The Influence of Hydrogen Plasma Passivation on Electrical and Optical Properties of Aigan Samples Grown on Sapphire

1996 ◽  
Vol 423 ◽  
Author(s):  
A. Y. Polyakov ◽  
M. Shin ◽  
S. J. Pearton ◽  
M. Skowronski ◽  
D. W. Greve ◽  
...  

AbstractHydrogen plasma passivation effects are studied for undoped AlGaN layers grown by MOCVD. Hydrogen treatment at 200°C for lh led to a substantial decrease in carrier concentration accompanied by an increase in electron mobility. The magnitude of the near-band edge absorption tails also dramatically decreased after hydrogen passivation. The effect is explained by pairing of negatively charged hydrogen acceptors with positively charged native donors commonly believed to be related to nitrogen vacancies. The bond strength in such hydrogen complexes increases as the composition of AlGaN moves towards AIN, as revealed by results of post hydrogenation annealing.

2003 ◽  
Vol 94 (1) ◽  
pp. 400-406 ◽  
Author(s):  
A. Y. Polyakov ◽  
N. B. Smirnov ◽  
A. V. Govorkov ◽  
K. Ip ◽  
M. E. Overberg ◽  
...  

2006 ◽  
Vol 511-512 ◽  
pp. 295-298 ◽  
Author(s):  
L. Raniero ◽  
I. Ferreira ◽  
A. Pimentel ◽  
A. Gonçalves ◽  
P. Canhola ◽  
...  

2009 ◽  
Vol 1201 ◽  
Author(s):  
Koji Abe ◽  
Masanori Oiwa

AbstractEffects of H2O partial pressure on ZnO crystal growth by chemical vapor transport (CVT) have been investigated. The use of H2O causes the increase in growth rate of ZnO, indicating that H2O acts as a dominant oxygen source in ZnO growth by CVT. The use of H2O also improves structural, electrical, and optical properties of the CVT-grown ZnO crystals. A sharp X-ray rocking curve for the ZnO (0002) reflection was obtained, and the full width at half maximum value was 38 arcsec. Strong near band edge emission was observed in photoluminescence spectra at room temperature. Both carrier concentration and Hall mobility increased with partial pressure of H2O. The dependence of the carrier concentration on temperature indicates that there exist two donors in the CVT-grown ZnO crystals. The estimated ionization energy for the shallow donor was 35±5 meV and that for the deep donor was 115±5 meV.


2001 ◽  
Vol 40 (Part 2, No. 3A) ◽  
pp. L189-L191 ◽  
Author(s):  
Gang Wang ◽  
Kimiya Akahori ◽  
Tetsuo Soga ◽  
Takashi Jimbo ◽  
Masayoshi Umeno

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