The doping of a-Si:H with liquid boron and phosphorus sources

1992 ◽  
Vol 258 ◽  
Author(s):  
M. Albert ◽  
K. Schade ◽  
W. Beyer

ABSTRACTThe conductivity control of amorphous hydrogenated silicon (a-Si:H) by incorporation of electron donors or acceptors is prerequisite for the application of these layers in devices. The doping sources B2H6 and PH3 which are usually highly toxic are substituted by not dangerous boron and phosphorus liquid sources based on hydro-carbons. The avoidance of gas cylinders and expensive safety measure techniques is another advantage of these liquids.In this paper we have studied the influence of boron, phosphorus and carbon on the electrical, photoelectrical and optical properties. The layers were produced in a capacitively coupled reactor in a silan-doping gas mixture. The maximum of the dark conductivities (300K) of the p- and n-type a-SiC.,:H layers was 10-5 and 103 (Ωcm)-1, respectively, the activation energys decreases to 0.4 and 0.2 eV respectively. With a high quantity within the range of doping gas in the mixture, the carbon determines the layer properties. At a gas mixture ratio of 1:1 ( silan: doping gas) the optical gap expands to 2.7 eV and the dark conductivity decreases below 10∼13 (Ωcm)-1.

1995 ◽  
Vol 377 ◽  
Author(s):  
H. Karstens ◽  
P. Hess

ABSTRACTAmorphous hydrogenated silicon (a-Si:H) films were deposited from disilane at substrate temperatures between 180 and 390 °C using a F2-laser (157 nm) in a parallel configuration. Material properties such as hydrogen content, SiH and SiH2 group concentration, photo-and dark conductivity, band-gap energy and the Urbach parameter were determined as a function of the deposition temperature. The material with the best optical and electronical properties was found for a substrate temperature of 260 °C. Using argon as the buffer gas instead of helium results in films of poor quality.


1989 ◽  
Vol 162 ◽  
Author(s):  
D. K. Basa ◽  
F. W. Smith

ABSTRACTAn amorphous hydrogenated silicon carbon alloy film (a Si1 x Cx :H with x = 0.29) was prepared by glow discharge decomposition of a silane and ethylene gas mixture. A careful and detailed investigation of the infrared absorption was undertaken in the range 400 to 4000 cm1 for both the as deposited (T =250°C) and annealed (up to 1200°C) film. This study demonstrates clearly that there is a structural change from amorphous to microcrystalline at T =8000C and then to crystalline phase at T a=1200° C.


1993 ◽  
Vol 164-166 ◽  
pp. 235-238 ◽  
Author(s):  
O. Klíma ◽  
O. Štika ◽  
Ho Tha Ha ◽  
S. Fouad Abdel Hamied ◽  
J. Stuchlík ◽  
...  

1998 ◽  
Vol 1 (2) ◽  
pp. 81-85
Author(s):  
Clara EE Hanekamp ◽  
Hans JRM Bonnier ◽  
Rolf H Michels ◽  
Kathinka H Peels ◽  
Eric PCM Heijmen ◽  
...  

1996 ◽  
Vol 43 (9) ◽  
pp. 1592-1601 ◽  
Author(s):  
S.J. Bijlsma ◽  
H. van Kranenburg ◽  
K.J.B.M. Nieuwesteeg ◽  
M.G. Pitt ◽  
J.F. Verweij

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