The Micro-Structure and Electron Conduction Mechanism of Hydrogenated Nano-Crystalline Silicon Films
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ABSTRACTThe hydrogenated nano-crystalline silicon (nc-Si:H) films have been deposited with PECVD method.1–2 The micro-structure of these films has been studied by TEM and HREM. The PECVD nc-Si:H films show fiber texture structure which is exceptional compared with the nano-size materials made by the method of compressing granules method. The fractal dimention of this texture structure has been calculated with a Fourier filtered image. The relationshisps between conductivity and temperature and micro-structure has also been studied and the mechanism of electron conduction is discussed.
1993 ◽
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pp. 539-542
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2007 ◽
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pp. 898-903
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1992 ◽
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pp. L509-L512
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1994 ◽
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pp. 713-718
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1999 ◽
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pp. 670-671
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