Light Scattering Measurement Of Surface Topography During Formation Of Titanium Silicide.

1995 ◽  
Vol 406 ◽  
Author(s):  
C. Lavoie ◽  
C. Cabral ◽  
L. A. Clevenger ◽  
J. M. E. Harper ◽  
J. Jordan-Sweet ◽  
...  
Keyword(s):  
Light Scattering ◽  
Surface Topography ◽  
Titanium Silicide ◽  
Ex Situ ◽  
Silicon Substrates ◽  
X Ray Diffraction ◽  
Elastic Light Scattering ◽  
Poly Silicon ◽  
Light Scattering Measurement

AbstractThe evolution of the surface topography during the phase transformations of titanium silicide has been studied using elastic light scattering at two different collection angles. The light scattering measurements were performed simultaneously with x-ray diffraction and resistance measurements for titanium films deposited on either Si(100) or on poly-silicon substrates. At selected points during annealing, the samples were cooled rapidly to room temperature and analyzed ex situ using Nomarski microscopy. We find that, depending on the detection geometry, the in situ light scattering shows preferentially the formation of the C49 or C54 TiSi2 phase as well as differentiates between inversion and agglomeration on poly-silicon substrates.

Surface Roughening During Titanium Silicide Formation: a Comparison Between Si(100) and Poly-Si Substrates

1996 ◽  
Vol 440 ◽  
Author(s):  
C. Lavoie ◽  
R. Martel ◽  
C. Cabral ◽  
L. A. Clevenger ◽  
J. M. E. Harper
Keyword(s):  
Light Scattering ◽  
Titanium Silicide ◽  
High Resistivity ◽  
X Ray Diffraction ◽  
Elastic Light Scattering ◽  
Force Microscopy ◽  
Si Substrates ◽  
Atomic Force ◽  
Fourier Filtering ◽  
Ti Films

AbstractWe demonstrate that the formation of TiSi2 for Ti films deposited on undoped Si(100) substrates leads to rougher surfaces than for Ti films deposited on undoped poly-Si substrates. The successive formations of TiSi2, C49 (high resistivity) and C54 (low resistivity) phases from titanium films deposited on either Si(100) or poly-Si substrates were monitored in situ during rapid thermal annealing using elastic light scattering, x-ray diffraction and resistance measurements. For both types of substrates, the roughening occurs only during the formation of the first TiSi2, phase (C49) by light scattered from lateral length scales of ˜0.5 μm. Atomic force microscopy (AFM) images. quantified using Fourier filtering, are consistent with the light scattering results.

Light Scattering Study of the Evolution of the Surface Morphology During Growth of Ingaas on GaAs

1994 ◽  
Vol 375 ◽  
Author(s):  
C. Lavoie ◽  
B. Haveman ◽  
E. Nodwell ◽  
T. Pinnington ◽  
T. Tiedje ◽  
...  
Keyword(s):  
Light Scattering ◽  
Surface Morphology ◽  
Ex Situ ◽  
Molecular Beam Epitaxy Growth ◽  
Elastic Light Scattering ◽  
Force Microscopy ◽  
Atomic Force ◽  
Scattering Study ◽  
Good Agreement

AbstractIn-situ elastic light scattering is used to measure the evolution of the surface morphology of InxGa1−xAs films during molecular beam epitaxy growth on GaAs substrates. The in-situ measurements are compared with ex-situ measurements of the surface morphology on quenched films by optical scatterometry and atomic force microscopy (AFM). The AFM results are in good agreement with the rms roughness obtained from light scattering and both techniques detect the onset of misfit dislocation formation in this system.

In Situ X-Ray Diffraction Investigations during Diffusion Anneals of Ni-Cu Thin Film Diffusion Couples

2010 ◽  
Vol 89-91 ◽  
pp. 503-508 ◽  
Author(s):  
J. Sheng ◽  
U. Welzel ◽  
Eric J. Mittemeijer
Keyword(s):  
Thermal Stresses ◽  
Stress Generation ◽  
Ex Situ ◽  
Diffusion Annealing ◽  
X Ray Diffraction ◽  
Individual Layer ◽  
X Ray ◽  
Bilayer System ◽  
Stress Changes

The stress evolution during diffusion annealing of Ni-Cu bilayers (individual layer thicknesses of 50 nm) was investigated employing ex-situ and in-situ X-ray diffraction measurements. Annealing at relatively low homologous temperatures (about 0.3 - 0.4 Tm) for durations up to about 100 hours results in considerable diffusional intermixing, as demonstrated by Auger-electron spectroscopy investigations (in combination with sputter-depth profiling). In addition to thermal stresses due to differences of the coefficients of thermal expansion of layers and substrate, tensile stress con-tributions in the sublayers arise during the diffusion anneals. The obtained stress data have been discussed in terms of possible mechanisms of stress generation. The influence of diffusion on stress development in the sublayers of the diffusion couple during heating and isothermal annealing was investigated by comparing stress changes in the bilayer system with corresponding results obtained under identical conditions for single layers of the components in the bilayer system. The specific residual stresses that emerge due to diffusion between the (sub)layers in the bilayer could thereby be identified.

