The Electrical Properties of Polyoxide Depending on the Polycrystalline-Si Formation Conditions

1990 ◽  
Vol 182 ◽  
Author(s):  
Kyoung-Soo Yi ◽  
Deok-Ho Cho ◽  
Jeong Yong Lee ◽  
Kee-Soo Nam ◽  
Sang-Won Kang ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Dielectric Property ◽  
Electrical Properties ◽  
Low Temperature ◽  
Electric Field ◽  
Transmission Electron ◽  
Formation Conditions ◽  
Temperature Oxide ◽  
Amorphous Si ◽  
Current Electric Field

AbstractPrior to growth of polyoxide, amorphous-Si with a cap of low temperature oxide was annealed to improve the dielectric property of polyoxide. Current-electric field, critical electric field, critical electric field histogram, and Fowler-Nordheim conduction plot were evaluated. The interface of polyoxide and poly-Si was observed with a transmission electron microscope. The annealing of the amorphous-Si prior to oxidation was effective to improve the dielectric property of the polyoxide.

Biological X-ray Microanalysis: The Past, Present Practices, and Future Prospects

2001 ◽  
Vol 7 (2) ◽  
pp. 211-219 ◽  
Author(s):  
Patrick Echlin
Keyword(s):  
Electron Microscope ◽  
Low Temperature ◽  
Transmission Electron Microscope ◽  
Low Voltage ◽  
High Energy ◽  
Scanning Transmission Electron Microscope ◽  
X Ray ◽  
Ambient Temperatures ◽  
Advantages And Disadvantages ◽  
Transmission Electron

Abstract A brief description is given of the events surrounding the development of biological X-ray microanalysis during the last 30 years, with particular emphasis on the contribution made by research workers in Cambridge, UK. There then follows a broad review of some applications of biological X-ray microanalysis. A more detailed consideration is given to the main thrust of current procedures and applications that are, for convenience, considered as four different kinds of samples. Thin frozen dried sections which are analyzed at ambient temperatures in a transmission electron microscope (TEM); semithin frozen dried sections which are analyzed at low temperature in a scanning transmission electron microscope (STEM); thick frozen hydrated sections which are analyzed at low temperature in a scanning electron microscope (SEM), and bulk samples which are analyzed at low temperature in the same type of instrument. A brief outline is given of the advantages and disadvantages of performing low-voltage, low-temperature X-ray microanalysis on frozen hydrated bulk biological material. The article concludes with a consideration of alternative approaches to in situ analysis using either high-energy beams or visible and near-visible photons.

Analysis of Spherical Carbides Formed in Chromium Added Hypereutectoid Bearing Steels

2007 ◽  
Vol 539-543 ◽  
pp. 4866-4871 ◽  
Author(s):  
Atsushi Yamamoto ◽  
Katsuhiko Inoue ◽  
Harushige Tsubakino
Keyword(s):  
Electron Microscope ◽  
Synchrotron Radiation ◽  
Low Temperature ◽  
Transmission Electron Microscope ◽  
Bearing Steel ◽  
Bearing Steels ◽  
Transmission Electron ◽  
Synchrotron Radiation Diffraction ◽  
M23c6 Type ◽  
Means Of Transmission

Microstructures in a bearing steel, JIS SUJ2, have been observed and analyzed in detail by means of transmission electron microscope and synchrotron radiation diffraction in SPring-8. Spherodized carbides in the steel are generally recognized as spherical cementite particles, but some of them have been clearly shown to be M23C6 type of carbide in this study. The shapes and sizes of these two types of carbides are similar to each other. On the martensitic matrix of the steel, it is believed to be stable at relatively low temperature, but it is also shown to be decomposed to form cementite by prolonged aging at 383 K, which provides a reason for decrease in hardness in standard hardness blocks, previously reported by the authors.

Solvothermal route to Bi3Se4 nanorods at low temperature

2001 ◽  
Vol 16 (12) ◽  
pp. 3361-3365 ◽  
Author(s):  
Yuan-fang Liu ◽  
Jing-hui Zeng ◽  
Wei-xin Zhang ◽  
Wei-chao Yu ◽  
Yi-tai Qian ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Reaction Mechanism ◽  
Low Temperature ◽  
Hydrazine Hydrate ◽  
Photoelectron Spectra ◽  
Elemental Selenium ◽  
X Ray ◽  
Transmission Electron ◽  
Microscope Images ◽  
Diffraction Patterns

Nanorods Bi3Se4 were synthesized directly through the reaction between BiCl3 and elemental selenium in an autoclave with hydrazine hydrate as solvent at 165 °C for 10 h. X-ray powder diffraction patterns, x-ray photoelectron spectra, and transmission electron microscope images show that the products are well-crystallized hexagonal Bi3Se4 nanorods. The solvent hydrazine hydrate played an important role in formation and growth of Bi3Se4 nanorods. The possible reaction mechanism was proposed.

Investigation of the Displacement Threshold of Si in 4H SiC

2006 ◽  
Vol 527-529 ◽  
pp. 481-484 ◽  
Author(s):  
W. Sullivan ◽  
John W. Steeds
Keyword(s):  
Electron Microscope ◽  
Low Temperature ◽  
Electron Energy ◽  
Transmission Electron Microscope ◽  
Low Energy ◽  
Electron Dose ◽  
Displacement Threshold ◽  
Transmission Electron ◽  
Low Energy Electrons ◽  
Low Temperature Photoluminescence

Samples of 4H SiC, both n- and p-doped, have been irradiated with low-energy electrons in a transmission electron microscope. The dependence of the silicon vacancy-related V1 ZPL doublet (~860nm) on electron energy and electron dose has been investigated by low temperature photoluminescence spectroscopy. Furthermore, this luminescence centre has been studied across a broad range of samples of various doping levels. Some annealing characteristics of this centre are reported.

