Crystallinity Analysis of Amorphous-Crystalline Mixed Phase Silicon films Using Exafs Method

1992 ◽  
Vol 283 ◽  
Author(s):  
Masatoshi Wakagi ◽  
Toshiki Kaneko ◽  
Kiyoshi Ogata ◽  
Asao Nakano
Keyword(s):  
Raman Scattering ◽  
Curve Fitting ◽  
Crystalline Phase ◽  
Mixed Phase ◽  
Least Square ◽  
Scattering Method ◽  
Plasma Cvd ◽  
Chemical Annealing ◽  
Si Films ◽  
Exafs Spectra

ABSTRACTThe crystalline phase fraction (Xc) of amorphous-crystalline mixed phase Si films prepared by thermal annealing of a-Si:H films and by plasma CVD and chemical annealing methods was investigated by the EXAFS method. The EXAFS spectra of these films were represented by linear-combination of a-Si:H and c-Si EXAFS spectra. The values of Xc were analyzed by least-square curve fitting. The crystallinity was also analyzed by a Raman scattering method measured from both sides of the films. Then, the Xc values analyzed by the Raman method were calibrated by the EXAFS analysis results.

Theoretical Analysis of Time-Resolved Coherent Anti-Stokes Raman Scattering Method for Obtaining the Whole Raman Spectrum of Biomolecules

2010 ◽  
Vol 30 (7) ◽  
pp. 2136-2141
Author(s):  
尹君 Yin Jun ◽  
于凌尧 Yu Lingyao ◽  
屈军乐 Qu Junle ◽  
牛憨笨 Niu Hanben ◽  
林子扬 Lin Ziyang
Keyword(s):  
Raman Spectrum ◽  
Theoretical Analysis ◽  
Raman Scattering ◽  
Scattering Method ◽  
Time Resolved ◽  
Anti Stokes

Measuring of Damage Parameters in Adhesive Bonding

2006 ◽  
Vol 324-325 ◽  
pp. 275-278 ◽  
Author(s):  
I. Hilmy ◽  
M.M. Abdel Wahab ◽  
Ian A. Ashcroft ◽  
A.D. Crocombe
Keyword(s):  
Stress Level ◽  
Curve Fitting ◽  
Damage Mechanics ◽  
Adhesive Bonding ◽  
Low Cycle Fatigue ◽  
Extreme Points ◽  
Load Ratio ◽  
Continuum Damage Mechanics ◽  
Epoxy Adhesive ◽  
Least Square

In this paper, the characterisation of damage in an epoxy adhesive has been investigated. Bulk adhesive samples were used in this study for two reasons; firstly the stress distribution in the bulk adhesive sample is simpler than that in a joint, secondly, the specimen’s dimensions meet fatigue test specimen standards. Low cycle fatigue (LCF) tests with a load ratio of 0.1 and a frequency of 5 Hz were performed on bulk adhesive dumbbell specimens. Damage curves, relating damage in the specimen to number of cycles to failure, were plotted using an isotropic damage equation in which damage is a function of stress, which decreases as damage progresses. The damage curves were then fitted using a LCF damage evolution law. This equation was derived from a dissipation potential function using Continuum Damage Mechanics (CDM) theory. Curve fitting was performed using a Robust Least Square technique rather than ordinary linear least square because the damage curve has extreme points (usually at the breaking point). Two damage parameters α and β were found from the curve fitting process. This process resulted in different values of α and β for different stress levels. The logarithmic α and β points were then plotted respect against stress level and linear regression was used to determine α and β as a function of stress. With this function, damage parameters for other stress level can be predicted.

Optical Analysis of Plasma Enhanced Crystallization of Amorphous Silicon Films

1998 ◽  
Vol 536 ◽  
Author(s):  
L. Montès ◽  
L. Tsybeskov ◽  
P. M. Fauchet ◽  
K. Pangal ◽  
J. C. Sturm ◽  
...  
Keyword(s):  
Raman Scattering ◽  
Quantum Confinement ◽  
Silicon On Insulator ◽  
Optical Analysis ◽  
Grain Sizes ◽  
Mean Size ◽  
Low Temperature Crystallization ◽  
The Mean ◽  
Si Films ◽  
Temperature Crystallization

AbstractLow-temperature crystallization of a-Si is important for display and Silicon-On- Insulator (SOT) technologies. We present optical characterization (Raman scattering and photoluminescence) of H2 and O2 plasma enhanced crystallization of a-Si:H films. H2 plasma treatment is shown to be the most efficient, leading to larger grain sizes, and both H2 and O2 plasma lead to visible photoluminescence (PL). Recently, the PL of re-crystallized a-Si films has been explained in terms of quantum confinement [1]. The mean size of the crystallites in our re-crystallized films is determined by Raman scattering for different treatments parameters. No correlation between size and the photon energy of the visible emission is found. However, we can clearly distinguish between the PL from purely amorphous and re-crystallized a-Si:H films: Their PL temperature dependence and spectra are very different. The origin of the visible PL in re-crystallized thin Si films is discussed.

