The Stability of the T2 (AL6CuLi3) Phase During Examination in the Tem

1990 ◽  
Vol 186 ◽  
Author(s):  
A. S. Ramani ◽  
M. H. Tosten ◽  
C. W. Bartges ◽  
D. J. Michel ◽  
J. R. Reed ◽  
...  
Keyword(s):  
Solid Solution ◽  
Ion Beam ◽  
Transformation Products ◽  
Specimen Preparation ◽  
Reaction Products ◽  
Casting Alloys ◽  
Transmission Electron ◽  
The Stability ◽  
Preparation Techniques

AbstractTransmission electron microscopy (TEM) has been employed to examine the stability of the (presumed) icosahedral T2 (A16 Cu Li3) phase. The T2 phase was found to be unstable either when irradiated by the electron beam or during in-situ heating. In addition, certain specimen preparation techniques (e.g., ion-beam thinning) also led to the decomposition of the T2 phase. When the T2 particles were formed during conventional aging of aluminum-rich Al-Li-Cu based alloys, the transformation products were invariably microcrystalline. Individual microcrystals have been identified as the aluminum rich ∝-solid solution which, in certain instances, contained the δʹ (Al3Li) phase. TB (A17.5 Cu4Li) and T1 (Al2CuLi) particles were also found. When the T2 phase was prepared by casting alloys of the proposed stoichiometry of T2, then the transformation products were more complex, although certain reaction products have been identified as the a solid solution, TB and T1.

Characterization of FIB Damage in Silicon

1999 ◽  
Vol 5 (S2) ◽  
pp. 740-741 ◽  
Author(s):  
C.A. Urbanik ◽  
B.I. Prenitzer ◽  
L.A. Gianhuzzi ◽  
S.R. Brown ◽  
T.L. Shofner ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Target Material ◽  
Beam Current ◽  
Specimen Preparation ◽  
Transfer Energy ◽  
Transmission Electron ◽  
Preparation Techniques ◽  
Reactive Gas

Focused ion beam (FIB) instruments are useful for high spatial resolution milling, deposition, and imaging capabilities. As a result, FIB specimen preparation techniques have been widely accepted within the semiconductor community as a means to rapidly prepare high quality, site-specific specimens for transmission electron microscopy (TEM) [1]. In spite of the excellent results that have been observed for both high resolution (HREM) and standard TEM specimen preparation applications, a degree of structural modification is inherent to FIB milled surfaces [2,3]. The magnitude of the damage region that results from Ga+ ion bombardment is dependent on the operating parameters of the FIB (e.g., beam current, beam voltage, milling time, and the use of reactive gas assisted etching).Lattice defects occur as a consequence of FIB milling because the incident ions transfer energy to the atoms of the target material. Momentum transferred from the incident ions to the target atoms can result in the creation of point defects (e.g., vacancies, self interstitials, and interstitial and substitutional ion implantation), the generation of phonons, and plasmon excitation in the case of metal targets.

Applications of In-situ Sample Preparation and Modeling of SEM-STEM Imaging

2008 ◽  
Author(s):  
R.J. Young ◽  
A. Buxbaum ◽  
B. Peterson ◽  
R. Schampers
Keyword(s):  
Sample Preparation ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Dual Beam ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes ◽  
Preparation Techniques

Abstract Scanning transmission electron microscopy with scanning electron microscopes (SEM-STEM) has become increasing used in both SEM and dual-beam focused ion beam (FIB)-SEM systems. This paper describes modeling undertaken to simulate the contrast seen in such images. Such modeling provides the ability to help understand and optimize imaging conditions and also support improved sample preparation techniques.

Microstructural Characterization of Automated Specimen Preparation for TEM Analysis

2000 ◽  
Vol 6 (S2) ◽  
pp. 528-529
Author(s):  
C. Urbanik Shannon ◽  
L. A. Giannuzzi ◽  
E. M. Raz
Keyword(s):  
Focused Ion Beam ◽  
Preparation Method ◽  
Ion Beam ◽  
Microstructural Characterization ◽  
Specimen Preparation ◽  
Tem Analysis ◽  
Area Of Interest ◽  
Transmission Electron ◽  
Preparation Techniques