Plutonium Alteration Phases from Vapor Hydration of Lanthanide Borosilicate Glass for Weapons Material Disposition: a TEM Study

1997 ◽  
Vol 3 (S2) ◽  
pp. 663-664
Author(s):  
J. A. Fortner ◽  
C. J. Mertz ◽  
D. C. Chamberlain ◽  
J. K. Bates
Keyword(s):  
Electron Microscope ◽  
Water Vapor ◽  
Low Temperature ◽  
Borosilicate Glass ◽  
Glass Composition ◽  
Test Procedure ◽  
Yucca Mountain ◽  
Geologic Repository ◽  
Transmission Electron ◽  
Time Periods

A lanthanide borosilicate glass, also known as LaBS glass, is being considered for the disposition of surplus weapons plutonium and plutonium residues. The LaBS glass, based upon Löffler-type glasses, is chemically durable and can dissolve substantial amounts of plutonium as well as the neutron absorbers gadolinium and hafnium [1]. Samples of a prototype LaBS glass composition containing 10 wt. % plutonium were subjected to water vapor at 200 °C for periods of 14 to 56 days. The Argonne Vapor Hydration Test Procedure was followed [2]. This test, while not designed to replicate specific conditions that may be found in a potential geologic repository (e.g., Yucca Mountain), has been shown to accelerate alteration phase formation that is usually observed in low-temperature tests over extended time periods [2]. The surfaces of the glass samples, along with alteration phases, were examined with a transmission electron microscope (TEM) to determine the characteristic alteration products.

Defect population and electrical properties of Ar+-laser crystallized polycrystalline silicon thin films

2000 ◽  
Vol 621 ◽  
Author(s):  
S. Christiansen ◽  
M. Nerding ◽  
C. Eder ◽  
G. Andrae ◽  
F. Falk ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Electrical Properties ◽  
Process Parameters ◽  
Continuous Wave ◽  
Chemical Vapor ◽  
Glass Substrates ◽  
Silicon Thin Films ◽  
Transmission Electron ◽  
Pressure Chemical ◽  
Convergent Beam

ABSTRACTWe crystallize amorphous silicon (a-Si) layers (thicknesses: ∼300nm and ∼1300nm for comparison) that are deposited on glass substrates (Corning 7059) by low pressure chemical vapor deposition using a continuous wave Ar+-laser. We scan the raw beam with a diameter of ∼60νm in single traces and traces with varying overlap (30-60%). With optimized process parameters (fluence, scan velocity, overlap) we achieve polycrystalline Si with grains as wide as 100νm. The grain boundary population is dominated by first and second order twin boundaries as analyzed by electron backscattering analysis in the scanning electron microscope and convergent beam electron diffraction in the transmission electron microscope. These twins are known not (or only marginally) to degrade the electrical properties of the material. In addition to twins, dislocations and twin lamellae occur at varying densities (depending on grain orientation and process parameters). The recombination activity of the defects is analyzed by EBIC and according to these measurements crystallization receipts are defined that yield the reduction of electrically detrimental defects.

Kinetic Studies of Nanoscale Crystallization in Electronic Materials

1995 ◽  
Vol 405 ◽  
Author(s):  
C. Hayzelden ◽  
J. L. Batstone
Keyword(s):  
Electron Microscopy ◽  
Activation Energy ◽  
Transmission Electron Microscopy ◽  
Low Temperature ◽  
Electronic Materials ◽  
Kinetic Studies ◽  
Subsequent Growth ◽  
Transmission Electron ◽  
Amorphous Si

AbstractWe report a kinetic analysis of low-temperature NiSi2-mediated crystallization of amorphous Si by in situ transmission electron microscopy. The initiation of crystallization by formation of crystalline Si on buried NiSi2 precipitates is shown to have an activation energy of 2.8±0.7eV. Crystallization of the amorphous Si via migrating precipitates of NiSi2 occurs with an activation energy of 2.0±0.2eV. The significance of these activation energies is discussed in terms of possible atomistic mechanisms of crystalline Si initiation and subsequent growth. Amorphous Si is reported to crystallize at temperatures as low as 450°C.

An Evaluation of FIB Cross-Sectioning Using a Cooling Stage for Metals and Alloys with Low Melting Point

2013 ◽  
Vol 753 ◽  
pp. 3-6 ◽  
Author(s):  
Hideki Matsushima ◽  
Toshiaki Suzuki ◽  
Takeshi Nokuo
Keyword(s):  
Electron Microscope ◽  
Melting Point ◽  
Low Temperature ◽  
Advanced Materials ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Electron Microscopic ◽  
Cooling Stage ◽  
Transmission Electron ◽  
Microscopic Evaluation

Functions of an observation and an analysis in electron microscope, such as scanning electron microscope (SEM) or transmission electron microscope (TEM) are indispensable to evaluate advanced materials. Therefore a specimen preparation technique, that is a front end of the electron microscopy, has become highly important, thus a choice of it affects a result of the evaluation. The authors was combined a cooling stage in FIB and applied it for evaluation of metals with low melting point. The electron microscopic evaluation of Lead solder, Indium, Tin and Bismuth, metals with low melting point, has been always discussed if the results represent the actual physics. Metals with low melting point are heat sensitive materials, so the comparison of cross-sectioning with room and low temperature, it can be said that low temperature cross-sectioning has less effect and keeps the actual physics of the sample. In this paper, some knowledge from comparisons of cross-sectioning with room and low temperature for metals with low melting point are reported.

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