The Stress Driven Islands Formation in Epitaxial Films and Solid HE4 Films.

1992 ◽  
Vol 280 ◽  
Author(s):  
Michael A. Grinfeld
Keyword(s):  
Surface Energy ◽  
Shear Modulus ◽  
Film Thickness ◽  
Epitaxial Films ◽  
Morphological Instability ◽  
Thin Solid Films ◽  
Solid Films ◽  
Mismatch Stress ◽  
Critical Film Thickness ◽  
Morphological Patterns

ABSTRACTWe discuss the static and quasi-static problems appearing in the theory of morphological instability of interfaces. The approach has allowed to predict the corrugations in He4 films and to explain the dislocation-free Stranski-Krastanow pattern of epitaxial growth of thin solid films with the critical film thickness H = σμ/τ2 (σ is a surface energy, μ- the shear modulus, and τ - the mismatch stress). In this paper we discuss possible morphological patterns of corrugations and their changes which appear in result of the stress driven “rearrangement” destabilization of originally flat interfaces.

Stress Driven Patterning of Epitaxial Films

1993 ◽  
Vol 318 ◽  
Author(s):  
Michael A. Grinfeld
Keyword(s):  
Surface Energy ◽  
Surface Morphology ◽  
Film Thickness ◽  
Critical Thickness ◽  
Epitaxial Films ◽  
Layer By Layer ◽  
Two Dimensional ◽  
Dimensional Lattice ◽  
One Dimensional ◽  
Periodic Spacing

ABSTRACTWe study possible morphologies of epitaxial films atop attractive substrates appearing as a result of competition of misfit stresses, van der Waals forces and surface energy. Corresponding formula for the critical thickness of the dislocation-free Stranski-Krastanov pattern is established for the isotropic deformable films and substrates. If the film thickness exceeds the critical magnitude the layer-by-layer pattern switches to islanding. At the first stage the islands have a shape of striae (i.e. long parallel trenches with periodic spacing). We discuss also i)the circumstances in which surface morphology of the film corresponds to a two-dimensional superlattice of islands rather than a one dimensional lattice of striae and ii)the influence of a buffer inter-layer.

Rheed Study of Strain Relaxation in Epitaxial Cds and Sn Overlayers

1990 ◽  
Vol 208 ◽  
Author(s):  
David W. Niles ◽  
Hartmut Höchst
Keyword(s):  
Film Thickness ◽  
Lattice Constant ◽  
Reasonable Agreement ◽  
Critical Thickness ◽  
Strain Relaxation ◽  
Epitaxial Films ◽  
Mechanical Equilibrium ◽  
Lattice Constants ◽  
Critical Film Thickness ◽  
Experimental Findings

ABSTRACTThe relaxation of strain in epitaxial overlayers is studied through an analysis of RHEED patterns. From the separation of the RHEED reflections, we determine the in-plane lattice constants for α-Sn/Cd0.8Zn0.2Te(100), CdS/GaAs(100), and CdS/CdTe(100) heterostructures. The discussion focuses on the critical thickness of the overlayers and the relaxation of the inplane lattice constant (a∥) of epitaxial films which exceed the critical thickness. Predictions based on Matthews and Blakeslee's mechanical equilibrium theory show reasonable agreement with our experimental findings, indicating that the metastability of the epitaxial overlayers does not cause a significant reduction in the critical film thickness.

the Critical Thickness of Dislocation-free Stranski-Krastanov Growth Atop a Deformabile Substrate

1993 ◽  
Vol 317 ◽  
Author(s):  
Michael Grinfeld
Keyword(s):  
Small Mass ◽  
Theory Of Elasticity ◽  
Shear Stresses ◽  
Mass Force ◽  
Solid Films ◽  
Asymptotic Formulae ◽  
Solid Substrates ◽  
Mismatch Stress ◽  
Critical Film Thickness ◽  
Static Energy