scholarly journals Influence of curve fitting techniques on hydrostatic characteristics of ship

1970 ◽  
Vol 39 (2) ◽  
pp. 100-112
Author(s):  
Md Mashud Karim ◽  
Md Ashim Ali ◽  
Kho. Sahriar Iqbal
Keyword(s):  
Curve Fitting ◽  
Mechanical Engineering ◽  
Cubic Spline ◽  
Ship Hull ◽  
Least Square ◽  
Ship Stability ◽  
Hull Form ◽  
B Spline ◽  
Using Data ◽  
Table Data

This paper presents influence of curve fitting techniques on hydrostatic characteristics of marine vessels.  Three vessels having lengths of 32.16m, 70.0m and 25.6m are selected for this study. The hull geometries of these vessels are represented by three curve fitting techniques such as least square, cubic spline and B-spline methods. At first, hydrostatic characteristics of the vessels are calculated using data only available in offset table and then using more data generated by curve fitting techniques. Finally, results obtained by offset table data are compared to those by fitted data. It is seen that there are some influences of curve fitting technique on the hydrostatic characteristics of ship especially at lightly loaded condition. Keywords: Curve fitting technique, ship hull form, offset table, hydrostatic characteristics, ship stability, cross curve. doi:10.3329/jme.v39i2.1853 Journal of Mechanical Engineering, Vol. ME39, No. 2, Dec. 2008 100-112

Analysis of Si-SiO2 Interfacial-Energy Hierarchy via Mixed-Phase Solidification of Si Films on SiO2

2015 ◽  
Vol 1770 ◽  
pp. 55-60
Author(s):  
Ying Wang ◽  
Monica D. Chahal ◽  
J. J. Wang ◽  
A. B. Limanov ◽  
A. M. Chitu ◽  
...  
Keyword(s):  
Partial Melting ◽  
Microstructure Evolution ◽  
Interfacial Energy ◽  
Thermodynamic Model ◽  
Orientation Distribution ◽  
Mixed Phase ◽  
Hierarchical Order ◽  
Interfacial Energies ◽  
Si Films ◽  
Melting And Solidification

ABSTRACTWe have experimentally investigated the anisotropy of Si-SiO2 interfacial energy by leveraging the mixed-phase solidification (MPS) method. By examining the microstructure evolution resulting from partial-melting-and-solidification cycles, and interpreting the changes in the surface-orientation distribution of the grains in terms of the thermodynamic model, we have identified the orientation-dependent hierarchical order of Si-SiO2 interfacial energies, σ{hkl}, as: σ{100} < σ{310} < σ{113} < σ{112} < σ{221} < σ{210}∼σ{331} < σ{111}, σ{110}.

A Surface-Enhanced Resonance Raman Scattering Method for the Determination of Trace Crystal Violet on Colloidal Au Nanoparticle Substrate

2013 ◽  
Vol 299 ◽  
pp. 191-194 ◽  
Author(s):  
Zhi Liang Jiang ◽  
Lu Ma ◽  
Ai Hui Liang
Keyword(s):  
Raman Scattering ◽  
Crystal Violet ◽  
Resonance Raman ◽  
Trisodium Citrate ◽  
Au Nanoparticle ◽  
Scattering Method ◽  
Resonance Raman Scattering ◽  
Buffer Solution ◽  
Surface Enhanced ◽  
Colloidal Au

Colloidal Au nanoparticles as active substrate for surface-enhanced resonance Raman scattering(SERRS) were prepared by the trisodium citrate-reduced procedure. In pH 6.6 Na2HPO4-NaH2PO4 buffer solution and in the presence of aggregation reagent NaCl, nanogolds were aggregated to form stable aggregated- nanogolds (ANG). The crystal violet (CV) adsorbed on the surface of ANG to form CV-ANG conjugates that produce strongest surface-enhanced resonance Raman scattering peak at 1616 cm-1. In the optimal condition, the SERRS intensity at 1616 cm-1 was linear to the CV concentration in the range of 2.5×10-8 -1.75×10-7 mol/L, a surface-enhanced resonance Raman scattering assay was set up for detection of trace CV, with good selectivity.

Phase transition of LixNa1−xNbO3 studied by Raman scattering method

1999 ◽  
Vol 111 (12) ◽  
pp. 723-728 ◽  
Author(s):  
Y.D. Juang ◽  
S.B. Dai ◽  
Y.C. Wang ◽  
W.Y. Chou ◽  
J.S. Hwang ◽  
...  
Keyword(s):  
Phase Transition ◽  
Raman Scattering ◽  
Scattering Method
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