Plastic Deformation in Thin Copper Films Determined by X-Ray Micro-Tensile Tests

1996 ◽  
Vol 436 ◽  
Author(s):  
A. Kretschmann ◽  
W.-M. Kuschke ◽  
S. P. Baker ◽  
E. Arzt

AbstractPlastic deformation in thin copper films has been studied at room temperature. Copper films having a thickness of 1 μm were made by sputtering onto nickel substrates with a Si3N4 underlayer and with or without a Si3N4 caplayer. Deformation experiments were conducted using a special micro-tensile tester built into a θ–θ diffractometer. The problems normally associated with tension tests of free-standing films were avoided by deforming the substrate and film together. In-situ x-ray measurements of the lattice spacings and lattice spacing distributions were used to determine both elastic and plastic strains. The effects of caplayer and annealing temperature on mechanical properties are reported.

1998 ◽  
Vol 546 ◽  
Author(s):  
M. Hommel ◽  
O. Kraft ◽  
S. P. Baker ◽  
E. Arzt

AbstractA special micro-tensile tester was used to carry out tensile tests of thin copper films on substrates. The elastic strain in the film was measured in-situ using x-ray diffraction and the total strain with an external strain gage. From the elastic strains the stresses in the films were calculated and stress-strain curves were obtained. It was observed that the flow stress increases with decreasing film thickness. The method was also applied to investigate the mechanical behavior of films under cyclic loading.


2004 ◽  
Vol 387-389 ◽  
pp. 339-342 ◽  
Author(s):  
W. Pantleon ◽  
H.F. Poulsen ◽  
J. Almer ◽  
U. Lienert

1989 ◽  
Vol 33 ◽  
pp. 161-169
Author(s):  
G. Sheikh ◽  
I. C. Noyan

AbstractWe report the results of a recent study where nickel substrates electroplated with chromium were loaded in-situ on an x-ray diffractometer. This technique allows determination of lattice spacings in the vicinity of the interface for both the film and the substrate as a function of the applied load. We used such lattice parameter data, SEM observations of the surface and x-ray peak breadth data to study the partitioning of deformation between the film and the substrate. The data indicates progressive loss of adhesion between the film and the substrate with increasing deformation. We observe significant effect of electroplating residual stresses on the mechanical behavior of the system. The loss of adhesion between the film and the substrate coupled with the initial residual stress profile causes an apparent 'negative Poisson's ratio' for the film during initial stages of the loading. This effect disappears with cyclic loading and unloading.


Materials ◽  
2019 ◽  
Vol 12 (1) ◽  
pp. 172 ◽  
Author(s):  
Ming Li ◽  
Zhiming Shi ◽  
Xiufeng Wu ◽  
Huhe Wang ◽  
Yubao Liu

In this work, the microstructure of Al-5Fe-1.5Er alloy was characterized and analyzed using X-ray diffraction (XRD), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and energy-dispersive X-ray spectroscopy (EDS) techniques. The effect of microstructure on the behavior of crack initiation and propagation was investigated using in situ tensile testing. The results showed that when 1.5 wt.% Er was added in the Al-5Fe alloy, the microstructure consisted of α-Al matrix, Al3Fe, Al4Er, and Al3Fe + Al4Er eutectic phases. The twin structure of Al3Fe phase was observed, and the twin plane was {001}. Moreover, a continuous concave and convex interface structure of Al4Er was observed. Furthermore, Al3Fe was in the form of a sheet with a clear gap inside. In situ tensile tests of the alloy at room temperature showed that the crack initiation mainly occurred in the Al3Fe phase, and that the crack propagation modes included intergranular and trans-granular expansions. The crack trans-granular expansion was due to the strong binding between Al4Er phases and surrounding organization, whereas the continuous concave and convex interface structure of Al4Er provided a significant meshing effect on the matrix and the eutectic structure.


2013 ◽  
Vol 583 ◽  
pp. 47-50 ◽  
Author(s):  
Masanobu Kusunoki ◽  
Taiyo Matsuda ◽  
Naoki Fujita ◽  
Yasuhiro Sakoishi ◽  
Ryou Iguchi ◽  
...  

A technique to control the crystallinity of hydroxyapatite (HA) was investigated for applications such as dentistry, regenerative medicine, cell culture scaffolding, and bio-sensors. An amorphous HA film was first produced by pulsed laser deposition. After deposition, it was separated from a substrate as a free-standing sheet. Annealing was then performed to control the crystallinity of the sheet. It was found that conventional annealing in an electric oven was not suitable for HA sheets, because it led to curling and cracking. Since such problems were assumed to be caused by thermal stress, annealing was next carried out with the HA sheet enclosed in HA powder in the center of a metal capsule. This method allowed annealing to be successfully carried out without causing any curling or cracking. Uniform pieces with dimensions of 10 mm × 10 mm cut from a large HA sheet were annealed at temperatures of 200 to 800 ºC and then examined using X-ray diffraction. It was found that the intensity of the diffraction peaks associated with crystalline HA changed with annealing temperature, and that the strongest peaks were observed for the sample annealed at 500 ºC. These results indicate that the crystallinity of the HA sheet can be controlled using the proposed method.


2008 ◽  
Author(s):  
Suxia Zhou ◽  
Eric Maire ◽  
Jilong Xie ◽  
Andrea Bareggi ◽  
Jerome Adrien ◽  
...  

1986 ◽  
Vol 82 ◽  
Author(s):  
J. C. Bilello

ABSTRACTThe application of relatively low resolution x-ray topography methods, typically ∿ 1 micrometer, is limited in studies which involve large scale dislocation networks. However, the ability to non-destructively image wide areas for “thick” specimens at high intensity with a tunable x-ray source makes the synchrotron an ideal probe for a range of problems previously inaccessible by other methods. Some examples will be discussed such as: (a) crack initiation and propagation in fatigued bicrystals, (b) real-time in situ plastic deformation studies in strain-annealed Mo crystals, and (c) strain distributions in vapor deposited and LPE thin films on Si and GaAs substrates.


Sign in / Sign up

Export Citation Format

Share Document