Characterization of the Degradation Processes in SiO2-Si Structure by Means of Electrolyte-Insulating-Semiconductor Systems

1993 ◽  
Vol 309 ◽  
Author(s):  
S.A. Bota ◽  
J.R. Morante ◽  
A.P. Baraban ◽  
V.V. Bulavinov ◽  
P.P. Konorov
Keyword(s):  
Electric Field ◽  
Hole Injection ◽  
Insulating Layer ◽  
Oxide Breakdown ◽  
Structure Degradation ◽  
Injection Zone ◽  
The Stability ◽  
Non Destructive

AbstractA non destructive method to characterize the properties of SiO2 films in SiO2-Si structures and analyze their variations under different external actions is presented and discussed. The method is based on the properties of the Electrolyte-SiO2 contact under polarization which allows us to study the SiO2 film in different injection conditions, in a hole injection zone, in a predominant electron injection zone, and finally, in a region of electron heating as a result of the electric field action before to reach the oxide breakdown. Moreover, using this method, higher electric field values than in the metal-SiO2-Si system can be applied.The characterization of hole traps, electron traps and defect precursors states in SiO2 films are carried out as well as their evolution and influence on the SiO2-Si structure degradation and electrical behaviour. Results measured on SiO2-Si structures obtained from different technological processes and submitted to different treatments are reported in order to discuss the possibilities of this method as a power tool to assess the stability and quality of insulating layer on semiconductors.

Effect of Post Oxide Annealing on the Electrical and Interface 4H-SiC/Al2O3 MOS Capacitors

2018 ◽  
Vol 924 ◽  
pp. 486-489 ◽  
Author(s):  
Muhammad I. Idris ◽  
Nick G. Wright ◽  
Alton B. Horsfall
Keyword(s):  
Atomic Layer Deposition ◽  
Electric Field ◽  
Annealing Temperature ◽  
Atomic Layer ◽  
Al2o3 Layer ◽  
Mos Capacitors ◽  
Oxide Breakdown ◽  
Layer Deposition ◽  
The Stability

This paper reports on the effect of forming gas annealing on the C-V characteristics and stability of Al2O3/SiC MOS capacitors deposited by atomic layer deposition, (ALD). C-V and I-V measurements were performed to assess the quality of the Al2O3 layer and the Al2O3/SiC interface. In comparison to as-deposited sample, the post oxide annealing (POA) in forming gas at high temperatures has improved the stability of C-V characteristic and the properties at the interface of Al2O3/SiC capacitors. However, the oxide capacitance and oxide breakdown electric field degrade with increased annealing temperature. The results provide indications to improve the performance of Al2O3/SiCcapacitors 4H-SiC devices by optimizing the annealing temperature.

scholarly journals Impact of Crystalline Orientation on the Switching Field in Barium Titanate Using Piezoresponse Force Spectroscopy

2014 ◽  
Vol 1652 ◽  
Author(s):  
Nikhil K. Ponon ◽  
Daniel J. R. Appleby ◽  
Erhan Arac ◽  
Kelvin S. K. Kwa ◽  
Jonathan P. Goss ◽  
...  
Keyword(s):  
Electric Field ◽  
Phase Change ◽  
Crystal Orientation ◽  
Force Spectroscopy ◽  
Ferroelectric Domain ◽  
Switching Field ◽  
The Impact ◽  
Non Destructive ◽  
Domain Level

ABSTRACTUnderstanding crystal orientation at the ferroelectric domain level, using a non destructive technique, is crucial for the design and characterization of nano-scale devices. In this study, piezoresponse force spectroscopy (PFS) is used to identify ferroelectric domain orientation. The impact of crystal orientation on the switching field of ferroelectric BaTiO3 is also investigated at the domain level. The preferential domain orientations for BaTiO3 thin films prepared by pulsed laser deposition (PLD) in this study are [001], [101] and [111]. They have been mapped onto PFS spectra to show three corresponding switching fields of 460, 330 and 120 kV/cm respectively. In addition, the electric field at which the enhanced piezoresponse occurs was found to vary, due to a phase change. The polarization reversal occurs via a 2-step process (rotation and switching) for [101] and [111] orientations. The piezoresponse enhancement is absent for the [001] (pure switching) domains. The results demonstrate that an electric field induced phase change causes the [101] and [111] domains to reverse polarization at a lower field than the [001] domain.

scholarly journals Facile, non-destructive characterization of 2d photonic crystals using UV-vis-spectroscopy

2018 ◽  
Vol 20 (6) ◽  
pp. 4340-4346 ◽  
Author(s):  
V. Schöps ◽  
B. Lenyk ◽  
T. Huhn ◽  
J. Boneberg ◽  
E. Scheer ◽  
...  
Keyword(s):  
Photonic Crystals ◽  
Dry Etching ◽  
Dielectric Substrates ◽  
Size Evolution ◽  
Vis Spectroscopy ◽  
Radiative Losses ◽  
Non Destructive ◽  
Non Destructive Characterization

The quality of particle monolayers and size evolution of their particles during dry etching can be monitored by radiative losses of photonic modes into dielectric substrates.