Automated specimen preparation for transmission electron microscopy has the obvious advantage of saving personnel time. While some people may perform labor intensive specimen preparation techniques quickly, automated specimen preparation performed in a timely and reproducible fashion can significantly improve the throughput of specimens in an industrial laboratory. The advent of focused ion beam workstations for the preparation of electron transparent membranes has revolutionized TEM specimen preparation. The FIB lift-out technique is a powerful specimen preparation method. However, there are instances where the “traditional” FIB method of specimen preparation may be more suitable. The traditional FIB method requires that specimens must be prepared so that the area of interest is as thin as possible (preferably less than 50 μm) prior to FIB milling. Automating the initial specimen preparation for brittle materials (e.g., Si wafers) may be performed using the combination of cleaving and sawing techniques as described below.

scholarly journals In Situ Preparation of Pr1-xCaxMnO3 and La1-xSrxMnO3 Catalysts Surface for High-Resolution Environmental Transmission Electron Microscopy

Catalysts ◽  
2019 ◽  
Vol 9 (9) ◽  
pp. 751 ◽  
Author(s):  
Roddatis ◽  
Lole ◽  
Jooss
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Residual Water ◽  
Environmental Transmission ◽  
Transmission Electron ◽  
Environmental Transmission Electron Microscopy

The study of changes in the atomic structure of a catalyst under chemical reaction conditions is extremely important for understanding the mechanism of their operation. For in situ environmental transmission electron microscopy (ETEM) studies, this requires preparation of electron transparent ultrathin TEM lamella without surface damage. Here, thin films of Pr1-xCaxMnO3 (PCMO, x = 0.1, 0.33) and La1-xSrxMnO3 (LSMO, x = 0.4) perovskites are used to demonstrate a cross-section specimen preparation method, comprised of two steps. The first step is based on optimized focused ion beam cutting procedures using a photoresist protection layer, finally being removed by plasma-etching. The second step is applicable for materials susceptible to surface amorphization, where in situ recrystallization back to perovskite structure is achieved by using electron beam driven chemistry in gases. This requires reduction of residual water vapor in a TEM column. Depending on the gas environment, long crystalline facets having different atomic terminations and Mn-valence state, can be prepared.

In-Situ Transformation of a Zinc Tem Lift-Out Specimen

1999 ◽  
Vol 5 (S2) ◽  
pp. 928-929
Author(s):  
B.I. Prenitzer ◽  
S. Collins ◽  
L. A. Giannuzzi
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Ion Milling ◽  
Cleaning Operation ◽  
Microstructural Damage ◽  
Transmission Electron ◽  
Metallographic Preparation ◽  
Powder Particles ◽  
Preparation Techniques

The focused ion beam (FIB) lift out (LO) technique has been used to prepare transmission electron microscopy (TEM) specimens from individual Zn powder particles [1]. The Zn microstructure observed by TEM was compared to the Zn microstructure analyzed by traditional metallographic preparation techniques. It was concluded that the Ga focused ion milling produced no apparent microstructural damage to the Zn [1]. A low magnification TEM image of the FIB prepared Zn specimen obtained from a Philips EM430 operating at 300 KeV is shown in figure la.The Zn FIB LO specimen was then processed in a plasma cleaner. After subjecting the Zn specimen to the plasma cleaning operation, the specimen was observed in a Philips EM400 operating at 120 KeV. The Zn specimen completely transformed during in situTEM observation at 120 KeV. The specimen was then subsequently observed in an EM430 to analyze the transformed Zn at 300 KeV.

Improving Signal-to-Noise Limits in High Resolution Transmission Electron Microscopy

1986 ◽  
Vol 82 ◽  
Author(s):  
J.M. Gibson ◽  
M.L. McDonald
Keyword(s):  
Surface Cleaning ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Noise Levels ◽  
Signal To Noise ◽  
Transmission Electron ◽  
Lattice Images ◽  
Preparation Techniques ◽  
Image Quantitation

ABSTRACTSignal-to-noise ratios for Si <110> lattice images are measured for a variety of different specimen preparation techniques, including ion-milling, chemical polishing, cleavage and in-situ surface cleaning by heating. The noise levels are significantly lower in the latter, possibly permitting new classes of experiments in image quantitation and impurity imaging.

