Foreign Gas Effect upon Excimer Laser Ablation of Polymer

1990 ◽  
Vol 191 ◽  
Author(s):  
N. Shimo ◽  
T. Uchida ◽  
H. Masuhara

ABSTRACTWe have examined effect of foreign gas and its pressure upon etch rate, surface morphology, and surface chemical composition. Etch rate is suppressed by adding inert gases such as argon and helium. On the contrary, oxygen enhances the rate by increasing its pressure, indicating that oxygen molecules react with ablated polymer surface. From the results of XPS analyses, active surface of ablated polymer reacts also with ammonia and hexamethyldisilane. It is considered that laser ablation has a high potentiality of simultaneous microfabrication and photochemical surface modification of polymer.

1990 ◽  
Vol 203 ◽  
Author(s):  
Kyung W. Paik ◽  
Richard J. Saia ◽  
John J. Chera

ABSTRACTThe etch rates of BCB film in a reactive ion etcher(RIE) were measured using Ar, O2, O2+CF4, and O2+SF6 gas mixtures. Faster etch rates were obtained when CF4 and SF6 were added to oxygen, since the presence of atomic fluorine enhances the etch rate of organics, while also etching Si and SiO2 formed by exposure to oxygen gas. Surface compositional changes on the BCB film were observed by XPS after plasma modification. Pure O2 and O2+CF4 plasma oxidized the carbo-siloxane linkage (C-Si-O) of the BCB, resulting in the formation of SiO2 on the surface. The O2 +SF6 plasma, however, did not produce the surface SiO2, because of its faster Si and SiO2 etch rates. Ar ion sputtering following the plasma modification, restored the surface chemical composition to a state similar to the initial BCB surface.


1999 ◽  
Vol 141 (1-2) ◽  
pp. 25-34 ◽  
Author(s):  
Jean-François Silvain ◽  
Hiroyuki Niino ◽  
Shigeyuki Ono ◽  
Shinya Nakaoka ◽  
Akira Yabe

1990 ◽  
Vol 191 ◽  
Author(s):  
Th. Beuermann ◽  
H. J. Brinkmann ◽  
T. Damm ◽  
M. Stuke

ABSTRACTUltrashort UV excimer laser ablation of materials shows several advantages over conventional UV excimer laser ablation. We describe new experimental results on lithium niobate, LiNbO3, using 308 nm pulses of 1 ps duration. The fluence threshold for material removal is reduced by one order of magnitude when compared with 16 ns pulses at 308 nm. In addition the etch rate is up to three times higher for picosecond pulses and it is independent of the diameter of the ablation area. We discuss a simple model describing the etching and ablation behaviour of materials upon interaction with UV excimer laser pulses of different pulse duration.


1998 ◽  
Vol 127-129 ◽  
pp. 821-825 ◽  
Author(s):  
Shigeyuki Ono ◽  
Shinya Nakaoka ◽  
Jun Wang ◽  
Hiroyuki Niino ◽  
Akira Yabe

Author(s):  
Calin Moise ◽  
◽  
Adrian Katona ◽  
Doru Dinescu ◽  
Jasim Al-zanganawee ◽  
...  

1991 ◽  
Vol 223 ◽  
Author(s):  
Neeta Agrawal ◽  
R. D. Tarey ◽  
K. L. Chopra

ABSTRACTArgon plasma exposure has been used to induce surface chemical modification of aluminium thin films, causing a drastic change in etch rate in standard HNO3/CH3COOH/H3PO4 etchant. The inhibition period was found to increase with power and Ar plasma exposure time. Auger electron and x-ray photoelectron spectroscopies have indicated formation of an aluminium fluoride (AlF3) surface layer due to fluorine contamination originating from the residue left in the plasma chamber during CF4 processing. The high etch selectivity between unexposed and argon plasma exposed regions has been exploited as a new technique for resistless patterning of aluminium.


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