Scanning Transmission Electron Microscopy Analysis of Grain Structure in Perpendicular Magnetic Recording Media

Faraz Hossein-Babaei; Robert Sinclair; Kumar Srinivasan; Gerardo A. Bertero

doi:10.1021/nl203243e

Scanning Transmission Electron Microscopy Analysis of Grain Structure in Perpendicular Magnetic Recording Media

Nano Letters ◽

10.1021/nl203243e ◽

2011 ◽

Vol 11 (10) ◽

pp. 4504-4504

Author(s):

Faraz Hossein-Babaei ◽

Robert Sinclair ◽

Kumar Srinivasan ◽

Gerardo A. Bertero

Keyword(s):

Scanning Transmission Electron Microscopy ◽

Grain Structure ◽

Recording Media ◽

Magnetic Recording Media ◽

Transmission Electron Microscopy Analysis ◽

Perpendicular Magnetic Recording ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Scanning Transmission Electron Microscopy Analysis of Grain Structure in Perpendicular Magnetic Recording Media

Nano Letters ◽

10.1021/nl201784z ◽

2011 ◽

Vol 11 (9) ◽

pp. 3751-3754 ◽

Cited By ~ 7

Author(s):

Faraz Hossein-Babaei ◽

Robert A. Sinclair ◽

Kumar Srinivasan ◽

Gerardo A. Bertero

Keyword(s):

Scanning Transmission Electron Microscopy ◽

Grain Structure ◽

Recording Media ◽

Magnetic Recording Media ◽

Transmission Electron Microscopy Analysis ◽

Perpendicular Magnetic Recording ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Scanning Transmission Electron Microscopy Analysis of Grain Boundaries in Creep-Resistant Yttrium- and Lanthanum-Doped Alumina Microstructures

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.1999.tb02169.x ◽

2004 ◽

Vol 82 (10) ◽

pp. 2865-2870 ◽

Cited By ~ 33

Author(s):

John Bruley ◽

Junghyun Cho ◽

Helen M. Chan ◽

Martin P. Harmer ◽

Jeffrey M. Rickman

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Grain Boundaries ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Analysis ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Scanning transmission electron microscopy analysis of substrate/coating interfacial regions on AA2024-T3 after blister formation

Surface and Coatings Technology ◽

10.1016/j.surfcoat.2015.09.032 ◽

2015 ◽

Vol 281 ◽

pp. 51-61

Author(s):

Kerrie Holguin ◽

F. Scheltens ◽

G.S. Frankel

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Analysis ◽

Blister Formation ◽

Scanning Transmission Electron ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Quantitative transmission electron microscopy analysis of multi-variant grains in present L10-FePt based heat assisted magnetic recording media

Journal of Applied Physics ◽

10.1063/1.4902082 ◽

2014 ◽

Vol 116 (19) ◽

pp. 193510 ◽

Cited By ~ 27

Author(s):

Hoan Ho ◽

Jingxi Zhu ◽

Andreas Kulovits ◽

David E. Laughlin ◽

Jian-Gang Zhu

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Magnetic Recording ◽

Recording Media ◽

Magnetic Recording Media ◽

Transmission Electron Microscopy Analysis ◽

Heat Assisted Magnetic Recording ◽

Transmission Electron ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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STEM (scanning transmission electron microscopy) analysis of femtosecond laser pulse induced damage to bulk silicon

Applied Physics A ◽

10.1007/s00339-004-2605-2 ◽

2005 ◽

Vol 81 (2) ◽

pp. 371-378 ◽

Cited By ~ 33

Author(s):

E. Coyne ◽

J.P. Magee ◽

P. Mannion ◽

G.M. O’Connor ◽

T.J. Glynn

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Laser Pulse ◽

Scanning Transmission Electron Microscopy ◽

Bulk Silicon ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Atomic-column scanning transmission electron microscopy analysis of misfit dislocations in GaSb/GaAs quantum dots

Journal of Materials Science ◽

10.1007/s10853-016-0051-0 ◽

2016 ◽

Vol 51 (16) ◽

pp. 7691-7698 ◽

Cited By ~ 6

Author(s):

N. Fernández-Delgado ◽

M. Herrera ◽

M. F. Chisholm ◽

M. A. Kamarudin ◽

Q. D. Zhuang ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Misfit Dislocations ◽

Atomic Column ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Scanning transmission electron microscopy analysis of Ge(O)/(graphitic carbon nitride) nanocomposite powder

Materials Characterization ◽

10.1016/j.matchar.2015.10.015 ◽

2015 ◽

Vol 110 ◽

pp. 60-67 ◽

Cited By ~ 1

Author(s):

Masahiro Kawasaki ◽

Kanganit Sompetch ◽

Thapanee Sarakonsri ◽

Makoto Shiojiri

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Carbon Nitride ◽

Nanocomposite Powder ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Mass and molecular composition of vesicular stomatitis virus: a scanning transmission electron microscopy analysis.

Journal of Virology ◽

10.1128/jvi.54.2.598-607.1985 ◽

1985 ◽

Vol 54 (2) ◽

pp. 598-607 ◽

Cited By ~ 113

Author(s):

D Thomas ◽

W W Newcomb ◽

J C Brown ◽

J S Wall ◽

J F Hainfeld ◽

...

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Vesicular Stomatitis Virus ◽

Scanning Transmission Electron Microscopy ◽

Transmission Electron Microscopy Analysis ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis ◽

Vesicular Stomatitis

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Bacteriophage PRD1 Proteins: Cross-Linking and Scanning Transmission Electron Microscopy Analysis

Virology ◽

10.1006/viro.1993.1296 ◽

1993 ◽

Vol 194 (2) ◽

pp. 570-575 ◽

Cited By ~ 7

Author(s):

Cheng Luo ◽

Jarkko Hantula ◽

Willem Tichelaar ◽

Dennis H. Bamford

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Cross Linking ◽

Transmission Electron Microscopy Analysis ◽

Bacteriophage Prd1 ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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Reaction-Layer Interfaces in SiC-Fiber-Reinforced Glass-Ceramics: A High-Resolution Scanning Transmission Electron Microscopy Analysis

Journal of the American Ceramic Society ◽

10.1111/j.1151-2916.1990.tb06694.x ◽

1990 ◽

Vol 73 (10) ◽

pp. 2916-2921 ◽

Cited By ~ 67

Author(s):

Laura A. Bonney ◽

Reid F. Cooper

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Scanning Transmission Electron Microscopy ◽

Glass Ceramics ◽

Transmission Electron Microscopy Analysis ◽

Sic Fiber ◽

Transmission Electron ◽

Scanning Transmission ◽

Electron Microscopy Analysis ◽

Microscopy Analysis

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