AbstractWe investigate the influence of mass forces (in particular, of gravitation and van der Waals forces) on the critical film thickness of thin films attached to solid substrates and establish corresponding corrections of the earlier published formula Hcril = ΣΜ/τ2 (where Σ is the surface energy, Μ - the shear Modulus, and τ - the mismatch stress). It is assumed that the films’ particles are able to rearrange their relative positions in the lattices, and the equilibrium rearrangement is determined by minimizing the total static energy. Recently, it was demonstrated that morphological stability of interfaces in crystalline solids with the rearrangement is extremely sensitive to the presence of shear stresses. Equilibrium theory of elasticity of pre-stressed solids with the rearrangement of their material particles has already allowed the prediction of the appearance of corrugations in He4 films and to explain the dislocation-free Stranski-Krastanov pattern of epitaxial growth of thin solid films. The explicit asymptotic formulae announced here are especially useful in the case of small mass force, the effects of which can be detectable and even significant for some of the above mentioned phenomena.

A new method for quantifying the blocking of coated paperboard

TAPPI Journal ◽  
2010 ◽  
Vol 9 (5) ◽  
pp. 29-35 ◽  
Author(s):  
PAULINE SKILLINGTON ◽  
YOLANDE R. SCHOEMAN ◽  
VALESKA CLOETE ◽  
PATRICE C. HARTMANN
Keyword(s):  
Surface Roughness ◽  
Fatty Acid ◽  
Surface Energy ◽  
Film Thickness ◽  
External Factors ◽  
Additive Concentration ◽  
Pressure Surface ◽  
Fatty Acid Amides ◽  
Coated Surfaces ◽  
Definite Period

Blocking is undesired adhesion between two surfaces when subjected to pressure and temperature constraints. Blocking between two coated paperboards in contact with each other may be caused by inter-diffusion, adsorption, or electrostatic forces occurring between the respective coating surfaces. These interactions are influenced by factors such as the temperature, pressure, surface roughness, and surface energy. Blocking potentially can be reduced by adjusting these factors, or by using antiblocking additives such as talc, amorphous silica, fatty acid amides, or polymeric waxes. We developed a method of quantifying blocking using a rheometer. Coated surfaces were put in contact with each other with controlled pressure and temperature for a definite period. We then measured the work necessary to pull the two surfaces apart. This was a reproducible way to accurately quantify blocking. The method was applied to determine the effect external factors have on the blocking tendency of coated paperboards, i.e., antiblocking additive concentration, film thickness, temperature, and humidity.

Electrochoromic Display Using V2O5 Amorphous Thin Solid Films

1988 ◽  
Vol 17 (3) ◽  
pp. 76-78
Author(s):  
Ramakuru N. Prasad ◽  
Abayankar Neelima ◽  
R. N. Karekar
Keyword(s):  
Thin Solid Films ◽  
Solid Films

scholarly journals Corrigendum to Procedure to convert optical-constant models into analytic Thin Solid Films (2018) 52-59

2021 ◽  
Vol 733 ◽  
pp. 138816
Author(s):  
Juan I. Larruquert ◽  
Luis V. Rodríguez-de Marcos
Keyword(s):  
Optical Constant ◽  
Thin Solid Films ◽  
Solid Films

Sensitivity Enhancement of Surface Plasmon Resonance Sensor with Two Dimensional Materials Covered on Silver-Nickel Bimetallic Thin Solid Films

2020 ◽  
Vol 18 (10) ◽  
pp. 776-779
Author(s):  
L. Castañeda
Keyword(s):  
2D Materials ◽  
Sensitivity Enhancement ◽  
Thin Solid Films ◽  
Solid Films ◽  
Kretschmann Configuration ◽  
Enhanced Sensitivity ◽  
Resonance Sensor ◽  
Two Dimensional Materials ◽  
Fresnel Equation ◽  
Hybrid Configuration

In this paper a new sensing configuration with enhanced sensitivity utilizing 2D materials on the bimetallic layers of Magnetic Material Ni over Ag for Kretschmann configuration is proposed and analyzed numerically using Fresnel equation and transfer matrix method. Results show that such a hybrid configuration with well optimized thickness of metallic layer and utilization of specific no. of 2D materials can increases the sensitivity as high as 298°/RIU is absorbed for the configuration consist 10 nm of Ni over 40 nm thickness of Ag added with a 2 layers of WSe2.

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