Thin Film Epitaxial Oxide Optical Waveguides

1995 ◽  
Vol 392 ◽  
Author(s):  
D. K. Fork ◽  
F. Armani-Leplingard ◽  
J. J. Kingston ◽  
G. B. Anderson
Keyword(s):  
Thin Film ◽  
Optical Waveguides ◽  
Computational Models ◽  
Comparative Anatomy ◽  
Residual Effects ◽  
Light Sources ◽  
Optical Losses ◽  
Rapid Improvement ◽  
Waveguide Loss ◽  
Epitaxial Oxide

AbstractOne of the most challenging applications of ferroelectric thin films is the formation of technologically practical optical waveguideing devices, particularly in the context of a dynamically changing environment where competing light sources and optical materials simultaneously undergo rapid improvement. In order to assess the prospects of this technology, a fundamental understanding of waveguide loss is being pieced together. This includes the relative contributions of surface scattering, and grain boundary scattering to optical losses. With computational models, it is possible to predict the surface losses from measured topographic data. This tool provides a method to probe the residual effects of grain boundaries, defects and impurities on optical losses. A comparative anatomy of various thin film structures and their loss characteristics will be provided in the context of these experiments.

scholarly journals Investigation of Side Wall Roughness Effect on Optical Losses in a Multimode Si3N4 Waveguide Formed on a Quartz Substrate

Photonics ◽  
2020 ◽  
Vol 7 (4) ◽  
pp. 104
Author(s):  
Anastasia Yakuhina ◽  
Alexey Kadochkin ◽  
Vyacheslav Svetukhin ◽  
Dmitry Gorelov ◽  
Sergey Generalov ◽  
...  
Keyword(s):  
Optical Waveguides ◽  
Quartz Substrate ◽  
Side Wall ◽  
Wall Roughness ◽  
Roughness Parameters ◽  
Optical Losses ◽  
Waveguide Width ◽  
Integration Density ◽  
Frequency Domain Reflectometry ◽  
Multimode Operation

This article presents the results of the study of the influence of the most significant parameters of the side wall roughness of an ultra-thin silicon nitride lightguide layer of multimode integrated optical waveguides with widths of 3 and 8 microns. The choice of the waveguide width was made due to the need to provide multimode operation for telecommunication wavelengths, which is necessary to ensure high integration density. Scattering in waveguide structures was measured by optical frequency domain reflectometry (OFDR) of a backscattering reflectometer. The finite difference time domain method (FDTD) was used to study the effect of roughness parameters on optical losses in fabricated waveguides, the roughness parameters that most strongly affect optical scattering were determined, and methods of its significant reduction were specified. The prospects for implementing such structures on a quartz substrate are justified.

Cerium dioxide thin film optical waveguides

1992 ◽  
Vol 24 (5) ◽  
pp. 263-266 ◽  
Author(s):  
P.F. Wahid ◽  
K.B. Sundaram ◽  
P.J. Sisk
Keyword(s):  
Thin Film ◽  
Optical Waveguides ◽  
Cerium Dioxide

Polyaniline thin film optical waveguides for integrated optics and VLSI prepared by vacuum evaporation technique

2002 ◽  
Vol 13 (6) ◽  
pp. 475-480 ◽  
Author(s):  
R. P. Sharma ◽  
M. S. Raghuvanshi ◽  
S. V. Bhavsar ◽  
A. R. Patil ◽  
S. C. K. Misra
Keyword(s):  
Thin Film ◽  
Integrated Optics ◽  
Optical Waveguides ◽  
Vacuum Evaporation ◽  
Evaporation Technique ◽  
Vacuum Evaporation Technique

scholarly journals Photoluminescence Imaging for the In-Line Quality Control of Thin-Film Solar Cells

