Microstructural Characterization of Photoluminescent Porous Silicon
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ABSTRACTWe have used electron microscopy to examine the microstructure of porous silicon films over a wide range of doping levels, and photoluminescence spectroscopy to study their optical properties. We discuss the impact of our experimental results on models from the literature which were proposed to explain visible luminescence from porous silicon.
2016 ◽
Vol 22
(3)
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pp. 725-732
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1993 ◽
Vol 51
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pp. 1176-1177
2008 ◽
Vol 148
(1-3)
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pp. 211-214
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