Imaging Single Nacreous Tablets with the Atomic Force Microscope

1994 ◽  
Vol 332 ◽  
Author(s):  
R. Giles ◽  
S. Manne ◽  
C.M. Zaremba ◽  
A. Belcher ◽  
S. Mann ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Sea Water ◽  
Three Dimensional ◽  
Force Microscopy ◽  
Topographic Features ◽  
Atomic Force ◽  
Recent Developments ◽  
Growth Experiments ◽  
Dimensional Picture

ABSTRACTAfter describing some recent developments in atomic force microscopy (AFM), a specific application to the study of shell ultrastructure is examined in detail. By embedding bleached nacreous tablets in epoxy and imaging them with the atomic force microscope (AFM) during in situ dissolution, it was possible to visualize the topography of both the top faces of the tablets and the impressions in epoxy made by the bottom faces of the tablets. This epoxy imprint reproduced tablet features down to the 10 nm scale. Using this technique it should be possible to measure correspondence between topographic features on the proximal and distal faces of tablets, which is necessary to form a three-dimensional picture of the nacreous region. In addition to these dissolution experiments, growth experiments (in modified sea water) on bleached, embedded tablets indicated that aragonite grows on a tablet as asperities oriented along the c axis, normal to the tablet surface. No change was seen on the surface of the epoxy, which confirmed that the crystals were growing on the tablet surface, not spontaneously nucleating out of solution.

Investigation of Fiber Wear in a Woven Composite Using Atomic Force Microscopy

2010 ◽  
Author(s):  
Michael Giordano ◽  
Steven Schmid
Keyword(s):  
Mechanical Properties ◽  
Atomic Force Microscopy ◽  
Abrasive Wear ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Woven Composite ◽  
Wear Performance ◽  
Force Microscopy ◽  
Atomic Force ◽  
Natural Tissue

A number of cartilage replacement materials have been suggested including woven materials because of their similar mechanical properties compared to natural tissue [1]. However, the wear performance of woven materials has not been optimized, nor systematically analyzed to date. This paper focuses upon fiber-fiber interactions within a three-dimensional woven material using an atomic force microscope (AFM) to directly simulate abrasive wear events.

scholarly journals Tipping solutions: emerging 3D nano-fabrication/ -imaging technologies

Nanophotonics ◽  
2017 ◽  
Vol 6 (5) ◽  
pp. 923-941 ◽  
Author(s):  
Gediminas Seniutinas ◽  
Armandas Balčytis ◽  
Ignas Reklaitis ◽  
Feng Chen ◽  
Jeffrey Davis ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Imaging Technique ◽  
Ion Beam ◽  
Three Dimensional ◽  
Molecular Systems ◽  
Force Microscopy ◽  
Nano Fabrication ◽  
Atomic Force ◽  
Scanning Electron

AbstractThe evolution of optical microscopy from an imaging technique into a tool for materials modification and fabrication is now being repeated with other characterization techniques, including scanning electron microscopy (SEM), focused ion beam (FIB) milling/imaging, and atomic force microscopy (AFM). Fabrication and in situ imaging of materials undergoing a three-dimensional (3D) nano-structuring within a 1−100 nm resolution window is required for future manufacturing of devices. This level of precision is critically in enabling the cross-over between different device platforms (e.g. from electronics to micro-/nano-fluidics and/or photonics) within future devices that will be interfacing with biological and molecular systems in a 3D fashion. Prospective trends in electron, ion, and nano-tip based fabrication techniques are presented.

Influence of Different Liquid Environments on Atomic Force Microscopy Detection of Living bEnd.3 Cells

2021 ◽  
Author(s):  
Jin Yan ◽  
Baishun Sun ◽  
Chenchen Xie ◽  
Yan Liu ◽  
Zhengxun Song ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
High Resolution ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biomedical Science ◽  
Three Dimensional Imaging ◽  
Force Microscopy ◽  
Atomic Force

Atomic force microscope (AFM) is one of the most important tools in the field of biomedical science, which can be used to perform the high-resolution three-dimensional imaging of samples in...

In situ, atomic force microscope studies of the evolution of InAs three‐dimensional islands on GaAs(001)

1996 ◽  
Vol 68 (23) ◽  
pp. 3299-3301 ◽  
Author(s):  
N. P. Kobayashi ◽  
T. R. Ramachandran ◽  
P. Chen ◽  
A. Madhukar
Keyword(s):  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Atomic Force

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

scholarly journals Acoustic subsurface-atomic force microscopy: Three-dimensional imaging at the nanoscale

2021 ◽  
Vol 129 (3) ◽  
pp. 030901
Author(s):  
Hossein J. Sharahi ◽  
Mohsen Janmaleki ◽  
Laurene Tetard ◽  
Seonghwan Kim ◽  
Hamed Sadeghian ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Three Dimensional ◽  
Three Dimensional Imaging ◽  
Force Microscopy ◽  
Atomic Force
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