Solar ◽  
2022 ◽  
Vol 2 (1) ◽  
pp. 1-11
Author(s):  
Johanna Zikulnig ◽  
Wolfgang Mühleisen ◽  
Pieter Jan Bolt ◽  
Marcel Simor ◽  
Martin De Biasio
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Renewable Energy Sources ◽  
Light Sources ◽  
Excitation Light ◽  
Line Process ◽  
Product Flexibility ◽  
Cost Efficient ◽  
Climate Neutrality ◽  
Contact Free

Renewable energy sources such as photovoltaic (PV) technologies are considered to be key drivers towards climate neutrality. Thin-film PVs, and particularly copper indium gallium selenide (CIGS) technologies, will play a crucial role in the turnaround in energy policy due to their high efficiencies, high product flexibility, light weight, easy installation, lower labour-intensiveness, and lower carbon footprint when compared to silicon solar cells. Nonetheless, challenges regarding the CIGS fabrication process such as moderate reproducibility and process tolerance are still hindering a broad market penetration. Therefore, cost-efficient and easily implementable in-line process control methods are demanded that allow for identification and elimination of non-conformal cells at an early production step. As part of this work, a practical approach towards industrial in-line photoluminescence (PL) imaging as a contact-free quality inspection tool is presented. Performance parameters of 10 CIGS samples with 32 individually contacted cells each were correlated with results from PL imaging using green and red excitation light sources. The data analysis was fully automated using Python-based image processing, object detection, and non-linear regression modelling. Using the red excitation light source, the presented PL imaging and data processing approach allows for a quantitative assessment of the cell performance.

Polyalkylsilyne photodefined thin-film optical waveguides

1990 ◽  
Vol 67 (5) ◽  
pp. 2235-2239 ◽  
Author(s):  
L. A. Hornak ◽  
T. W. Weidman ◽  
E. W. Kwock
Keyword(s):  
Thin Film ◽  
Optical Waveguides

scholarly journals Optical Losses in Hybrid Microcavity Based in Porous Semiconductors and its Application as Optic Chemical Sensor

2019 ◽  
Vol 56 ◽  
pp. 158-167
Author(s):  
Claudia Antonio Hernández ◽  
Edith Osorio ◽  
Raúl Urteaga ◽  
Roberto Koropecki ◽  
José Alberto Alvarado ◽  
...  
Keyword(s):  
Chemical Sensor ◽  
Visible Region ◽  
Bragg Reflector ◽  
Resonant Peak ◽  
Light Sources ◽  
Optical Losses ◽  
Distributed Bragg Reflector ◽  
Nanoporous Anodic Alumina ◽  
Porous Semiconductors ◽  
Point Light

In this study the experimental and theoretical optical analysis of a hybrid microcavity (HM) based in porous silicon (PS) and nanoporous anodic alumina (NAA) are presented. The microcavity was centered in the visible region at 760 nm. Distributed Bragg reflector (DBR) was obtained using galvanostatic anodizing method and while NAA by the two-step anodization technique. From SEM micrographs the HM different regions are observed. HM optical characterization in the visible region was done, considering two different light sources, point and non-point respectively. These results reveal a decrease in the quality factor (Q) from 350 to 190 when the source is exchanged; this behavior has been mainly attributed to the light scattering at NAA. Furthermore, it was possible to study Q change, through transmittance simulation using the transfer matrix and Landau-Lifshitz-Looyenga theoretical methods. When a point light source is used, there are no optical losses making possible to sense 1% of analyte resulting in a 0.29 nm redshift of the resonant peak. According with these results we propose to apply the HM as chemical optic sensor.

Low-gravity factor in fabrication of thin film nonlinear optical waveguides based on photocrosslinkable polyimide

1996 ◽  
Author(s):  
Sergey S. Sarkisov ◽  
Zedric A. Teague ◽  
Putcha Venkateswarlu ◽  
Hossin A. Abdeldayem ◽  
Donald O. Frazier ◽  
...  
Keyword(s):  
Thin Film ◽  
Optical Waveguides ◽  
Nonlinear Optical ◽  
Low Gravity
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