Auger Electron and Photoelectron Diffraction in Magnetic Thin Films
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ABSTRACTThe role of the final-state character of the emitted electron in Auger electron diffraction (AED) and x-ray photoelectron diffraction (XPD) is examined with respect to magnetic materials. Single scattering cluster calculations with the inclusion of the spherical wave character and the final-state character of the emitted electron (both angular momentum quantum number and magnetic quantum number) show that selective emission from different M-levels, generated by a non-statistical distribution of initial M-levels or by an M-selective excitation process, results in distinctly different emission patterns.
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1995 ◽
Vol 02
(06)
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pp. 787-793
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Transmission Electron Microscopy studies of texture of Cr underlayer of magnetic recording hard disk
1991 ◽
Vol 49
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pp. 580-581
1996 ◽
Vol 156
(1-3)
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pp. 215-218
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1976 ◽
Vol 56
(1)
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pp. 151-156
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