Interdiffusion of Amorphous Si/Ge Multilayers Under Hydrostatic Pressure
Keyword(s):
X Ray
◽
ABSTRACTWe report initial results of an x-ray diffraction study of the pressure-dependence of the interdiffusion rate in amorphous Si/Ge Multilayers. Anneals were performed in a diamond anvil cell at 700 K for various pressures and durations. Interdiffusion was measured by Monitoring the rate of decay of the artificial Bragg peaks associated with the multilayer periodicity. A consistent increase in diffusivity was seen with pressure, characterized by an activation volume of -25±11 percent of the atomic volume of Si. An atomistic mechanism that Might account for such behavior is discussed.
2011 ◽
Vol 67
(a1)
◽
pp. C113-C113
1996 ◽
Vol 67
(3)
◽
pp. 840-842
◽
2014 ◽
Vol 451
◽
pp. 53-57
◽
2011 ◽
Vol 39
(3)
◽
pp. 219-226
◽