Cathodoluminescence Study of Diffusion Length and surface Recombination Velocity in III-V Multiple Quantum Well Structures
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AbstractWe describe studies of luminescence and lateral transport properties of excited carriers in GaAs- AIGaAs multiple quantum well (MQW) structures by cathodoluminescence measurements in a scanning electron microscope. We examine the effect of in-plane, etch-defined feature size on MQW luminescence efficiency and variability, and determine the diffusion length and its temperature dependence from ˜ 8K to 250K. Our measurements also provide information about nonradiative surface recombination velocity at the side walls of etch-defined MQW structures.
1987 ◽
Vol 48
(C5)
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pp. C5-457-C5-461
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2017 ◽
Vol 17
(3)
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pp. 398-402
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