In situ, atomic force microscope studies of the evolution of InAs three‐dimensional islands on GaAs(001)

1996 ◽  
Vol 68 (23) ◽  
pp. 3299-3301 ◽  
Author(s):  
N. P. Kobayashi ◽  
T. R. Ramachandran ◽  
P. Chen ◽  
A. Madhukar
Keyword(s):  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Atomic Force

Imaging Single Nacreous Tablets with the Atomic Force Microscope

1994 ◽  
Vol 332 ◽  
Author(s):  
R. Giles ◽  
S. Manne ◽  
C.M. Zaremba ◽  
A. Belcher ◽  
S. Mann ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Sea Water ◽  
Three Dimensional ◽  
Force Microscopy ◽  
Topographic Features ◽  
Atomic Force ◽  
Recent Developments ◽  
Growth Experiments ◽  
Dimensional Picture

ABSTRACTAfter describing some recent developments in atomic force microscopy (AFM), a specific application to the study of shell ultrastructure is examined in detail. By embedding bleached nacreous tablets in epoxy and imaging them with the atomic force microscope (AFM) during in situ dissolution, it was possible to visualize the topography of both the top faces of the tablets and the impressions in epoxy made by the bottom faces of the tablets. This epoxy imprint reproduced tablet features down to the 10 nm scale. Using this technique it should be possible to measure correspondence between topographic features on the proximal and distal faces of tablets, which is necessary to form a three-dimensional picture of the nacreous region. In addition to these dissolution experiments, growth experiments (in modified sea water) on bleached, embedded tablets indicated that aragonite grows on a tablet as asperities oriented along the c axis, normal to the tablet surface. No change was seen on the surface of the epoxy, which confirmed that the crystals were growing on the tablet surface, not spontaneously nucleating out of solution.

Characterization of photosystem II with the atomic-force microscope

1992 ◽  
Vol 50 (2) ◽  
pp. 1146-1147
Author(s):  
Kathleen M. Marr ◽  
Mary K. Lyon
Keyword(s):  
Photosystem Ii ◽  
Atomic Force Microscope ◽  
Three Dimensional ◽  
Biologically Active ◽  
Atomic Force ◽  
Freeze Etching ◽  
Image Averaging ◽  
Oxygen Evolving ◽  
Averaging Techniques

Photosystem II (PSII) is different from all other reaction centers in that it splits water to evolve oxygen and hydrogen ions. This unique ability to evolve oxygen is partly due to three oxygen evolving polypeptides (OEPs) associated with the PSII complex. Freeze etching on grana derived insideout membranes revealed that the OEPs contribute to the observed tetrameric nature of the PSIl particle; when the OEPs are removed, a distinct dimer emerges. Thus, the surface of the PSII complex changes dramatically upon removal of these polypeptides. The atomic force microscope (AFM) is ideal for examining surface topography. The instrument provides a topographical view of individual PSII complexes, giving relatively high resolution three-dimensional information without image averaging techniques. In addition, the use of a fluid cell allows a biologically active sample to be maintained under fully hydrated and physiologically buffered conditions. The OEPs associated with PSII may be sequentially removed, thereby changing the surface of the complex by one polypeptide at a time.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals In situ observation of streptavidin-biotin binding on an immunoassay well surface using an atomic force microscope

FEBS Letters ◽  
1996 ◽  
Vol 390 (2) ◽  
pp. 161-164 ◽  
Author(s):  
S. Allen ◽  
J. Davies ◽  
A.C. Dawkes ◽  
M.C. Davies ◽  
J.C. Edwards ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
In Situ Observation ◽  
Atomic Force ◽  
Biotin Binding

scholarly journals In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification

2018 ◽  
Vol 2 (4) ◽  
pp. 24 ◽  
Author(s):  
Anton Davydok ◽  
Thomas Cornelius ◽  
Zhe Ren ◽  
Cedric Leclere ◽  
Gilbert Chahine ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Reciprocal Space ◽  
X Ray Diffraction ◽  
Complex Deformation ◽  
X Ray ◽  
Three Point Bending ◽  
Atomic Force ◽  
Au Nanowire ◽  
Before And After

The three-point bending behavior of a single Au nanowire deformed by an atomic force microscope was monitored by coherent X-ray diffraction using a sub-micrometer sized hard X-ray beam. Three-dimensional reciprocal-space maps were recorded before and after deformation by standard rocking curves and were measured by scanning the energy of the incident X-ray beam during deformation at different loading stages. The mechanical behavior of the nanowire was visualized in reciprocal space and a complex deformation mechanism is described. In addition to the expected bending of the nanowire, torsion was detected. Bending and torsion angles were quantified from the high-resolution diffraction data.

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