Ferroelectric PbZrxTi1-xO3 Thin Films Grown by Organometallic Chemical Vapor Deposition

1991 ◽  
Vol 243 ◽  
Author(s):  
G.J.M. Dormans ◽  
M. de Keijser ◽  
P. J. van Veldhoven

AbstractFor the successful integration of ferroelectric thin films in IC technology, there is a need for a deposition technique capable of growing homogeneous layers at high growth rates over large-area structured substrates. Organometallic chemical vapor deposition (OMCVD) is a promising technique for meeting these demands.Ferroelectric layers of PbZrxTi1-xO3 (PZT) were grown by OMCVD on Pt-coated 10 cm diameter Si-substrates using the precursors tetra-ethyl-lead, tetra-iso-propoxy-titanium and tetra-tertiary-butoxy-zirconium at 700 °C without any post anneal. At this temperature the layers are single phase and highly (h00) and/or (00l) oriented. The layers show good ferroelectric switching properties with high remanent polarizations, but also with high coercive field strengths. Fatigue measurements are presented for these OMCVD grown PZT layers. The layers have a switching lifetime exceeding 1011 cycles at a switching amplitude of 5 V.

ACS Nano ◽  
2011 ◽  
Vol 5 (9) ◽  
pp. 7198-7204 ◽  
Author(s):  
Michael E. Ramón ◽  
Aparna Gupta ◽  
Chris Corbet ◽  
Domingo A. Ferrer ◽  
Hema C. P. Movva ◽  
...  

1989 ◽  
Vol 169 ◽  
Author(s):  
J. M. Zhang ◽  
H. O Marcy ◽  
L .M. Tonge ◽  
B. W. Wessels ◽  
T. J. Marks ◽  
...  

AbstractFilms of the high‐Tc undoped and Pb‐doped Bi‐Sr‐Ca‐Cu‐O (BSCCO) superconductors have been prepared by low pressure organometallic chemical vapor deposition (OMCVD) using the volatile metal‐organic precursors Cu(acetylacetonate)2, Sr(dipivaloylmethanate)2, Ca(dipivaloylmethanate)2, and triphenyl bismuth. Factors which influence texture and morphology of the OMCVD‐derived films have been investigated, including the effects of annealing, doping, and substrates.


1988 ◽  
Vol 144 ◽  
Author(s):  
P. Grodzinski ◽  
J.H. Mazur ◽  
A. Nouhi ◽  
R.J. Stirn ◽  
R. Sudharsananu

ABSTRACTElectron diffraction and high resolution electron microscopy (HREM) have been used to investigate the origin of multiple orientation-relationships and defect structure of CdTe thin films grown on (100) GaAs and Si substrates by metal- organic chemical vapor deposition (MOCVD). It has been determined that growth at 370°C with pre-exposure of the GaAs surface to Te following oxide desorption treatment at 600°C resulted in non-parallel epitaxy ((111)CdTe // (100)GaAs), while growth at 300°C following oxide desorption at 500°C with no exposure to Te resulted in parallel epitaxy ((100)CdTe // (100)GaAs). Both epitaxial orientation-relationships were observed on the same substrate for growth at 300°C temperature after 600°C oxide desorption treatment, but with no pre-exposure of the GaAs surface to Te. Preliminary results of growth of CdTe on Si are also reported.


2005 ◽  
Vol 275 (1-2) ◽  
pp. e2481-e2485 ◽  
Author(s):  
Chih-Wei Lin ◽  
Tsan-Yao Cheng ◽  
Li Chang ◽  
Jenh-Yih Juang

1989 ◽  
Vol 55 (18) ◽  
pp. 1906-1908 ◽  
Author(s):  
J. M. Zhang ◽  
H. O. Marcy ◽  
L. M. Tonge ◽  
B. W. Wessels ◽  
T. J. Marks ◽  
...  

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