying from 10 to 35 nm were deposited. Mechanical property measurements were obtained by finite element modeling of nanoindentation load-displacement curves. The film hardness values were about 20% below the average of the component layers and relatively independent of the layer thickness. TEM investigation revealed deterioration of the multilayer structure when the sublayer thickness was below 15 nm due to implantation damage of the hard layers caused by the energetic C+ ions of the soft layers (-2000 V bias) deposited over them. Pin-on-disk wear tests show that the wear rate drops when sublayer thickness is decreased below 20 nm and remains constant with further decreases in the layer thickness.

Tribological Properties of Ni/Cu Multilayers

2007 ◽  
Vol 561-565 ◽  
pp. 2451-2454 ◽  
Author(s):  
Tomoya Hattori ◽  
Yoshihisa Kaneko ◽  
Satoshi Hashimoto
Keyword(s):  
Layer Thickness ◽  
Sliding Wear ◽  
Nickel Coating ◽  
Copper Substrate ◽  
Total Thickness ◽  
Individual Layer ◽  
Hardness Tests ◽  
Plastic Deformation Process ◽  
Electrodeposited Nickel ◽  
20 Nm

Sliding wear and hardness tests in Ni/Cu multilayers electrodeposited on polycrystalline copper substrate were carried out. The multilayers had a total thickness of 5 μm and an individual layer thickness from 5 to 100 nm. Hardness of the multilayers measured with a nanoindentation tester was found to be dependent on layer thickness. The multilayer with the layer thickness of 20 nm showed the highest value among them. It was found that the wear resistances of all the multilayers tested were higher than that of an electrodeposited nickel coating. It was also revealed that the specific wear rate of multilayers decreased with decreasing the layer thickness although the highest hardness was attained at the 20 nm layer thickness. Scanning ion microscope observation showed that the subsurface area kept the layered structure of nickel and copper even after sliding wear. The multilayer had plasticity sufficient to accommodate deformation coming from the sliding wear, because fine grains peculiar to severe plastic deformation process were formed near the worm surface.

Effects of Individual Layer Thickness on the Structure and Electrical Properties of Sol-Gel-Derived Ba0.8Sr0.2TiO3 Thin Films

2012 ◽  
Vol 621 ◽  
pp. 23-26
Author(s):  
Wei Rao ◽  
Ding Guo Li ◽  
Hong Chun Yan
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Layer Thickness ◽  
Sol Gel ◽  
Layer By Layer ◽  
Individual Layer ◽  
Individual Layer Thickness ◽  
Columnar Grains ◽  
The Individual ◽  
20 Nm

Ba0.8Sr0.2TiO3 thin films were prepared with various individual layer thicknesses using a sol– gel process. The individual layer thickness strongly affected the structure, ferroelectricity, and dielectric properties of the films. The films prepared with an individual layer thickness of 60 nm showed small equiaxed grains, cubic structure, temperature-independent dielectric constant, and no ferroelectricity. The films prepared with an individual layer thickness of 8 nm showed columnar grains, tetragonal structure, good ferroelectricity, and two dielectric peaks in the dielectric constant–temperature curve. The individual layer thickness for layer-by-layer homoepitaxy growth that resulted in columnar grains was <20 nm.

TRIBOLOGICAL AND MECHANICAL PROPERTIES OF ALUMINUM CONTAINING TETRAHEDRAL AMORPHOUS CARBON FILMS

2002 ◽  
Vol 16 (06n07) ◽  
pp. 946-951 ◽  
Author(s):  
E. Liu ◽  
J. X. Gao ◽  
B. K. Tay ◽  
X. Shi ◽  
A. Zeng
Keyword(s):  
Young’S Modulus ◽  
Amorphous Carbon ◽  
Young's Modulus ◽  
Carbon Films ◽  
Vacuum Arc ◽  
Al Content ◽  
Tetrahedral Amorphous Carbon ◽  
Atomic Force ◽  
Film Hardness ◽  
Filtered Cathodic Vacuum Arc

Tetrahedral amorphous carbon (ta-C) films which contained aluminum element were fabricated by filtered cathodic vacuum arc (FCVA) method. The tribological characteristics of the ta-C films were investigated with ball-on-disk tribometer. The increment of aluminum in the ta-C film leads to an increase of sp2 carbon bonding and a decrease of sp3 fraction in the film. The roughness of the films was measured with atomic force microscope, and the hardness and Young's modulus of the films were measured with nanoindentation. The results showed that the film hardness and Young's modulus dropped with the increase of Al content in the films. The results have been interpreted with respect to the change of sp 3 and sp 2 fractions in the ta-C:Al films.

