X-Ray Residual Stress Measurement in Films with Crystallographic Texture and Grain Shape
Keyword(s):
X Ray
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AbstractX-ray diffraction provides an easy and powerful method for measuring residual stress in thin films. However, nonlinearity of the d vs. sin2ψ relation can lead to the misinterpretation of results, especially when one of the measurements is made at low values of ψ relation for different combinations of ideal crystallographic textures and grain shapes are given. In all cases, a high ψ angle range exists where the d vs. sin2ψ relation in the low ψ angle range.
2019 ◽
Vol 96
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pp. 525-529
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Keyword(s):
2018 ◽
Vol 47
(11)
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pp. 6641-6648
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1985 ◽
Vol 107
(2)
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pp. 185-191
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2009 ◽
Vol 2009.46
(0)
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pp. 385-386
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2014 ◽
Vol 63
(5)
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pp. 409-416
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