Size dependent behavior of Fe3O4crystals during electrochemical (de)lithiation: an in situ X-ray diffraction, ex situ X-ray absorption spectroscopy, transmission electron microscopy and theoretical investigation

2017 ◽  
Vol 19 (31) ◽  
pp. 20867-20880 ◽  
Author(s):  
David C. Bock ◽  
Christopher J. Pelliccione ◽  
Wei Zhang ◽  
Janis Timoshenko ◽  
K. W. Knehr ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Structural Changes ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
X Ray ◽  
Size Dependent ◽  
Transmission Electron ◽  
Dependent Behavior ◽  
X Ray Absorption

Crystal and atomic structural changes of Fe3O4upon electrochemical (de)lithiation were determined.

scholarly journals A study on preparation and characterization of carbon doped TiO2 nanotubes

2014 ◽  
Vol 6 (1) ◽  
Author(s):  
Srimala Sreekantan ◽  
Roshasnorlyza Hazan ◽  
Zainovia Lockman ◽  
Ishak Mat
Keyword(s):  
Methyl Orange ◽  
Tio2 Nanotubes ◽  
Pure Tio2 ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
Methyl Orange Degradation ◽  
Doped Tio2 ◽  
X Ray ◽  
Carbon Doped

The present study is directed to clarify the influence of carbon doping on the degradation of methyl orange. TiO2 nanotubes were prepared by anodizing titanium foils in a two electrode configuration bath with titanium foil as the anode and platinum as the counter electrode. The electrochemical bathconsists of 1 M Na2SO4 with 0.7 g ammonium fluoride, NH4F. The nanotubes obtained were further doped with carbon via in-situ and ex-situ method. Incorporation of carbon on TiO2 via in-situ method is accomplished during the anodization process by introducing oxalic acid into electrolyte while theex-situ doping involves carbon incorporation into pre-fabricated TiO2 nanotube via flame annealing using carbon blackN330. Characterization such as Scanning Electron Microscope (SEM), Energy Dispersive X-ray Analysis (EDX), and X-Ray Diffraction (XRD) are used to determine the surfacemorphology, composition of dopants, and phases exists. Well ordered nanotube with good adherence and smooth surface was obtained for both methods. When the oxide was annealed, X-ray diffraction analysis revealed the presence of anatase and rutile phase. The photocatalytic properties of thepure TiO2 and carbon doped TiO2 were tested for methyl orange degradation and the result indicated that the in-situ doped TiO2 has much better degradation than the ex-situ and pure TiO2. The percentage of methyl orange degradation for in-situ was 20% and 41% higher than ex-situ doped TiO2 and pure TiO2, respectively.

scholarly journals The Viscosity and Atomic Structure of Volatile-Bearing Melilititic Melts at High Pressure and Temperature and the Transport of Deep Carbon

Minerals ◽  
2020 ◽  
Vol 10 (3) ◽  
pp. 267 ◽  
Author(s):  
Vincenzo Stagno ◽  
Veronica Stopponi ◽  
Yoshio Kono ◽  
Annalisa D’Arco ◽  
Stefano Lupi ◽  
...  
Keyword(s):  
Experimental Data ◽  
High Pressure ◽  
Atomic Structure ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
High Pressure And Temperature ◽  
X Ray ◽  
Falling Sphere ◽  
Basaltic Melts

Understanding the viscosity of mantle-derived magmas is needed to model their migration mechanisms and ascent rate from the source rock to the surface. High pressure–temperature experimental data are now available on the viscosity of synthetic melts, pure carbonatitic to carbonate–silicate compositions, anhydrous basalts, dacites and rhyolites. However, the viscosity of volatile-bearing melilititic melts, among the most plausible carriers of deep carbon, has not been investigated. In this study, we experimentally determined the viscosity of synthetic liquids with ~31 and ~39 wt% SiO2, 1.60 and 1.42 wt% CO2 and 5.7 and 1 wt% H2O, respectively, at pressures from 1 to 4.7 GPa and temperatures between 1265 and 1755 °C, using the falling-sphere technique combined with in situ X-ray radiography. Our results show viscosities between 0.1044 and 2.1221 Pa·s, with a clear dependence on temperature and SiO2 content. The atomic structure of both melt compositions was also determined at high pressure and temperature, using in situ multi-angle energy-dispersive X-ray diffraction supported by ex situ microFTIR and microRaman spectroscopic measurements. Our results yield evidence that the T–T and T–O (T = Si,Al) interatomic distances of ultrabasic melts are higher than those for basaltic melts known from similar recent studies. Based on our experimental data, melilititic melts are expected to migrate at a rate ~from 2 to 57 km·yr−1 in the present-day or the Archaean mantle, respectively.

