Ballistic-Electron-Emission Microscopy (BEEM) Studies of Gainp/GaAs Heterostructures
Keyword(s):
P Type
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AbstractBallistic-electron-emission microscopy (BEEM) has been used to study band-offsets in n-and p-type GaInP/GaAs heterostructures. We determine room temperature offsets of 30 meV and 350 meV in the conduction and valence bands, respectively, for thin GaInP layers grown by metal-organic chemical vapor deposition (MOCVD) at 610°C. Low temperature (77 K) measurements also indicate at least 90% of the band discontinuity lies in the valence band for these ordered GaInP samples.
2011 ◽
Vol 509
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pp. 1980-1983
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1998 ◽
Vol 37
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pp. 4595-4602
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pp. 3016-3018
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2007 ◽
Vol 401-402
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pp. 386-390
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