Effect of Magnetic CoZrNb Seed Layers on Pd/Co Multilayers

1995 ◽  
Vol 382 ◽  
Author(s):  
Jonathan C. Morris ◽  
Wenhong Liu ◽  
Bruce M. Lairson
Keyword(s):  
Multilayer Film ◽  
Hysteresis Loops ◽  
Grain Structure ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Cross Sectional ◽  
Rocking Curve ◽  
Transmission Electron ◽  
Columnar Grain ◽  
Seed Layers

ABSTRACTPd/Co multilayers are candidates as perpendicular magnetic recording media. A softmagnetic underlayer can both improve crystallographic orientation and reduce the magnetostatic energy of recorded domains. Pd/Co multilayers have been deposited onto silicon nitride by DC magnetron sputtering with and without CoZrNb (CZN) seed layers. Cross-sectional transmission electron microscopy shows that the CZN layer imposes a columnar grain structure on the multilayer film through epitaxy. Seeded multilayers have columnar 200Å grains that begin at the CZN interface and extend through the film thickness. In contrast, the grains in unseeded multilayers are not columnar. X-ray rocking curves on the (111) Pd/Co peak show that the CZN seed layer improves the (111) crystallographic texture of the multilayer film. We observe a correspondence between FWHM rocking curve widths in the CZN and the subsequently deposited multilayer. The CZN seeding produces changes in perpendicular hysteresis loops, which are attributed to an exchange interaction and a change in the multilayer amicrostructure due to seeding.

Structural Investigation of Iron Particles Used for Magnetic Recording Media

1980 ◽  
Vol 38 ◽  
pp. 406-407
Author(s):  
Alfred Baltz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Structural Investigation ◽  
Magnetic Interaction ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Recording Medium ◽  
Iron Particles ◽  
Transmission Electron

As part of a program to develop iron particles for next generation recording disk medium, their structural properties were investigated using transmission electron microscopy and electron diffraction. Iron particles are a more desirable recording medium than iron oxide, the most widely used material in disk manufacturing, because they offer a higher magnetic output and a higher coercive force. The particles were prepared by a method described elsewhere. Because of their strong magnetic interaction, a method had to be developed to separate the particles on the electron microscope grids.

Development of CoX/Pd multilayer perpendicular magnetic recording media with granular seed layers

2002 ◽  
Vol 242-245 ◽  
pp. 297-303 ◽  
Author(s):  
Yukiko Kubota ◽  
Dieter Weller ◽  
Mei-Ling Wu ◽  
Xiaowei Wu ◽  
Ganping Ju ◽  
...  
Keyword(s):  
Magnetic Recording ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Perpendicular Magnetic Recording ◽  
Seed Layers

Quantitative Measurements of Segregation In Co-Cr-X Magnetic Recording Media by Energy-Filtered Transmission Electron Microscopy

1998 ◽  
Vol 517 ◽  
Author(s):  
J. Bentley ◽  
J.E. Wittig ◽  
T.P. Nolan
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Recording ◽  
Core Loss ◽  
Specimen Thickness ◽  
Recording Media ◽  
Magnetic Recording Media ◽  
Quantitative Measurements ◽  
Transmission Electron ◽  
Random Angle

AbstractReliable core-loss spectroscopic methods have been developed for mapping elemental segregation in Co-Cr-X magnetic recording media by energy-filtered transmission electron microscopy. Extraction of quantitative compositions at a spatial resolution approaching 1 nm involves sophisticated treatments for diffraction contrast, variations in specimen thickness, and closely-spaced oxygen K and chromium L23 ionization edges. These methods reveal that intergranular chromium levels are ∼25 at.% for random-angle boundaries and ∼15 at.% for 90° boundaries in films of Co84Cr12Ta4 d.c. magnetron sputtered at 250°C.

The effect of substrate bias on the characteristics of CrN coatings deposited by DC-superimposed HiPIMS system

2017 ◽  
Vol 31 (16-19) ◽  
pp. 1744032 ◽  
Author(s):  
X. Zuo ◽  
F. Xia ◽  
D. Zhang ◽  
P. L. Ke ◽  
Q. M. Wang ◽  
...  
Keyword(s):  
Mechanical Properties ◽  
Bias Voltage ◽  
Indentation Test ◽  
Grain Structure ◽  
Substrate Bias ◽  
Cross Sectional ◽  
Microstructure And Mechanical Properties ◽  
Columnar Grain ◽  
Influence Of Substrate ◽  
Crn Coatings

Chromium nitride coatings were prepared by reactive DC-superimposed high-power-impulse magnetron sputtering (HiPIMS) system. The influence of substrate bias on the microstructure and mechanical properties of CrN coatings was investigated. XRD and cross-sectional SEM were utilized to characterize the film structures. Mechanical properties were characterized by nanoindentation and Vickers indentation test. The results revealed that the microstructure and mechanical properties of CrN coatings were affected by bias voltage. The CrN coatings exhibited dense and fine columnar grain structure with the hardness of about 18.7 GPa. The fracture toughness of CrN coatings was around 3.16 MPa ⋅ m[Formula: see text]. However, further increase of the bias voltage from −250 V to −300 V led to the degradation of coating properties.

High quality a-Si/Nb and a-SiN/NbN artificial multilayers for Josephson applications

1994 ◽  
Vol 9 (7) ◽  
pp. 1678-1682 ◽  
Author(s):  
J. Chen ◽  
E.D. Rippert ◽  
S.N. Song ◽  
M.P. Ulmer ◽  
J.B. Ketterson
Keyword(s):  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Layer Growth ◽  
Interface Condition ◽  
Grain Structure ◽  
Transmission Electron Microscopy Study ◽  
High Quality ◽  
Columnar Growth ◽  
Transmission Electron ◽  
Columnar Grain

A high resolution transmission electron microscopy study of multilayer films prepared by magnetron sputtering shows that the morphology of the growing interface in a-Si/Nb and a-SiN/NbN multilayers is remarkably uniform and smooth; this is in contrast to the polycrystalline AlN/NbN multilayers grown under similar conditions, which exhibit columnar grain structure with rough interfaces. For proper sputtering parameters, the amorphous layers seem to periodically restore a relatively smooth initial interface condition for the successive Nb (or NbN) layer growth, consequently interrupting the tendency toward increased roughness due to mechanisms such as columnar growth. Artificial multilayers having very flat interfaces could stimulate applications based on multilayer Josephson junctions.

Mechanisms of Initialization of Doped Sb-Te Phase-Change Media

2003 ◽  
Vol 803 ◽  
Author(s):  
Samantha J. Towlson ◽  
Clifford A. Elwell ◽  
Clare E. Davies ◽  
A. Lindsay Greer
Keyword(s):  
High Strain ◽  
Optical Recording ◽  
Grain Structure ◽  
Beam Power ◽  
Low Velocity ◽  
X Ray ◽  
Inhomogeneous Strain ◽  
Peak Broadening ◽  
Transmission Electron ◽  
Columnar Grain

ABSTRACTLaser initialization of the chalcogenide optical-recording medium Ag-In-Sb-Te is investigated using transmission electron microscopy of the resulting microstructure. Initialization beam power and velocity are varied. The average inhomogeneous strain of the chalcogenide is estimated from X-ray peak broadening. At high power and low velocity a clearly defined columnar grain structure with low strain is produced, typical of directional solidification. At low power and high velocity the initialized structure has a high density of defects and high strain; this is attributed to crystallization from the amorphous rather than the liquid state. The beam power and linear velocity of laser initialization may therefore be used to control the microstructure.

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