Stabilization of Transverse Mode Emission in Vertical-Cavity Surface-Emitting Lasers by Deposition of High Refractive Index Amorphous Gaas

1996 ◽  
Vol 421 ◽  
Author(s):  
Hyo-Hoon Park ◽  
Byueng-Su Yoo ◽  
Hye Yong Chu ◽  
El-Hang Lee ◽  
Min Soo Park ◽  
...  

AbstractWe report successful application of a low-temperature-grown amorphous GaAs (a-GaAs) layer for stabilization of the fundamental transverse mode of InGaAs/GaAs vertical-cavity surface-emitting lasers. The maximum currents maintaining a stable fundamental transverse mode were increased by the antiguide effect of a-GaAs with a high refractive index. For 10-μm- and 15-μm-diameter devices, we attained a stable single-mode emission over a wide range of current. The antiguiding of transverse modes in vertical cavity buried in the high refractive cladding layer was calculated using a two-dimensional beam propagation method.

2021 ◽  
Vol 58 (7) ◽  
pp. 0700008
Author(s):  
王翔媛 Wang Xiangyuan ◽  
崔碧峰 Cui Bifeng ◽  
李彩芳 Li Caifang ◽  
许建荣 Xu Jianrong ◽  
王豪杰 Wang Haojie

1990 ◽  
Vol 57 (3) ◽  
pp. 218-220 ◽  
Author(s):  
C. J. Chang‐Hasnain ◽  
M. Orenstein ◽  
A. Von Lehmen ◽  
L. T. Florez ◽  
J. P. Harbison ◽  
...  

1994 ◽  
Vol 05 (04) ◽  
pp. 667-730 ◽  
Author(s):  
MAREK OSIŃSKI ◽  
WŁODZIMIERZ NAKWASKI

A comprehensive review of temperature-related effects and thermal modeling of vertical-cavity surface-emitting lasers (VCSELs) is presented. The paper is divided into two major parts. First, the effects of temperature on device characteristics are discussed, including the temperature dependence of the longitudinal mode spectra, the threshold current, the transverse-mode structure, and the output power. A new condition is formulated for thermal matching of the Bragg mirrors and the spacer region and a comparison is made between characteristic temperatures for the threshold current (T0) and for the external quantum efficiency (Tη). In the second part, various approaches to thermal modeling of VCSELs are described. Both simplified and comprehensive thermal models are considered and both analytical and numerical approaches are discussed. A new analytical approximate method for analysis of heat-flux spreading in multilayer structures is described. The most important results obtained with the aid of these models are presented. In particular, we show that the current dependence of thermal resistance is very sensitive to VCSEL structure, and is strongly influenced by the relative distribution of heat sources and their location with respect to the heat sink.


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