Fractography Of Glass At The Nanometer Scale

1995 ◽  
Vol 409 ◽  
Author(s):  
E. Guilloteau ◽  
H. Arribart ◽  
F. Creuzet
Keyword(s):  
Atomic Force Microscopy ◽  
Fracture Surface ◽  
Soda Lime ◽  
Nanometer Scale ◽  
Soda Lime Glass ◽  
Self Similarity ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mirror Zone

AbstractWe present a nanometer scale description of the fracture surface of soda-lime glass. This is achieved by the use of Atomic Force Microscopy. The mirror zone is shown to be built with elementary entities, the density of which increases continuously while the mist and hackle zones are approached. Moreover, the overall picture leads to some kind of self-similarity, in the sense that small regions of the hackle zone exhibit the full set of mirror, mist and hackle areas.

Single Asperity Chemical Mechanical Wear Studied by Atomic Force Microscopy

2003 ◽  
Vol 767 ◽  
Author(s):  
Forrest Stevens ◽  
Steve Langford ◽  
J. Thomas Dickinson
Keyword(s):  
Activation Energy ◽  
Atomic Force Microscopy ◽  
Silicon Nitride ◽  
Soda Lime ◽  
Fused Silica ◽  
Nanometer Scale ◽  
Soda Lime Glass ◽  
Force Microscopy ◽  
Single Asperity ◽  
Atomic Force

AbstractNanometer scale wear caused by a single asperity of silicon nitride was examined by measuring the wear caused by atomic force microscope tips translated against sodium trisilicate glass, soda-lime glass, or fused silica in aqueous solutions. As a function of contact force, FN, and scan duration, t, the wear to both tip and substrate scales approximately as (FNt)0.5. Substrate wear was independent of temperature from 5°C to 60°C, whereas tip wear showed a temperature dependence on soda-lime glass corresponding to an activation energy of 60 kJ/mol on soda-lime glass.

Study of the Electrical Properties of Cu2ZnSnS4 (CZTS) Thin Film Using Atomic Force Microscopy (AFM) Techniques

2020 ◽  
Vol 20 (6) ◽  
pp. 3925-3928 ◽  
Author(s):  
Muhunthan Nadarajah ◽  
Om Pal Singh ◽  
Kuldeep Singh Gour ◽  
Vidya Nand Singh
Keyword(s):  
Thin Film ◽  
Atomic Force Microscopy ◽  
Electrical Transport ◽  
Soda Lime ◽  
Czts Thin Film ◽  
Soda Lime Glass ◽  
Kelvin Probe ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

CZTS is a compound semiconductor made from elements which are plainly available and nonpoisonous having favorable optoelectronic properties for thin film solar cell (TFSC) applications. In this study, Cu-poor CZTS thin film was fabricated on soda lime glass (SLG)/Mo-deposited substrate using cosputtering followed by post sulfurization in H2S atmosphere. Local electrical transport study was carried out by using conductive atomic force microscopy (C-AFM) for small bias voltage (100 mV). Here we observed that most of the dark current (Idark) flow through grain boundaries (GBs) than grain interiors. The positive high current about 3.4 nA and sharp C-AFM signal at the GBs, dips to the zero (0) value at the grain interior. Local surface potential (Vsurface) study was carried out using kelvin probe force microscopy (KPFM), which showed that the positive Vsurface potential about 175 mV in the vicinity of GBs in a Cu-poor CZTS sample. On the basis of these results we inferred a potential landscape (VL) around the GBs. All result shows that due to variation in elemental composition which creates Cu-deficit or CuZn anti site defects at GBs, leads reduced effective band gap (Eeff) than the bulk towards grain inner to GBs.[-2pt]

scholarly journals Assessing dystrophies and other muscle diseases at the nanometer scale by atomic force microscopy

Nanomedicine ◽  
2014 ◽  
Vol 9 (4) ◽  
pp. 393-406 ◽  
Author(s):  
Ruthger W van Zwieten ◽  
Stefania Puttini ◽  
Małgorzata Lekka ◽  
Guillaume Witz ◽  
Evelyne Gicquel-Zouida ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Nanometer Scale ◽  
Muscle Diseases ◽  
Force Microscopy ◽  
Atomic Force

