Single-scattering cluster calculations and Fourier-transform analyses of normal photoelectron diffraction

1983 ◽  
Vol 27 (2) ◽  
pp. 781-798 ◽  
Author(s):  
P. J. Orders ◽  
C. S. Fadley
Keyword(s):  
Fourier Transform ◽  
Single Scattering ◽  
Photoelectron Diffraction ◽  
Cluster Calculations

Auger Electron and Photoelectron Diffraction in Magnetic Thin Films

1993 ◽  
Vol 313 ◽  
Author(s):  
Y.U. Idzerda ◽  
D.E. Ramaker
Keyword(s):  
Quantum Number ◽  
Auger Electron ◽  
Spherical Wave ◽  
Magnetic Thin Films ◽  
Single Scattering ◽  
Final State ◽  
Photoelectron Diffraction ◽  
Angular Momentum Quantum Number ◽  
Cluster Calculations

ABSTRACTThe role of the final-state character of the emitted electron in Auger electron diffraction (AED) and x-ray photoelectron diffraction (XPD) is examined with respect to magnetic materials. Single scattering cluster calculations with the inclusion of the spherical wave character and the final-state character of the emitted electron (both angular momentum quantum number and magnetic quantum number) show that selective emission from different M-levels, generated by a non-statistical distribution of initial M-levels or by an M-selective excitation process, results in distinctly different emission patterns.

Low Energy Photoelectron Holography on Gaas

1992 ◽  
Vol 295 ◽  
Author(s):  
R. Denecke ◽  
R. Eckstein ◽  
L. Ley ◽  
A. Bocquet ◽  
J. Riley ◽  
...  
Keyword(s):  
Fourier Transform ◽  
Kinetic Energy ◽  
Single Scattering ◽  
Real Space ◽  
Low Energy ◽  
Space Images ◽  
Photoelectron Diffraction ◽  
Diffraction Patterns

AbstractFor GaAs (001) and (III) we have measured the photoelectron diffraction patterns at a kinetic energy of 86 eV. We applied an extended Fourier-transform algorithm to the (001) data to obtain real space images. The origin of structures in these images not representing atomic positions is investigated with the help of single scattering calculations

X-RAY PHOTOELECTRON DIFFRACTION STUDY OF A LONG-RANGE-ORDERED ACETATE LAYER ON Ni(110)

2000 ◽  
Vol 07 (01n02) ◽  
pp. 25-36 ◽  
Author(s):  
M. NOWICKI ◽  
A. EMUNDTS ◽  
J. WERNER ◽  
G. PIRUG ◽  
H. P. BONZEL
Keyword(s):  
Room Temperature ◽  
Solid Angle ◽  
Single Scattering ◽  
Real Space ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Acetate Complex ◽  
Cluster Calculations ◽  
Model Layer ◽  
Good Agreement

An investigation of acetic acid adsorption on Ni(110) at room temperature by LEED and X-ray photoelectron diffraction reveals a well-ordered c(2 × 2) acetate overlayer with a molecular coverage near 0.5. Large solid angle maps of angle-resolved C 1s and O 1s intensities from this layer show intense maxima due to electron forward scattering by nearby atoms, either of the same acetate or of neighboring acetate species. The data provide strong evidence for acetate in a bidentate configuration, bonded through both oxygen atoms to the surface and aligned along the [Formula: see text] surface azimuth. A real space model for the c(2 × 2) acetate layer has been derived and single scattering cluster calculations for this model layer have been carried out for C 1s and O 1s emissions. Allowing for changes in intramolecular bond length of the acetate relative to those in a Ni-acetate complex, good agreement between experimental and theoretical C 1s and O 1s distributions was obtained.

Comparison of Calculated and Recorded Electron Energy-Loss Spectra of Aluminium and Carbon

1990 ◽  
Vol 48 (2) ◽  
pp. 64-65
Author(s):  
L. Reimer ◽  
R. Oelgeklaus
Keyword(s):  
Fourier Transform ◽  
Energy Loss ◽  
Electron Energy ◽  
Rotational Symmetry ◽  
Mean Free Path ◽  
Single Scattering ◽  
Specimen Thickness ◽  
Two Dimensional ◽  
Image Position ◽  
Electron Energy Loss

Quantitative electron energy-loss spectroscopy (EELS) needs a correction for the limited collection aperture α and a deconvolution of recorded spectra for eliminating the influence of multiple inelastic scattering. Reversely, it is of interest to calculate the influence of multiple scattering on EELS. The distribution f(w,θ,z) of scattered electrons as a function of energy loss w, scattering angle θ and reduced specimen thickness z=t/Λ (Λ=total mean-free-path) can either be recorded by angular-resolved EELS or calculated by a convolution of a normalized single-scattering function ϕ(w,θ). For rotational symmetry in angle (amorphous or polycrystalline specimens) this can be realised by the following sequence of operations :(1)where the two-dimensional distribution in angle is reduced to a one-dimensional function by a projection P, T is a two-dimensional Fourier transform in angle θ and energy loss w and the exponent -1 indicates a deprojection and inverse Fourier transform, respectively.

STRUCTURAL DETERMINATION OF THE Si/Cu(110) INTERFACE BY PHOTOELECTRON DIFFRACTION

1997 ◽  
Vol 04 (06) ◽  
pp. 1331-1335 ◽  
Author(s):  
C. ROJAS ◽  
J. A. MARTÍn-GAGO ◽  
E. ROMÁN ◽  
G. PAOLUCCI ◽  
B. BRENA ◽  
...  
Keyword(s):  
Room Temperature ◽  
Structural Parameters ◽  
Single Scattering ◽  
Structural Determination ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
First Order ◽  
Proposed Model ◽  
Laboratory Source

Deposition of 0.5 Si monolayer (ML) on a Cu (110) surface at room temperature (RT) leads to the formation of a c(2×2) LEED pattern. In order to find out the surface atomic structure of this ordered phase, X-ray photoelectron diffraction (XPD) azimuthal scans at different photon energies and full hemispherical XPD patterns of the Si 2 p core level have been measured using both synchrotron radiation and a laboratory source. We present an atomic model for the surface structure based on the examination of forward scattering and first order interference XPD features. Refinement of the structural parameters was achieved by performing single scattering cluster (SSC) calculations. In the proposed model Si atoms replace Cu atoms at the surface along the [Formula: see text] atomic rows.

Experimental and theoretical low-energy photoelectron diffraction study of the W(001) surface: Adequacy of a single scattering model

1987 ◽  
Vol 185 (3) ◽  
pp. L527-L533 ◽  
Author(s):  
D. Sebilleau ◽  
M.C. Desjonqueres ◽  
D. Chauveau ◽  
C. Guillot ◽  
J. Lecante ◽  
...  
Keyword(s):  
Diffraction Study ◽  
Single Scattering ◽  
Low Energy ◽  
Scattering Model ◽  
Photoelectron Diffraction
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