Integration of a Quantum Well Laser with AlGaAs/GaAs-HEMT Electronics

1993 ◽  
Vol 300 ◽  
Author(s):  
W. Bronner ◽  
J. Hornung ◽  
K. Köhler ◽  
E. Olander ◽  
Z.-G. Wang

ABSTRACTIn this presentation the various technology steps for the monolithic integration of GaAs quantum well lasers with Double Pulse Doped AlGaAs/GaAs/AlGaAs Quantum Well (DPDQW) E/D HEMT electronics on a single substrate in one process run are described. All layers are grown by molecular beam epitaxy. The laser structure, consisting of three 74 Å GaAs quantum wells between two AlGaAs cladding layers, are grown on top of the electronic structure. The laser mesas and contact areas are defined by a combined wet and dry etch process. Apart from the transistor gates which are exposed by electron beam lithography, all lithography steps are performed using contact printing. A two layer metallization is used to interconnect the devices whereby air-bridges are used to connect the laser mesas to the electronics. First results showed laser action of laser diodes of area 3 x 300 μm2 at a threshold current of less than 60 mA, as well as the operation of different electronic devices on wafers which have been processed in this way. These include a laser diode driver, and an optoelectronic receiver with a MSM photo diode, both devices operating at a data rate of 5 Gbit/sec. These results indicate that the process sequence described is suitable for the integration of laser diodes and HEMT electronics.

1996 ◽  
Vol 74 (S1) ◽  
pp. 1-4 ◽  
Author(s):  
M. Dion ◽  
Z. R. Wasilewski ◽  
F. Chatenoud ◽  
V. K. Gupta ◽  
A. R. Pratt ◽  
...  

In this report, we present data on an InGaAs/GaAs strained single quantum well laser with the lowest reported threshold current density to date, namely 44 A cm−2 for a 3 mm cavity length. This was grown by solid-source molecular-beam epitaxy with the arsenic dimer, As2. The structure is that of a graded-index, separate-confinement heterostructure with a single strained InGaAs quantum well, sandwiched between GaAs barrier layers and AlGaAs cladding layers. The wavelength of the lasers was around 985 nm, and the internal efficiency and losses were 69% and 0.70 cm−1, respectively. In addition, data on the uniformity of our lasers, which are grown on rotating 2 in substrates (1 in = 2.54 cm), show drops in photoluminescence emission wavelength and layer thickness of less than 4 nm and 4%, respectively, from the centre to the edge of the wafer and very little compositional change.


1999 ◽  
Vol 595 ◽  
Author(s):  
Monica Hansen ◽  
Paul Fini ◽  
Lijie Zhao ◽  
Amber Abare ◽  
Larry A. Coldren ◽  
...  

AbstractInGaN multi-quantum-well laser diodes have been fabricated on fully-coalesced laterally epitaxially overgrown (LEO) GaN on sapphire. The laterally overgrown ‘wing’ regions as well as the coalescence fronts contained few or no threading dislocations. Laser diodes fabricated on the low-dislocation-density wing regions showed a reduction in threshold current density from 8 kA/cm2 to 3.7 kA/cm2 compared the those on the high-dislocation ‘window’ regions. Laser diodes also showed a twofold reduction in threshold current density when comparing those on the wing regions to those fabricated on conventional planar GaN on sapphire. The internal quantum efficiency also improved from 3% for laser diodes on conventional GaN on sapphire to 22% for laser diodes on LEO GaN on sapphire.


Sign in / Sign up

Export Citation Format

Share Document