Characterization of Ni- and Ni(Pt)-Silicide Formation on Narrow Polycrystalline Si Lines by Raman Spectroscopy

1999 ◽  
Vol 591 ◽  
Author(s):  
P. S. Lee ◽  
D. Mangelinck ◽  
K. L. Pey ◽  
J. Ding ◽  
T. Osipowicz ◽  
...  
Keyword(s):  
Thermal Stability ◽  
Raman Spectroscopy ◽  
Raman Mapping ◽  
Silicide Formation ◽  
Nucleation Sites ◽  
The Difference ◽  
The Stability ◽  
Non Destructive ◽  
Thermal Stability Of

ABSTRACTThe formation and thermal stability of Ni- and Ni(Pt) silicide on narrow polycrystalline Si (poly-Si) lines have been investigated using the non-destructive micro-Raman technique. The presence of Ni or Ni(Pt)Si on poly-Si lines with linewidths ranging from 0.5 gtm to 0.25 μm has been monitored by a distinct Raman peak at around 215 cm−1. Ni(Pt)Si was clearly identified to be present up to a RTA temperature of 900°C on narrow poly-Si lines as compared to pure NiSi which was found only up to 750°C. Raman scattering from the 100×100 μm2 poly-Si pads showed the formation of NiSi2 at 750°C for pure Ni-salicidation and 900°C for Ni(Pt)-salicidation respectively. The difference in the stability of NiSi on the poly-Si pads and lines is discussed in terms of agglomeration, inversion and/or nucleation of NiSi2that could be due to difference in nucleation sites and/or stress. In addition, a correlation between the line sheet resistance and the presence of Ni silicide was found using micro-Raman mapping along single poly-Si lines.

Characterization of the fullerene end-functionalized ZnO nanotube: A computational study

2016 ◽  
Vol 15 (04) ◽  
pp. 1650031 ◽  
Author(s):  
Davood Farmanzade ◽  
Leila Tabari
Keyword(s):  
Electric Field ◽  
Field Emission ◽  
Density Functional ◽  
Computational Study ◽  
Tube Length ◽  
Emission Properties ◽  
Field Emission Properties ◽  
Zno Nanotube ◽  
The Stability

The electronic and field emission properties of the fullerene end-functionalized zinc oxide nanotube (ZnONT) are investigated by density functional theory (DFT) to search for novel field emitter nano material. The interaction energies of ZnONT/fullerenes complexes gradually increase, with increasing the nanotube lengths which indicate that ZnONTs with higher lengths could improve the stability of the complexes. The band gaps of connected construction of fullerene molecules with ZnONTs gradually reduced by increasing the tube length, but were not sensitive to the tubes diameter. It is found that the ionization potentials of ZnONT/fullerenes complexes mainly decrease compared to that of pristine nanotube in the presence of 0, 0.002, 0.004[Formula: see text]a.u. electric field. The reduction of the ionization potential means the enhancement of the field emission properties of ZnONT/fullerenes complexes compared with simple ZnONT and fullerene molecules. The calculations show that the combination of ZnONT with fullerene molecules indeed improves the field emission by controlling the tube size and electric field strength.

The Influence of Precursor on the Microstructure and Characterization for Sr0.5Ba0.5Bi4Ti4O15 Thin Films

2007 ◽  
Vol 336-338 ◽  
pp. 136-139
Author(s):  
Dan Xie ◽  
Wei Pan ◽  
Tian Ling Ren ◽  
Li Tian Liu ◽  
Zhi Min Dang
Keyword(s):  
Thin Films ◽  
Ph Value ◽  
Sol Gel ◽  
Precursor Solution ◽  
Layered Perovskite ◽  
Layered Perovskite Structure ◽  
Gel Technique ◽  
The Stability

The uniform Sr0.5Ba0.5Bi4Ti4O15 thin films were prepared using a modified Sol-Gel technique and the influence of precursor on the microstructure and characterization of thin films were studied. The stability and uniformity of precursor solution is key issue for the quality of thin films. Ethanolamine is an effective complexation reagent of Bi3+, which could moderate the acidity of precursor. When pH value and concentration of precursor solution was about 3.5 and 0.35M respectively, the smooth and uniform Sr0.5Ba0.5Bi4Ti4O15 thin films could be obtained. The Bi-layered perovskite structure of Sr0.5Ba0.5Bi4Ti4O15 formed at 750°C. The morphology of the grains in Sr0.5Ba0.5Bi4Ti4O15 thin films was elliptoid and the grain size was about 90 ~ 100 nm.

scholarly journals A Review of Non-Destructive Thermography Techniques Toward Structural Integrity of Bio-Composites

2011 ◽  
Vol 471-472 ◽  
pp. 103-108 ◽  
Author(s):  
Zahra Dashtizadeh ◽  
Aidy Ali ◽  
Abdan Khalina
Keyword(s):  
Composite Materials ◽  
Structural Integrity ◽  
Destructive Testing ◽  
Advantages And Disadvantages ◽  
Composites Materials ◽  
Characterization Of Materials ◽  
Non Destructive ◽  
Food Safety And Quality