An experimental and theoretical study of the abrasion performance of digital light processing parts

2020 ◽  
pp. 095440542098133
Author(s):  
Mehdi Kazemi ◽  
Abdolreza Rahimi
Keyword(s):  
Layer Thickness ◽  
Normal Load ◽  
Digital Light Processing ◽  
One Step ◽  
Pin On Disk ◽  
The Relationship ◽  
Influential Parameters ◽  
Disk Method ◽  
Normal Angle

Generally, interactions at surface asperities are the cause of wear. Two-Thirds of wear in industry occurs because of the abrasive or adhesive mechanisms. This research presents an analytical model for abrasion of additive manufactured Digital Light Processing products using pin-on-disk method. Particularly, the relationship between abrasion volume, normal load, and surface asperities’ angle is investigated. To verify the proposed mathematical model, the results of this model are verified with the practical experiments. Results show that the most influential parameters on abrasion rate are normal load and surface’s normal angle. Abrasion value increases linearly with increasing normal load. The maximum abrasion value occurs when the surface’s normal angle during fabrication is 45°. After the asperities are worn the abrasion volume is the same for all specimens with different surface’s normal angle. Though layer thickness does not directly affect the wear rate, but surface roughness tests show that layer thickness has a great impact on the quality of the abraded surface. When the thickness of the layers is high, the abraded surface has deeper valleys, and thus has a more negative skewness. This paper presents an original approach in abrasion behavior improvement of DLP parts which no research has been done on it so far; thus, bringing the AM one step closer to maturity.

scholarly journals Thermal stability and diffusion characteristics of ultrathin amorphous carbon films grown on crystalline and nitrogenated silicon substrates by filtered cathodic vacuum arc deposition

2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Shengxi Wang ◽  
Anurag Roy ◽  
Kyriakos Komvopoulos
Keyword(s):  
Thermal Stability ◽  
Amorphous Carbon ◽  
Silicon Substrate ◽  
Elevated Temperatures ◽  
Carbon Films ◽  
Vacuum Arc ◽  
Cross Sectional ◽  
Prolonged Heating ◽  
Filtered Cathodic Vacuum Arc ◽  
Thermal Stability Of

AbstractAmorphous carbon (a-C) films are widely used as protective overcoats in many technology sectors, principally due to their excellent thermophysical properties and chemical inertness. The growth and thermal stability of sub-5-nm-thick a-C films synthesized by filtered cathodic vacuum arc on pure (crystalline) and nitrogenated (amorphous) silicon substrate surfaces were investigated in this study. Samples of a-C/Si and a-C/SiNx/Si stacks were thermally annealed for various durations and subsequently characterized by high-resolution transmission electron microscopy (TEM) and electron energy loss spectroscopy (EELS). The TEM images confirmed the continuity and uniformity of the a-C films and the 5-nm-thick SiNx underlayer formed by silicon nitrogenation using radio-frequency sputtering. The EELS analysis of cross-sectional samples revealed the thermal stability of the a-C films and the efficacy of the SiNx underlayer to prevent carbon migration into the silicon substrate, even after prolonged heating. The obtained results provide insight into the important attributes of an underlayer in heated multilayered media for preventing elemental intermixing with the substrate, while preserving the structural stability of the a-C film at the stack surface. An important contribution of this investigation is the establishment of an experimental framework for accurately assessing the thermal stability and elemental diffusion in layered microstructures exposed to elevated temperatures.

scholarly journals The Band-Gap Studies of Short-Period CdO/MgO Superlattices

2021 ◽  
Vol 16 (1) ◽  
Author(s):  
Ewa Przeździecka ◽  
P. Strąk ◽  
A. Wierzbicka ◽  
A. Adhikari ◽  
A. Lysak ◽  
...  
Keyword(s):  
Band Gap ◽  
Layer Thickness ◽  
Energy Gap ◽  
Band Gaps ◽  
Short Period ◽  
Wide Range ◽  
Salt Structure ◽  
Short Period Superlattices ◽  
Direct Band ◽  
Sublayer Thickness

AbstractTrends in the behavior of band gaps in short-period superlattices (SLs) composed of CdO and MgO layers were analyzed experimentally and theoretically for several thicknesses of CdO sublayers. The optical properties of the SLs were investigated by means of transmittance measurements at room temperature in the wavelength range 200–700 nm. The direct band gap of {CdO/MgO} SLs were tuned from 2.6 to 6 eV by varying the thickness of CdO from 1 to 12 monolayers while maintaining the same MgO layer thickness of 4 monolayers. Obtained values of direct and indirect band gaps are higher than those theoretically calculated by an ab initio method, but follow the same trend. X-ray measurements confirmed the presence of a rock salt structure in the SLs. Two oriented structures (111 and 100) grown on c- and r-oriented sapphire substrates were obtained. The measured lattice parameters increase with CdO layer thickness, and the experimental data are in agreement with the calculated results. This new kind of SL structure may be suitable for use in visible, UV and deep UV optoelectronics, especially because the energy gap can be precisely controlled over a wide range by modulating the sublayer thickness in the superlattices.

Sign in / Sign up

Export Citation Format

Share Document