Self-Affine Quasi-Static Fracture of Soda-Lime Glass

2007 ◽  
Vol 560 ◽  
pp. 41-46 ◽  
Author(s):  
Claus Guerra-Amaro ◽  
M. Hinojosa ◽  
E. Reyes-Melo ◽  
V. González
Keyword(s):  
Soda Lime ◽  
The Self ◽  
Soda Lime Glass ◽  
Force Microscopy ◽  
Fracture Surfaces ◽  
Atomic Force ◽  
A Value ◽  
Roughness Exponent ◽  
Static Fracture ◽  
Static Conditions

In the present work we discuss the self-affine properties of the fracture surfaces of sodalime glass obtained under quasi-static conditions. The fracture surfaces are generated using a threepoint bending system in normal room conditions and under high humidity conditions. The surfaces were recorded both by Scanning Electron Microscopy and Atomic Force Microscopy, and their selfaffine properties are characterized using the Variable Bandwidth method. For both conditions it is observed that the major part of the fracture surface is occupied by the mirror zone. On the other hand, the self-affine analysis reveals that for both conditions the roughness exponent has values centred at around 0.58 with moderate dispersion, in agreement with previous results. Our findings support the hypothesis of the existence of a characteristic roughness exponent for quasi-static fracture with a value that is significantly lower than the value of 0.8 reported for rapid fracture conditions.

scholarly journals Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

2001 ◽  
Vol 78 (26) ◽  
pp. 4181-4183 ◽  
Author(s):  
M. Porti ◽  
M. Nafrı́a ◽  
X. Aymerich ◽  
A. Olbrich ◽  
B. Ebersberger
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanometer Scale ◽  
Sio2 Films ◽  
Force Microscopy ◽  
Atomic Force

427 Nanometer-scale fabrication of organic photosensitive polymer using atomic force microscopy

2001 ◽  
Vol 2001.7 (0) ◽  
pp. 171-172
Author(s):  
F. IWATA ◽  
K. KOBAYASHI ◽  
A. SASAKI ◽  
Y. KAWATA ◽  
C. EGAMI ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Nanometer Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
Photosensitive Polymer

Nanofractography Of Composition B Fracture Surfaces with AFM

2003 ◽  
Vol 800 ◽  
Author(s):  
Y. D. Lanzerotti ◽  
J. Sharma ◽  
R. W. Armstrong ◽  
R. L. McKenney ◽  
T. R. Krawietz
Keyword(s):  
Atomic Force Microscopy ◽  
Tensile Strength ◽  
Fracture Surface ◽  
Surface Morphology ◽  
Fracture Surface Morphology ◽  
Fine Scale ◽  
Force Microscopy ◽  
Atomic Force ◽  
High Acceleration ◽  
Columnar Grains

ABSTRACTThe characteristics of TNT (trinitrotoluene) crystals in the fracture surface of Composition B (a melt-cast mixture of TNT and RDX) have been studied using atomic force microscopy (AFM). The size of TNT crystals has been examined by analyzing the surface structure that is exhibited after mechanical failure of the Composition B. The failure occurs when the material is subjected to high acceleration in an ultracentrifuge and the shear or tensile strength is exceeded. AFM examination of the topography of the Composition B fracture surface reveals fracture across columnar grains of the TNT. The width of the columnar TNT grains ranges in size from ∼ 1 μm to ∼ 2 μm. Their height ranges in size from ∼ 50 nm to ∼ 300 nm. Flat TNT columns alternate with TNT columns containing river patterns that identify the direction of crack growth. Steps in the river patterns are a few nanometers in depth. The TNT constitutent fracture surface morphology is shown to occur on such fine scale, beginning from adjacent columnar crystals only 1–2 μm in width, and including river marking step heights of only a few nanometers, that AFM-type resolution is required.

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