Growth of Transition Metal Films on AL(110) Surfaces

1995 ◽  
Vol 399 ◽  
Author(s):  
R.J. Smith ◽  
Adli A. Saleh ◽  
V. Shutthanandan ◽  
N.R. Shivaparan ◽  
V. Krasemann
Keyword(s):  
High Energy ◽  
Metal Films ◽  
Surface Strain ◽  
The Other ◽  
Photoemission Spectroscopy ◽  
Alloy Formation ◽  
Ion Scattering ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Ti Films

ABSTRACTThe growth of thin Pd, Ni, Fe and Ti films on Al(110) surfaces has been studied using high-energy ion scattering (HEIS), x-ray photoemission spectroscopy and photoelectron diffraction techniques. Of these four metals, only Ti grows as an epitaxial overlayer, while the other metals mix with the substrate to form surface alloys. In the HEIS experiments the backscattered ion yield from Al surface atoms is measured as a function of metal coverage on the Al surface. A decrease in the Al scattering is observed for Ti deposition while the other metals result in increased Al scattering, attributed to alloy formation. An explanation for the exceptional growth behavior of Ti on Al is provided using a model of surface strain associated with aluminide formation.

GROWTH AND STRUCTURE OF hcp Ti FILMS ON Al(111) SURFACES

1999 ◽  
Vol 06 (05) ◽  
pp. 775-780 ◽  
Author(s):  
Y. W. KIM ◽  
G. A. WHITE ◽  
N. R. SHIVAPARAN ◽  
M. A. TETER ◽  
R. J. SMITH
Keyword(s):  
Photoelectron Spectroscopy ◽  
Film Growth ◽  
Three Dimensional ◽  
High Energy ◽  
Low Energy ◽  
Ion Scattering ◽  
Island Growth ◽  
X Ray ◽  
Low Energy Ion Scattering ◽  
Ti Films

The structure of thin Ti films grown on Al(111) surfaces at room temperature has been studied using high energy ion scattering/channeling (HEIS), X-ray photoelectron spectroscopy (XPS), low energy ion scattering (LEIS), low energy electron diffraction (LEED) and X-ray photoelectron diffraction (XPD). Our results show that Ti grows in the SK mode on the Al(111) surface. Ti atoms form a two-dimensional overlayer up to a deposition of about 2 ML Ti, followed by three-dimensional island growth with additional Ti deposition. The Ti islands cover the surface completely at about 12 ML of Ti deposition. XPD results show that the Ti overlayer has a well-ordered hcp Ti(0001) structure on the fcc Al(111) surface, in remarkable contrast to the fcc Ti film growth observed on Al(001) and Al(110) surfaces.

Ultrahigh‐vacuum system for surface studies using high‐energy ion scattering and x‐ray photoemission spectroscopy

1987 ◽  
Vol 58 (12) ◽  
pp. 2284-2287 ◽  
Author(s):  
R. J. Smith ◽  
C. N. Whang ◽  
Xu Mingde ◽  
M. Worthington ◽  
C. Hennessy ◽  
...  
Keyword(s):  
Ultrahigh Vacuum ◽  
High Energy ◽  
Vacuum System ◽  
Photoemission Spectroscopy ◽  
Ion Scattering ◽  
Surface Studies ◽  
X Ray

The X-Ray Spectrum of Sco XR-1 to 100 keV

1968 ◽  
Vol 1 (4) ◽  
pp. 169-171
Author(s):  
P. J. N. Davison
Keyword(s):  
High Energy ◽  
The Other ◽  
Balloon Flight ◽  
X Ray

This paper presents the results of a measurement of the high-energy (E ≥ 17 keV) X-ray flux from Sco XR-1 extending to higher energies than has previously been reported. The measurement was made during a balloon flight launched from Mildura, Australia, on 29 February 1968. The X-ray observatory contained two independent X-ray detectors, one being similar in principle to the active collimator detector pioneered by Peterson et al., the other being basically similar to the graded shield detector developed by Boldt et al. Our two detecting systems are described in more detail by Buselli et al. and also in previous papers of this conference.

scholarly journals High-Energy X-Ray Compton Scattering Imaging of 18650-Type Lithium-Ion Battery Cell