scholarly journals Titanium Silicide Formation in Presence of Oxygen

1992 ◽  
Vol 15 (1) ◽  
pp. 9-26 ◽  
Author(s):  
C. Nobili ◽  
F. Nava ◽  
G. Ottaviani ◽  
M. Costato ◽  
G. De Santi ◽  
...  
Keyword(s):  
Electron Spectroscopy ◽  
Rutherford Backscattering Spectrometry ◽  
Titanium Silicide ◽  
Silicide Formation ◽  
Metal Oxidation ◽  
X Ray Diffraction ◽  
Amorphous Films ◽  
Titanium Disilicide ◽  
X Ray

In-situ resistivity vs. temperature, Rutherford backscattering spectrometry, Auger electron spectroscopy and X-ray diffraction measurements have been performed in order to study the effects arising from the presence of oxygen in the annealing ambient on the integrity of amorphous films of TiSix, with x ranging from 1.45 to 2.1. Crystalisation occurs around 400 C. The presence of oxygen produces the formation of silicon and titanium oxide around 500 C. Critical analysis of the experimental results have indicated that metal oxidation is inhibited when an excess of silicon is present, which suggests the use of a sputtered Si coating cap as a medium capable of effectively decoupling the silicide film from oxygen. This avoids unwanted Ti oxidation even in heavily oxygen contaminated ambients up to the highest temperatures used for the formation of low resistivity titanium disilicide.

In Situ Laser Light Scattering: II . Relationship to Silicon Surface Topography

1989 ◽  
Vol 136 (10) ◽  
pp. 3088-3094 ◽  
Author(s):  
A. J. Pidduck ◽  
D. J. Robbins ◽  
D. B. Gasson ◽  
C. Pickering ◽  
J. L. Glasper
Keyword(s):  
Light Scattering ◽  
Surface Topography ◽  
Silicon Surface ◽  
Laser Light ◽  
Laser Light Scattering

PHASE FORMATION AND TEXTURE DEVELOPMENT IN AG-SHEATHED Bi, Pb(2223) TAPES STUDIED BY DIFFERENT IN-SITU AND EX-SITU DIFFRACTION TECHNIQUES

2000 ◽  
Vol 14 (25n27) ◽  
pp. 2688-2693 ◽  
Author(s):  
E. GIANNINI ◽  
E. BELLINGERI ◽  
F. MARTI ◽  
M. DHALLÉ ◽  
V. HONKIMÄKI ◽  
...  
Keyword(s):  
High Energy ◽  
Texture Development ◽  
Ex Situ ◽  
X Ray Diffraction ◽  
X Ray ◽  
Scattering Geometry ◽  
Reflection Geometry ◽  
Comparison Of The Results ◽  
In Situ Neutron Diffraction

In-situ and ex-situ high energy (80÷88 keV) X-Ray diffraction from a synchrotron radiation source were performed on multifilamentary Bi, Pb(2223)/Ag tapes using a transmission scattering geometry. Several thermo-mechanical procedures were compared, focusing mainly on the texture development of both Bi, Pb(2212) and Bi, Pb(2223) phases. The effect of the periodic pressing on the texture and on the critical current is elucidated. The texture development of the Bi, Pb(2212) phase prior to its transformation into Bi, Pb(2223) was directly observed in-situ at high temperature by using a dedicated high-energy X-ray compatible furnace and a high resolution Image Plate detector. A sharp increase of the Bi, Pb(2212) grain orientation along the [00l] direction was found to occur only above 750°C. Normal state transport measurements are in full agreement with the formation mechanism and with the texture development observed. A comparison of the results with the ones provided by in-situ neutron diffraction and standard low-energy XRD in a reflection geometry is presented.

A Combined Experimental and Theoretical Study of Lithiation Mechanism in ZnFe2O4 Anode Materials

MRS Advances ◽  
2018 ◽  
Vol 3 (14) ◽  
pp. 773-778 ◽  
Author(s):  
Lei Wang ◽  
Alison McCarthy ◽  
Kenneth J. Takeuchi ◽  
Esther S. Takeuchi ◽  
Amy C. Marschilok
Keyword(s):  
Early Stage ◽  
Deep Understanding ◽  
Lithium Ion ◽  
Oxidation Products ◽  
Ex Situ ◽  
Theoretical Modelling ◽  
X Ray Diffraction ◽  
X Ray ◽  
X Ray Absorption

ABSTRACTZnFe2O4 (ZFO) represents a promising anode material for lithium ion batteries, but there is still a lack of deep understanding of the fundamental reduction mechanism associated with this material. In this paper, the complete visualization of reduction/oxidation products irrespective of their crystallinity was achieved experimentally through a compilation of in situ X-ray diffraction, synchrotron based powder diffraction, and ex-situ X-ray absorption fine structure data. Complementary theoretical modelling study further shed light upon the fundamental understanding of the lithiation mechanism, especially at the early stage from ZnFe2O4 up to LixZnFe2O4 (x = 2).

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