Recent Advances in FIB Technology for Nano-prototyping and Nano-characterisation

2007 ◽  
Vol 1020 ◽  
Author(s):  
Debbie J Stokes ◽  
Laurent Roussel ◽  
Oliver Wilhelmi ◽  
Lucille A Giannuzzi ◽  
Dominique HW Hubert
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Scanning Transmission Electron Microscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Nano Materials ◽  
Transmission Electron ◽  
Scanning Transmission

AbstractCombined focused ion beam (FIB) and scanning electron microscopy (SEM) methods are becoming increasingly important for nano-materials applications as we continue to develop ways to exploit the complex interplay between primary ion and electron beams and the substrate, in addition to the various subtle relationships with gaseous intermediaries.We demonstrate some of the recent progress that has been made concerning FIB SEM processing of both conductive and insulating materials for state-of-the-art nanofabrication and prototyping and superior-quality specimen preparation for ultra-high resolution scanning transmission electron microscopy (STEM) and transmission electron microscopy (TEM) imaging and related in situ nanoanalysis techniques.

scholarly journals Preparation of Multilayered Materials in Cross-Section for in-Situ Tem Tensile Deformation Studies

1997 ◽  
Vol 480 ◽  
Author(s):  
M. A. Wall ◽  
T. W. Barbee
Keyword(s):  
Focused Ion Beam ◽  
Tensile Deformation ◽  
Crack Nucleation ◽  
Ion Beam ◽  
Specimen Preparation ◽  
In Situ Tem ◽  
Transmission Electron ◽  
Gauge Section ◽  
In Situ Deformation

AbstractThe success of in-situ transmission electron microscopy experimentation is often dictated by proper specimen preparation. We report here a novel technique permitting the production of crosssectioned tensile specimens of multilayered films for in-situ deformation studies. Of primary importance in the development of this technique is the production of an electron transparent microgauge section using focused ion beam technology. This micro-gauge section predetermines the position at which plastic deformation is initiated; crack nucleation, growth and failure are then subsequently observed.

Off-Axis Electron Holography of Unbiased and Reverse-Biased Focused Ion Beam Milled Sip-nJunctions

2005 ◽  
Vol 11 (1) ◽  
pp. 66-78 ◽  
Author(s):  
Alison C. Twitchett ◽  
Rafal E. Dunin-Borkowski ◽  
Robert J. Hallifax ◽  
Ronald F. Broom ◽  
Paul A. Midgley
Keyword(s):  
Electrostatic Potential ◽  
Reverse Bias ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Specimen Preparation ◽  
Electron Holography ◽  
Thin Sample ◽  
Transmission Electron ◽  
Milled Sample

Off-axis electron holography is used to measure electrostatic potential profiles across a siliconp-njunction, which has been prepared for examination in the transmission electron microscope (TEM) in two different specimen geometries using focused ion beam (FIB) milling. Results are obtained both from a conventional unbiased FIB-milled sample and using a novel sample geometry that allows a reverse bias to be applied to an FIB-milled samplein situin the TEM. Computer simulations are fitted to the results to assess the effect of TEM specimen preparation on the charge density and the electrostatic potential in the thin sample.

Microstructure and Friction of Ion Beam Induced Amorphous Ti-Pd Alloys

1985 ◽  
Vol 55 ◽  
Author(s):  
J-P. Hirvonen ◽  
M. Nastasi ◽  
J. R. Phillips ◽  
J. W. Mayer
Keyword(s):  
Solid Solution ◽  
Friction Coefficient ◽  
Composition Range ◽  
Ion Beam ◽  
Amorphous Region ◽  
Transmission Electron ◽  
Solid Solution Region ◽  
Friction Measurements ◽  
Solution Region ◽  
High Equilibrium

ABSTRACTMultilayered samples of Ti-Pd with linearly varying compositions were irradiated by Xe ions at 600 keV. The induced microstructures were studied by using transmission electron microscopy and Rutherford backscattering. Mixing was found to be complete over the entire composition range, resulting in amorphous or amorphous plus crystalline structures except at the palladium-rich end, where a crystalline Pd-Ti solid solution was obtained. This is consistent with the high equilibrium solubility of Ti in Pd. In addition, significant coarsening of the microstructure caused by irradiation was found in this solid solution region.Friction measurements were carried out in air and water by using a polytetrafluoroethylene pin as a counterpart. In air the friction coefficient was independent of composition and microstructure after about 2000 passes. In water, however, after 600 passes the friction coefficient reached a steady-state value with a pronounced minimum over the amorphous region. This property was unchanged throughout the remaining 10000 passes.

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