Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

M. Porti; M. Nafrı́a; X. Aymerich; A. Olbrich; B. Ebersberger

doi:10.1063/1.1382624

Nanometer-scale electrical characterization of stressed ultrathin SiO2 films using conducting atomic force microscopy

Applied Physics Letters ◽

10.1063/1.1382624 ◽

2001 ◽

Vol 78 (26) ◽

pp. 4181-4183 ◽

Cited By ~ 40

Author(s):

M. Porti ◽

M. Nafrı́a ◽

X. Aymerich ◽

A. Olbrich ◽

B. Ebersberger

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Nanometer Scale ◽

Sio2 Films ◽

Force Microscopy ◽

Atomic Force

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Post-breakdown electrical characterization of ultrathin SiO2 films with conductive atomic force microscopy

Nanotechnology ◽

10.1088/0957-4484/13/3/329 ◽

2002 ◽

Vol 13 (3) ◽

pp. 388-391 ◽

Cited By ~ 3

Author(s):

M Porti ◽

M Nafría ◽

X Aymerich ◽

A Olbrich ◽

B Ebersberger

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Sio2 Films ◽

Force Microscopy ◽

Atomic Force

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Microwave Atomic Force Microscopy: Quantitative Measurement and Characterization of Electrical Properties on the Nanometer Scale

Applied Physics Express ◽

10.1143/apex.5.016602 ◽

2011 ◽

Vol 5 (1) ◽

pp. 016602 ◽

Cited By ~ 8

Author(s):

Lan Zhang ◽

Yang Ju ◽

Atsushi Hosoi ◽

Akifumi Fujimoto

Keyword(s):

Atomic Force Microscopy ◽

Electrical Properties ◽

Quantitative Measurement ◽

Nanometer Scale ◽

Force Microscopy ◽

Atomic Force

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Conducting atomic force microscopy for nanoscale electrical characterization of thin SiO2

Applied Physics Letters ◽

10.1063/1.122690 ◽

1998 ◽

Vol 73 (21) ◽

pp. 3114-3116 ◽

Cited By ~ 140

Author(s):

Alexander Olbrich ◽

Bernd Ebersberger ◽

Christian Boit

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Force Microscopy ◽

Atomic Force

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Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy (C-AFM)

Ultramicroscopy ◽

10.1016/j.ultramic.2005.07.003 ◽

2006 ◽

Vol 106 (3) ◽

pp. 191-199 ◽

Cited By ~ 84

Author(s):

A. Alexeev ◽

J. Loos ◽

M.M. Koetse

Keyword(s):

Atomic Force Microscopy ◽

Polymer Blends ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Semiconducting Polymer ◽

Force Microscopy ◽

Atomic Force

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Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

Journal of the European Ceramic Society ◽

10.1016/j.jeurceramsoc.2010.01.005 ◽

2010 ◽

Vol 30 (7) ◽

pp. 1761-1764 ◽

Cited By ~ 10

Author(s):

Martin Schloffer ◽

Christian Teichert ◽

Peter Supancic ◽

Andrei Andreev ◽

Yue Hou ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy

The Journal of Physical Chemistry C ◽

10.1021/jp805422k ◽

2008 ◽

Vol 112 (49) ◽

pp. 19680-19685 ◽

Cited By ~ 14

Author(s):

Pavels Birjukovs ◽

Nikolay Petkov ◽

Ju Xu ◽

Janis Svirksts ◽

John J. Boland ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Nanowire Arrays ◽

Bismuth Sulfide ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Electrical characterization of oxygen-induced nanosized ripples on aluminum thin films by conductive atomic force microscopy

Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms ◽

10.1016/j.nimb.2005.07.245 ◽

2006 ◽

Vol 243 (1) ◽

pp. 16-19 ◽

Cited By ~ 12

Author(s):

P. Mishra ◽

P. Karmakar ◽

D. Ghose

Keyword(s):

Thin Films ◽

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Local electrical characterization of Schottky diodes on H-terminated diamond surfaces by conducting probe atomic force microscopy

Diamond and Related Materials ◽

10.1016/j.diamond.2005.11.052 ◽

2006 ◽

Vol 15 (4-8) ◽

pp. 618-621 ◽

Cited By ~ 5

Author(s):

F. Houzé ◽

J. Alvarez ◽

J.-P. Kleider ◽

P. Bergonzo ◽

E. Snidero ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Schottky Diodes ◽

Electrical Characterization ◽

Diamond Surfaces ◽

Force Microscopy ◽

Atomic Force

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Electrical characterization of HgTe nanowires using conductive atomic force microscopy

Journal of Applied Physics ◽

10.1063/1.3512960 ◽

2010 ◽

Vol 108 (11) ◽

pp. 114308 ◽

Cited By ~ 3

Author(s):

P. Gundersen ◽

K. O. Kongshaug ◽

E. Selvig ◽

R. Haakenaasen

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Conductive Atomic Force Microscopy ◽

Force Microscopy ◽

Atomic Force

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Local electrical characterization of two-dimensional materials with functional atomic force microscopy

Frontiers of Physics ◽

10.1007/s11467-018-0879-7 ◽

2019 ◽

Vol 14 (3) ◽

Cited By ~ 14

Author(s):

Sabir Hussain ◽

Kunqi Xu ◽

Shili Ye ◽

Le Lei ◽

Xinmeng Liu ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Electrical Characterization ◽

Two Dimensional ◽

Force Microscopy ◽

Atomic Force ◽

Two Dimensional Materials

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