Influence of Carbon on Structural, Optical and Electrical Properties of Microcrystalline Silicon Carbide.

1992 ◽  
Vol 258 ◽  
Author(s):  
F. Demichelis ◽  
C.F. Pirri ◽  
E. Tresso ◽  
G. DellaMea ◽  
A. Quaranta ◽  
...  

ABSTRACTMicrocrystalline films of SiC.H have been deposited by Plasma Enhanced Chemical Vapor Deposition (PECVD) of SiH4+CH4+H2 mixtures with high power density and high H2 dilution, at variable CH4/SiH4 ratios. Their elemental composition, structural, optical and electrical properties have been investigated in order to evidence the influence of hydrogen and carbon on microcrystallinity.

1991 ◽  
Vol 219 ◽  
Author(s):  
F. Demichelis ◽  
C. F. Pirri ◽  
E. Tresso ◽  
G. Dellamea ◽  
V. Rigato ◽  
...  

ABSTRACTExperimental results on a systematic investigation on the elemental composition, structural, optical and electrical properties of undoped and doped microcrystalline silicon carbide films deposited by Plasma Enhanced Chemical Vapor Deposition.The doped samples show high values of dark conductivity accompanied by good optical properties so to satisfy the requirements for heterojunction window material.


2017 ◽  
Vol 638 ◽  
pp. 22-27 ◽  
Author(s):  
A. Heiras-Trevizo ◽  
P. Amézaga-Madrid ◽  
L. Corral-Bustamante ◽  
W. Antúnez-Flores ◽  
P. Pizá Ruiz ◽  
...  

Sign in / Sign up

Export Citation Format

Share Document