It is well known those two popular methods of testing; destructive testing based on fracture mechanics and non-destructive testing (NDT) which does not make any damage in the specimen. NDT was first used for military purpose but nowadays it is used widely in many fields such as composite materials, medical purposes, fire safety, laser welding, food safety and quality and characterization of materials. The aim of this paper is to review the recent advancement of thermography non-destructive methods especially in testing a quality of bio-composites materials. The review reveals the advantages and disadvantages of pursuing any of the available methods in NDT on bio composite materials.

scholarly journals Characterization of the Parameters of Sand Moulds in Compaction Process by Use of the Industrial Computer Tomography (ICT)

2014 ◽  
Vol 59 (3) ◽  
pp. 1097-1101 ◽  
Author(s):  
A. Kadauw
Keyword(s):  
Computer Tomography ◽  
Numerical Solutions ◽  
Local Density ◽  
Industrial Condition ◽  
Trial And Error Method ◽  
Compaction Processes ◽  
Contact Free ◽  
Non Destructive

Abstract One main problem in moulding is the proper characterization of the local density of the mould, the best without its destroying, for assessment the quality of the mould and to compare results of compaction modeling with experimental results. Industrial computer tomography (ICT) is a technique that allows the non-destructive and contact-free visualization and characterization of the internal and external parts of physical objects including also sand moulds. It is possible to apply ICT technique for the specific research presented here. Moulding sand compaction plays an important role for the quality of the mould and as the consequence for the quality of manufactured casting. The required quality of the castings can be achieved by selecting optimum manufacturing process parameters. The determination of these parameters is often carried out by trial-and-error-method, which is expensive and time consuming. To improve the understanding of the influence of various parameters, mathematical modeling of the compaction processes using numerical solutions was performed. Theoretical results of the compaction simulations have then been compared with practical results of mould compaction obtained by ICT. Itwasfound that simulation results agree well with data from computer tomography and provide insight into the spatial distribution of the density of sand moulds under industrial condition.

Surface Morphology Improvement and Repeatable Doping Characterization of 4H-SiC Epitaxy Grown on 4° Off-Axis 4H-SiC Wafers

2009 ◽  
Vol 615-617 ◽  
pp. 423-426 ◽  
Author(s):  
Swapna G. Sunkari ◽  
Hrishikesh Das ◽  
Carl Hoff ◽  
Yaroslav Koshka ◽  
Janna R. B. Casady ◽  
...  
Keyword(s):  
Surface Roughness ◽  
High Surface ◽  
Process Conditions ◽  
Power Devices ◽  
Low Loss ◽  
High Surface Quality ◽  
Non Destructive ◽  
Koh Etching

4H Silicon Carbide (4H-SiC) has a great potential for low-loss power devices due to its superior electrical properties. However, the increase in demand for the power devices requires high quality SiC substrates and epitaxial layers. Mercury probe Capacitance Voltage (Hg CV) measurement is a well known procedure to characterize epi layers grown on SiC substrates, due to its non-destructive technique. However, careful calibration of the tool is very important for repeatable and accurate measurements. Here we present very close repeatability of Hg CV within 2.4% (standard deviation 0.7%), between different Solid State Measurements (SSM) setups compared with Ni Schottky (NiS) CV. In addition to growing uniformly doped epi layers, high surface quality of the epi layer is also needed for improved device performance. Improved process conditions resulted in a smooth epi with a surface roughness Ra 1.2 nm for a 6 µm thick epi layer. Molten Potassium Hydroxide (KOH) etching analysis also revealed a significant correlation between the surface roughness and epi defects.

scholarly journals “Characterization of Biodiesels Produced using Mixed Base Catalyst by Gas Chromatography & FTIR Spetroscopy”

2020 ◽  
Vol 9 (8) ◽  
pp. 668-672
Keyword(s):  
Gas Chromatography ◽  
Fish Oil ◽  
Unsaturated Fatty Acids ◽  
Methyl Esters ◽  
Infrared Spectrometry ◽  
Base Catalyst ◽  
Characterization Studies ◽  
The Stability

In this study, fish oil & cottonseed oils were used to produce their individual methyl esters using a mixed base catalyst (Sodium hydroxide & di-sodium phosphate). The produced biodiesels were characterized to check the quality of biodiesel and to establish the feasibility of using the mixed base catalyst for production of biodiesels. The biodiesel was characterized by FTIR (Fourier Transform infrared spectrometry) and GC (Gas Chromatography) tests and the other important properties of biodiesel were found out and compared with that of diesel. FTIR test confirms complete conversion of biodiesel from individual oils and the fuel properties were found to be within the range prescribed in ASTM standards. GC analysis has shown presence of more unsaturated fatty acids in cottonseed oil and less in fish oil biodiesel throwing some light on the stability of the fuels. The present characterization studies has established the potential use of mixed base catalyst during transesterification reactions.

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