Reliability of Submicron Mosfet's with Deposited Gate Oxides under F-N Injection and Hot-Carrier Stress

1992 ◽  
Vol 265 ◽  
Author(s):  
Ming-Yin Hao ◽  
Jack C. Lee ◽  
Ih-Chin Chen ◽  
Clarence W. Teng
Keyword(s):  
Gate Oxides ◽  
Hot Carrier ◽  
Hot Carrier Stress

HOT CARRIER STRESS INDUCED CHANGES IN MOST TRANSCONDUCTANCE STRUCTURE

1988 ◽  
Vol 49 (C4) ◽  
pp. C4-779-C4-782 ◽  
Author(s):  
C. BERGONZONI ◽  
R. BENECCHI ◽  
P. CAPRARA
Keyword(s):  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Induced Changes

Degradation induced by TID radiation and hot-carrier stress in 130-nm short channel PDSOI NMOSFETs

2017 ◽  
Vol 74 ◽  
pp. 74-80 ◽  
Author(s):  
Lihua Dai ◽  
Xiaonian Liu ◽  
Mengying Zhang ◽  
Leqing Zhang ◽  
Zhiyuan Hu ◽  
...  
Keyword(s):  
Short Channel ◽  
Hot Carrier ◽  
Hot Carrier Stress

Improved hot-carrier immunity in CMOS analog device with N/sub 2/O-nitrided gate oxides

1992 ◽  
Vol 13 (9) ◽  
pp. 457-459 ◽  
Author(s):  
G.Q. Lo ◽  
J. Ahn ◽  
D.-L. Kwong
Keyword(s):  
Analog Device ◽  
Gate Oxides ◽  
Hot Carrier
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