2019 ◽  
Vol 4 (3) ◽  
pp. 66 ◽  
Author(s):  
Kosuke Suzuki ◽  
Ari-Pekka Honkanen ◽  
Naruki Tsuji ◽  
Kirsi Jalkanen ◽  
Jari Koskinen ◽  
...  
Keyword(s):  
Energy Spectrum ◽  
Lithium Ion Battery ◽  
Compton Scattering ◽  
Present Method ◽  
Large Scale ◽  
Lithium Ion ◽  
High Energy ◽  
The Other ◽  
Battery Cell ◽  
X Ray

High-energy synchrotron X-ray Compton scattering imaging was applied to a commercial 18650-type cell, which is a cylindrical lithium-ion battery in wide current use. By measuring the Compton scattering X-ray energy spectrum non-destructively, the lithiation state in both fresh and aged cells was obtained from two different regions of the cell, one near the outer casing and the other near the center of the cell. Our technique has the advantage that it can reveal the lithiation state with a micron-scale spatial resolution even in large cells. The present method enables us to monitor the operation of large-scale cells and can thus accelerate the development of advanced lithium-ion batteries.

High-energy x-ray-excited valence-electron photoemission spectroscopy ofC2H2andC2D2

1988 ◽  
Vol 37 (12) ◽  
pp. 4730-4733 ◽  
Author(s):  
S. Svensson ◽  
E. Zdansky ◽  
U. Gelius ◽  
H. Ågren
Keyword(s):  
Valence Electron ◽  
High Energy ◽  
Photoemission Spectroscopy ◽  
X Ray ◽  
Electron Photoemission

SUPERSTRUCTURE FORMATION AND X-RAY PHOTOEMISSION PROPERTIES OF THE TlTiOPO4 SURFACE

2004 ◽  
Vol 11 (02) ◽  
pp. 191-198 ◽  
Author(s):  
V. V. ATUCHIN ◽  
L. D. POKROVSKY ◽  
V. G. KESLER ◽  
N. YU. MAKLAKOVA ◽  
V. I. VORONKOVA ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Binding Energy ◽  
Electron Diffraction ◽  
Band Structure ◽  
High Energy ◽  
Photoemission Spectroscopy ◽  
High Energy Electron ◽  
Valence Band Structure ◽  
X Ray ◽  
Core Level Binding Energy

X-ray photoemission spectroscopy (XPS) measurements have been executed for TlTiOPO 4 to elucidate the general features in the electronic structure of the KTiOPO 4 family compounds. The peculiarities of the valence band structure have been discussed for the crystals. The persistence of core level binding energy differences O 1s–P 2p and O 1s–Ti 2p 3/2 has been detected in TlTiOPO 4 and KTiOPO 4, which relates well with the constancy of averaged P – O and Ti – O chemical bond lengths in this crystal family. The superstructure ordering of the TlTiOPO 4 surface subjected to polishing and annealing has been detected by reflectance high energy electron diffraction (RHEED). From comparison of surface crystallographic properties of TlTiOPO 4 and KTiOPO 4, the most typical superstructure indices have been revealed.

The Hard X-ray Photoemission Spectroscopy Facility at CLS: performance and first results

2015 ◽  
Vol 93 (1) ◽  
pp. 113-117 ◽  
Author(s):  
Qunfeng Xiao ◽  
Xiaoyu Cui ◽  
Yinbo Shi ◽  
Yongfeng Hu ◽  
Tsun-Kong Sham ◽  
...  
Keyword(s):  
High Energy ◽  
Photoemission Spectroscopy ◽  
Nondestructive Technique ◽  
Bulk Properties ◽  
X Ray ◽  
Probing Depth ◽  
First Results ◽  
Energy Version ◽  
Properties Of Materials ◽  
X Ray Absorption

Photoemission spectroscopy (PES) has been used widely to study the electronic structure of valence and core levels. However, conventional PES is surface-sensitive. To probe the interface and bulk properties of materials, hard X-ray photoemission spectroscopy (HXPES) has received increasing interest in the last decade, because of the deep probing ability of photoelectrons with higher kinetic energies (2–10 keV). Recently, a HXPES system was developed at the Canadian Light Source, using the high-energy version of a R4000 electron analyzer-based spectrometer connected to a medium-energy beamline, the soft X-ray microcharacterization beamline (SXRMB). Excellent performance of the beamline and the spectrometer is demonstrated herein using Au Fermi and 4f core lines; and the controlled probing depth of HXPES at SXRMB is demonstrated by tuning the photon energy (2–9 keV) in the study of a series of SiO2/SiC multilayer samples. Combined with the high-resolution X-ray absorption spectroscopy available at the SXRMB, the HXPES offers a powerful nondestructive technique for studying bulk properties of various materials.

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