Density Changes in Amorphous Pd80Si20 During Low Temperature ion Irradiation
AbstractDensity changes in amorphous Pd80Si20 during ion irradiation below 100K were detected by in situ HVEM measurements of the changes in specimen length as a function of ion fluence. A decrease in mass density as a function of the ion fluence was observed. The saturation value of the change in mass density was determined to be approximately -1.2 %.
2001 ◽
Vol 16
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pp. 2788-2792
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1999 ◽
Vol 148
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pp. 901-906
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1975 ◽
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pp. 58-59
1988 ◽
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1989 ◽
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